Method and apparatus for acoustic detection and location of defects in structures or ice on structures

• US 6,301,967 B1
• Filed: 01/28/1999
• Issued: 10/16/2001
• Est. Priority Date: 02/03/1998
• Status: Expired due to Fees

• Current Assignee: Stevens Institute Of Technology
• Original Assignee: The Trustees of The Stevens Institute of Technology (Stevens Institute Of Technology)
• Inventors: Sutin, Alexander M., Donskoy, Dimitri M.
• Primary Examiner(s): KWOK, HELEN C
• Application Number:
  US09/239,133
• Time in Patent Office: 992 Days
• Field of Search: 735/79, 735/83, 735/84, 735/87, 735/90, 735/91, 735/92, 735/96, 735/97, 735/98, 735/99, 736/02, 244/134.R, 244/134.F
• US Class Current: 73/579
• CPC Class Codes: G01N 2291/0234 Metals, e.g. steel
• CPC Class Codes: G01N 2291/02491 Materials with nonlinear acoustic properties
• CPC Class Codes: G01N 2291/0251 Solidification, icing, curing composites, polymerisation
• CPC Class Codes: G01N 2291/0421 Longitudinal waves
• CPC Class Codes: G01N 29/045 by imparting shocks to the workpiece and detecting the vibrations or the acoustic waves caused by the shocks measuring resonant frequency G01H13/00; measuring strength properties by application of mechanical stress G01N3/00
• CPC Class Codes: G01N 29/12 by measuring frequency or resonance of acoustic waves measuring frequency or resonant frequency of mechanical vibrations or acoustic waves in general G01H1/06, G01H3/04, G01H13/00; acoustic resonators G10K11/04; vibration or shock testing of structures G01M7/00
• CPC Class Codes: G01N 29/449 Statistical methods not provided for in G01N29/4409, e.g. averaging, smoothing and interpolation

Abstract

The invention relates to a method and apparatus for nondestructive testing and evaluation of materials and mechanical structures to determine their integrity reducing contact-type flaws such as cracks, fractures, delamination, unbondings, etc. and also presence of ice on a structure. The invention employs an ultrasonic probing signal and a low frequency vibration applied to a structure tested. In a structure without flaws or ice, these signals propagate independently without any interaction. If the structure contains a defect or ice thereon, the vibration varies the contact area of the defect or ice/structure interface, modulating the phase and amplitude of the higher frequency ultrasonic probing signal passing through the structure. In the frequency domain the result of this modulation manifests itself as sideband spectral components with respect to frequency of the probe wave. This can be considered as a new signal generated by a defect, so that the defect can be detected more easily when such a signal is observed. There are three modes of detection including, vibro-modulation, impact-modulation and self-modulation. The location of defects can be determined in two modes. In a first mode defect is located by moving the low frequency signal about the structure and triggering the high frequency signal immediately after the low frequency signal. Defects can be located in a second mode with a sequence of short burst high frequency signal and a signal-processing algorithm which selects the sequences reflected from various areas of the tested structure. A defect can be quantitatively analyzed by sweeping the high frequency signal over a defined frequency range and measuring, averaging and normalizing the amplitudes of the side bands.

Claims

1. An apparatus for detecting the presence and characteristics of a defect in or ice on a structure comprising:

means for creating and delivering a low frequency signal to the structure;

means for creating and delivering a high frequency probe signal to the structure; and

receiver means for receiving a modulated signal from the structure caused by the low frequency signal modulating the high frequency signal in response to a defect in or ice on the structure, the modulated signal indicating the presence of a defect in or ice on the structure.

2. The apparatus of claim 1 further comprising means for moving the low frequency signal relative to the high frequency probe signal and receiver means;

and means for triggering the probe signal after the low frequency signal to locate a defect in the structure.

22. The apparatus of claim 1 wherein the means for delivering a signal comprises an ultrasonic transmitter and the means for receiving a signal comprises an ultrasonic receiver.

23. The apparatus of claim 22, wherein the structure comprises an aircraft wing and the transmitter and receiver are embedded in the wing.

24. The apparatus of claim 22 wherein the transmitter and receiver comprise piezoceramic material.

3. A method of detecting the presence and characteristics of a defect in or ice on a structure comprising the steps of:

applying a low frequency signal to the tested structure;

applying a high frequency probe signal to the tested structure;

modulating the high frequency signal by the low frequency signal in response to the presence of a defect in the structure; and

receiving a modulated signal through a receiver means applied to the tested structure.

4. The method of claim 3 further comprising locating the defect in the structure by triggering the probe signal to occur immediately after the low frequency signal is applied to the tested structure;

moving a point of delivery of the low frequency signal about the tested structure; and

monitoring the amplitude of the modulated signal for increased modulation.

25. The method of claim 4 wherein modulation of the modulated signal appears as side-band components in the spectrum of the high frequency signal, and the step of monitoring the amplitude of the modulated signal comprises monitoring the amplitude of the side-band components in the spectrum of the high frequency signal.

26. The method of claim 3 wherein the low frequency signal comprises harmonic vibration.

27. The method of claim 26 wherein the harmonic vibration is applied by a shaker.

28. The method of claim 3 wherein the low frequency signal comprises impact modulation.

29. The method of claim 28 wherein the impact modulation is applied with an instrumented hammer.

30. The method of claim 3 wherein the low frequency signal comprises self-modulation.

31. The method of claim 30 wherein the self-modulation is applied by the environment.

32. The method of claim 30 wherein the self-modulation is applied by working conditions.

5. A method for detecting the presence and characteristics of a defect in or ice on a structure comprising the steps of:

propagating an ultrasonic probe signal in the structure;

propagating a low frequency vibration signal in the structure;

detecting said ultrasonic probe signal and analyzing said detected ultrasonic probe signal for interaction between said ultrasonic probe signal and said low frequency vibration signal caused by a defect in or ice on the structure, said interaction being indicative of a defect in or ice on the structure.

