Design of microelectronic process flows for manufacturability and performance
First Claim
1. A method of improving process flow in fabrication process for fabrication of a device which comprises the steps of:
- (a) providing a model of the process flow as a sequence of process modules which is a sequence of contiguous process steps for providing a device falling within a predetermined window;
(b) for a first said process module, determining the probability of the state of the device being fabricated being in any one of plural states as a result of a first fabrication process for maximizing the probability of said device being within said window;
(c) for a second said process model, determining the probablitily of the state of the device being fabricated being in any one of plural states as a result of a second fabrication process and the result of said first fabrication process for maximizing the probability of said device being within said window; and
(d) altering at least one of said first and second processes in response to results of fabrication of said device to further maximixe the probability that the device performance falls within said window.
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Abstract
A statistical design method is provided for minimizing the impact of manufacturing variations on semiconductor manufacturing by statistical design which seeks to reduce the impact of variability on device behavior. The method is based upon a Markov representation of a process flow which captures the sequential and stochastic nature of semiconductor manufacturing and enables the separation of device and process models, statistical modeling of process modules from observable wafer states and approximations for statistical optimization over large design spaces. The statistical estimation component of this method results in extremely accurate predictions of the variability of transistor performance for all of the fabricated flows. Statistical optimization results in devices that achieve all transistor performance and reliability goals and reduces the variability of key transistor performances.
47 Citations
12 Claims
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1. A method of improving process flow in fabrication process for fabrication of a device which comprises the steps of:
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(a) providing a model of the process flow as a sequence of process modules which is a sequence of contiguous process steps for providing a device falling within a predetermined window;
(b) for a first said process module, determining the probability of the state of the device being fabricated being in any one of plural states as a result of a first fabrication process for maximizing the probability of said device being within said window;
(c) for a second said process model, determining the probablitily of the state of the device being fabricated being in any one of plural states as a result of a second fabrication process and the result of said first fabrication process for maximizing the probability of said device being within said window; and
(d) altering at least one of said first and second processes in response to results of fabrication of said device to further maximixe the probability that the device performance falls within said window. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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Specification