Non-volatile semiconductor memory device
First Claim
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1. A non-volatile semiconductor memory device comprising:
- a memory cell section including a plurality of memory cells which are connected in series;
a first common signal line transferring data from/to said memory cell section; and
a first select transistor arranged between said first common signal line and said memory cell section, wherein during a program operation, in the case that said memory cell section is write-selected, a write select voltage is applied to said first common signal line and the write select voltage is transferred to a channel of said memory cell section, and in the case that said memory cell section is write-inhibited, a write unselect voltage is applied to said first common signal line, and the write unselect voltage is transferred to a channel of said write memory cell section by applying a first select gate voltage higher than the write unselect voltage, to a gate of said first select transistor and control gates of said plurality of memory cells, and then a pass voltage higher than the first select gate voltage is applied to the control gates of the unselected memory cells and a program voltage higher than the pass voltage is applied to the control gate of the selected memory cell so that in the case that said memory cell section is write inhibited, the channel of said memory cell section is boosted by a capacitive coupling of the channel of said plurality of memory cells with the control gates thereof and in the case that said memory cell section is write-selected, the channel of said memory cell section is kept at a write select voltage.
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Abstract
A non-volatile semiconductor memory device comprising a memory cell array having a plurality of electrically writable memory cells arranged in a matrix form, each of the memory cells having three or more logic states so as to store a multi-value data “i”(i=0, 1, . . . , n−1: n≧3), a plurality of data latch circuits for temporarily storing data controlling a write state of the plurality of memory cells of the memory array, write verify circuit for confirming the write state of the plurality of memory cells, and an “i” data batch verify circuit for batch-detecting whether or not the memory cell where data “i” in should be written reaches a memory state of data “i.”
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Citations
6 Claims
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1. A non-volatile semiconductor memory device comprising:
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a memory cell section including a plurality of memory cells which are connected in series;
a first common signal line transferring data from/to said memory cell section; and
a first select transistor arranged between said first common signal line and said memory cell section, wherein during a program operation, in the case that said memory cell section is write-selected, a write select voltage is applied to said first common signal line and the write select voltage is transferred to a channel of said memory cell section, and in the case that said memory cell section is write-inhibited, a write unselect voltage is applied to said first common signal line, and the write unselect voltage is transferred to a channel of said write memory cell section by applying a first select gate voltage higher than the write unselect voltage, to a gate of said first select transistor and control gates of said plurality of memory cells, and then a pass voltage higher than the first select gate voltage is applied to the control gates of the unselected memory cells and a program voltage higher than the pass voltage is applied to the control gate of the selected memory cell so that in the case that said memory cell section is write inhibited, the channel of said memory cell section is boosted by a capacitive coupling of the channel of said plurality of memory cells with the control gates thereof and in the case that said memory cell section is write-selected, the channel of said memory cell section is kept at a write select voltage. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification
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Current AssigneeKabushiki Kaisha Toshiba (Toshiba Corporation)
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Original AssigneeKabushiki Kaisha Toshiba (Toshiba Corporation)
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InventorsTakeuchi, Ken, Tanaka, Tomoharu
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Primary Examiner(s)NGUYEN, TAN
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Application NumberUS09/656,415Time in Patent Office412 DaysField of Search365/185.28, 365/185.23, 365/185.04, 365/185.11, 365/185.17, 365/185.18US Class Current365/185.23CPC Class CodesG11C 11/5621 using charge storage in a f...G11C 11/5628 Programming or writing circ...G11C 11/5642 Sensing or reading circuits...G11C 16/10 Programming or data input c...G11C 16/3454 Arrangements for verifying ...G11C 16/3459 Circuits or methods to veri...G11C 2211/5621 Multilevel programming veri...G11C 2211/5642 Multilevel memory with buff...G11C 5/063 Voltage and signal distribu...
