Adaptive programming method and apparatus for flash memory analog storage

• US 6,301,151 B1
• Filed: 08/09/2000
• Issued: 10/09/2001
• Est. Priority Date: 08/09/2000
• Status: Expired due to Fees

• Current Assignee: Winbond Electronics Corporation
• Original Assignee: Information Storage Devices, Inc. (Winbond Electronics Corporation)
• Inventors: Guo, Ping, Engh, Lawrence D., Liu, Chun-Mai, Kordesch, Albert V.
• Primary Examiner(s): Dinh, Son T.
• Application Number:
  US09/634,180
• Time in Patent Office: 426 Days
• Field of Search: 365/185.03, 365/185.18, 365/185.23
• US Class Current: 365/185.03
• CPC Class Codes: G11C 16/12 Programming voltage switching circuits
• CPC Class Codes: G11C 27/005 with non-volatile charge storage, e.g. on floating gate or MNOS

Abstract

Adaptive programming method and apparatus for flash memory analog storage. The present invention method is to adjust the voltage of the programming pulse each time based on the result of the previous pulse. The expected change in the programmed value is compared to the measured change, and the difference used to improve the model of that cell after each programming pulse. The algorithm is “adaptive” because the voltage of each pulse is adapted to whatever the cell needs. If the cell is programming too slowly, the voltage is increased dramatically to make it faster. Conversely if the results show that a particular cell is programming too fast, the next voltage pulse is increased by only a small amount (or even decreased if necessary). Because the response of the cell is non-linear, a special analog circuit is used to calculate the optimum voltage for each pulse. As one alternative, a digital calculation may also be used to program the cells. Because of the programming speed of the exemplary method, a voice signal may be sampled and stored in flash memory one cell at a time. Variable programming parameters other than voltage may be used if desired.

Claims

1. A method of programming an analog storage memory cell to provide a cell read voltage in accordance with an analog voltage to be stored in the cell comprising:

(a) selecting a parameter effecting an analog voltage stored in the cell;

(b) modeling the cell programming characteristics as responsive to that programming parameter;

(c) applying the programming parameter to the cell using at least one value in the model selected to under-program the cell;

(d) determining the change in the cell read voltage;

(e) revising the value(s) in the model to more accurately reflect the actual cell programming characteristics; and

,

(f) again applying the programming parameter to the cell using the revised value(s) in the model.

2. The method of claim 1 further comprising repeating (d), (e) and (f) at least once.

3. The method of claim 2 wherein the modeling of the cell programming characteristics includes at least one value dependent on the amount of cell programming left to be done.

4. The method of claim 3 wherein one of the at least one value in the model selected to under-program the cell is the value dependent on the amount of cell programming left to be done.

5. The method of claim 4 wherein the value dependent on the amount of cell programming left to be done is a value reflecting only a fraction of the amount of cell programming left to be done when applying the first programming parameter to the cell, which fraction is increased when repeating (d), (e) and (f).

6. A method of storing an audio signal in a plurality of flash memory cells to allow reconstructing the audio signal by reading the analog voltages in each cell and successively concatenating the voltages read from the cells comprising:

(a) selecting a parameter effecting an analog voltage stored in flash memory cells;

(b) modeling the flash memory cells programming characteristics as responsive to that programming parameter;

(c) periodically sampling the audio signal, and for each flash memory cell and the respective sample to be stored in that cell;

(1) applying the programming parameter to the flash memory cell using at least one value in the model selected to under-program the flash memory cell;

(2) determining the change in the flash memory cell read voltage;

(3) revising the value(s) in the model to more accurately reflect the actual flash memory cell programming characteristics; and

,

(4) again applying the programming parameter to the flash memory cell using the revised value(s) in the model.

7. The method of claim 6 wherein each flash memory cell is individually programmed within the period of successive samples of the audio signal.

8. The method of claim 7 further comprising repeating (2), (3) and (4) at least once.

9. The method of claim 8 wherein the modeling of the flash memory cell programming characteristics includes at least one value dependent on the amount of flash memory cell programming left to be done.

10. The method of claim 9 wherein one of the at least one value in the model selected to under-program the flash memory cell is the value dependent on the amount of cell programming left to be done.

11. The method of claim 10 wherein the value dependent on the amount of flash memory cell programming left to be done is a value reflecting only a fraction of the amount of flash memory cell programming left to be done when applying the first programming parameter to the flash memory cell, which fraction is increased when repeating (3) and (4).

12. The method of claim 11 wherein the value dependent on the amount of flash memory cell programming left to be done is equal to its full value when repeating (3) and (4) for the last time.

13. A method of programming an analog storage memory cell to provide a cell read voltage in accordance with an analog voltage to be stored in the cell comprising:

(a) modeling the cell programming characteristics as responsive to a programming voltage pulse;

(b) applying the programming voltage pulse to the cell using a programming voltage pulse selected to under-program the cell;

(c) determining the change in the cell read voltage;

(d) revising the value(s) in the model to more accurately reflect the actual cell programming characteristics; and

,

(e) again applying the programming voltage pulse to the cell using the revised value(s) in the model.

14. The method of claim 13 further comprising repeating (c), (d) and (e) at least once.

15. The method of claim 14 wherein the modeling of the cell programming characteristics includes at least one value dependent on the amount of cell programming left to be done.

16. The method of claim 15 wherein one of the at least one value in the model selected to under-program the cell is the value dependent on the amount of cell programming left to be done.

17. The method of claim 16 wherein the value dependent on the amount of cell programming left to be done is a value reflecting only a fraction of the amount of cell programming left to be done when applying the first programming voltage pulse to the cell, which fraction is increased when repeating (c), (d) and (e).

18. A method of storing an audio signal in a plurality of flash memory cells to allow reconstructing the audio signal by reading the analog voltages in each cell and successively concatenating the voltages read from the cells comprising:

(a) modeling the flash memory cells programming characteristics as responsive to a programming voltage pulse;

(b) periodically sampling the audio signal, and for each flash memory cell and the respective sample to be stored in that cell;

(1) applying the programming voltage pulse to the flash memory cell using at least one value in the model selected to under-program the flash memory cell;

(2) determining the change in the flash memory cell read voltage;

(3) revising the value(s) in the model to more accurately reflect the actual flash memory cell programming characteristics; and

,

(4) again applying the programming voltage pulse to the flash memory cell using the revised value(s) in the model.

19. The method of claim 18 further comprising repeating (2), (3) and (4) at least once.

20. The method of claim 19 wherein each flash memory cell is individually programmed within the period of successive samples of the audio signal.

21. The method of claim 20 wherein the modeling of the flash memory cell programming characteristics includes at least one value dependent on the amount of flash memory cell programming left to be done.

22. The method of claim 21 wherein one of the at least one value in the model selected to under-program the flash memory cell is the value dependent on the amount of cell programming left to be done.

23. The method of claim 22 wherein the value dependent on the amount of flash memory cell programming left to be done is a value reflecting only a fraction of the amount of flash memory cell programming left to be done when applying the first programming voltage pulse to the flash memory cell, which fraction is increased when repeating (2), (3) and (4).

24. The method of claim 23 wherein the value dependent on the amount of flash memory cell programming left to be done is equal to its full value when repeating (3) and (4) for the last time.

25. The method of claim 24 wherein each flash memory cell is individually programmed within the period of successive samples of the audio signal.