Method for testing an electronic circuit
First Claim
Patent Images
1. A method of testing an electronic circuit, which comprises:
- initializing a number of circuit components;
simultaneously activating essentially only those circuit components on a test basis of which interaction is expected in a given context; and
reading out an actual state of the circuit components to be tested, and comparing the actual state of the circuit components with a setpoint state.
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Abstract
A method for testing an electronic circuit is described, in which the actual state of circuit components which have previously been activated on a test basis after an initial initialization is compared with a setpoint state. Of the circuit components to be tested, essentially only those circuit components are operated simultaneously which, under the given circumstances, can be expected to interact in the context.
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Citations
12 Claims
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1. A method of testing an electronic circuit, which comprises:
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initializing a number of circuit components;
simultaneously activating essentially only those circuit components on a test basis of which interaction is expected in a given context; and
reading out an actual state of the circuit components to be tested, and comparing the actual state of the circuit components with a setpoint state. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of testing an electronic circuit, which comprises:
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initializing a number of circuit components;
in the initialization step, placing a circuit to be tested in a scan mode of operation in which elements whose state is to be initialized and read out are connected one behind the other to form one or more scan chains;
assigning elements to various scan chains and defining a sequence within a given scan chain such that clock signals with which the scan chain elements are clocked reach the scan chain elements during the activating step no later than at a time at which signals are to be one of received and transmitted by the respective scan chain element;
simultaneously activating essentially only those circuit components on a test basis of which interaction is expected in a given context; and
reading out an actual state of the circuit components to be tested, and comparing the actual state of the circuit components with a setpoint state.
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11. A method of testing an electronic circuit, which comprises:
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initializing a number of circuit components;
simultaneously activating essentially only those circuit components on a test basis of which interaction is expected in a given context;
reading out an actual state of the circuit components to be tested, and comparing the actual state of the circuit components with a setpoint state; and
supplying no clock signals to those parts of the circuit which, at the time, are not to be initialized, activated on a test basis, or read out.
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12. A method of testing an electronic circuit, which comprises:
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initializing a number of circuit components;
simultaneously activating essentially only those circuit components on a test basis of which interaction is expected in a given context;
reading out an actual state of the circuit components to be tested, and comparing the actual state of the circuit components with a setpoint state; and
assigning registers to given circuit components, and making an application of a normal clock signal, a test clock signal, or no clock signal to said given circuit components dependent on contents of the given registers assigned to the circuit components and on a status of a mode-of-operation-selection signal.
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Specification