6. The method of claim 5 wherein said interaction is a modulation of said ultrasonic probe signal by said low frequency vibration signal.

7. The method of claim 6 wherein said modulation appears as sideband spectral components with respect to a frequency of said ultrasonic probe signal.

8. The method of claim 7 wherein said sideband spectral components are associated with the presence of a defect in or ice on the structure.

9. The method of claim 6 wherein said low frequency signal exists in said structure because of the operation or the environment of the structure.

10. A method of determining the location and characteristics of defects in or ice on a structure comprising the steps of:

propagating sequences of an ultrasonic probe signal in a structure;

said ultrasonic probe signal having a first frequency;

said sequences being propagated at a second repetition frequency;

propagating a low frequency vibration signal in said structure the low frequency vibration signal modulating the ultrasonic probe signal in response to a defect in or ice on the structure;

detecting said propagated sequences of the probe signal, and selecting and processing only propagated sequences which are indicative of an area of said structure having a defect or ice.

11. The method of claim 10 wherein said second repetition frequency is sufficiently short to be resolved from the ultrasonic probe signal reflected from the other areas of said structure.

12. The method of claim 11 wherein said second repetition frequency is greater than twice the frequency of said low frequency vibration signal.

13. An apparatus for non-destructive testing of a structure comprising:

means for transmitting an ultrasonic signal into said structure;

means connected to said structure for receiving said ultrasonic signal;

means connected to said structure for generating a low frequency signal in said structure; and

control means connected to said transmitting means and to said low frequency generating means for transmitting said ultrasonic signal into said structure at a repetition frequency which is greater than twice the frequency of said low frequency signal;

wherein, the low frequency signal modulates the ultrasonic signal in response to a defect in the structure.

14. The apparatus of claim 13 wherein said low frequency signal is generated from the operation or the environment of said structure.

15. An apparatus for determining the location and characteristics of defects in ice on a structure comprising:

means for generating a low frequency signal in a structure;

means for generating a high frequency signal in the structure;

means for receiving a modulated signal from the structure caused by said low frequency signal modulating said high frequency signal in response to a defect in or ice on the structure; and

means for analyzing side bands in said received signal for analyzing a defect or ice.

16. The apparatus of claim 15 wherein said means for generating a low frequency signal includes a shaker.

17. The apparatus of claim 15 wherein said means for generating a low frequency signal includes an instrumented hammer.

18. The apparatus of claim 15 wherein said means for generating a low frequency signal includes vibrations present in the structure due to environment and/or working conditions.

20. The apparatus of claim 15 further comprising:

means for moving location of said low frequency generating means on said structure relative to the location of said means for generating said high frequency signal; and

control means for triggering said high frequency signal after said low frequency signal is triggered, whereby the amplitude of said side bands is increased as the location of said low frequency signal generating means is moved towards a defect.

19. An apparatus for quantitatively analyzing defects in a structure comprising:

means for generating a high frequency signal in a structure;

means connected to said high frequency signal generating means for varying the frequency of said high frequency signal over a predetermined frequency range;

means for generating a low frequency signal in said structure;

means for receiving frequency modulated signals from said structure caused by the low frequency signal modulating the high frequency signal in response to a defect in the structure, said received modulated signals being indicative of a defect in said structure; and

means connected to said receiving means for measuring, averaging and normalizing the amplitudes of side bands in said received modulated signals to generate an indication of the size of a defect in the structure.

21. An apparatus for locating defects in structures comprising:

means for generating a low frequency signal in a structure;

means for generating sequences of a short burst high frequency signal in the structure;

means for receiving a signal from the structure, said signal being a modulated combination of said low frequency signal and said high frequency signal;

means for analyzing selected sequences of said received signal from areas of the structure;

whereby a presence of modulation in a selected sequence indicates the presence of a defect in an area of the structure.

39. The apparatus of claim 21 wherein the means for receiving a signal from the structure comprises an array of receivers.

33. A method of analyzing defects in a structure comprising:

generating a high frequency signal in a structure;

sweeping the frequency of the high frequency signal over a frequency range;

generating a low frequency signal in the structure;

receiving modulated signals caused by the low frequency signal modulating the high frequency signal in response to a defect in the structure; and

analyzing side bands of the modulated signals to analyze the defect.

34. The method of claim 33 wherein the step of analyzing the side bands of the modulated signal comprises measuring, averaging, and normalizing amplitudes of the side bands.

35. The method of claim 34 wherein the size of the defect is derived by dividing the amplitude of the side bands by the product of the amplitude of the high frequency signal and the amplitude of the low frequency signal.

36. The method of claim 33 wherein the frequency range has 10 to 20 steps.

37. The method of claim 33 wherein the frequency range comprises 10-30 kHz.

38. A method for locating defects in a structure comprising:

generating a low frequency signal in a structure;

generating sequences of a short burst high frequency signal in the structure;

receiving a modulated signal from the structure caused by the low frequency signal modulating the high frequency signal in response to a defect in the structure;

analyzing modulation of sequences of the received signal from areas of the structure to locate a defect in the structure.