Gas analyzer

• US 6,317,212 B1
• Filed: 09/17/1999
• Issued: 11/13/2001
• Est. Priority Date: 09/17/1999
• Status: Expired due to Term

• Current Assignee: Li & S Company Limited (Yesco Holdings Co., Ltd.)
• Original Assignee: Li & S Company Limited (Yesco Holdings Co., Ltd.)
• Inventors: Eckles, Robert D.
• Primary Examiner(s): Rosenberger, Richard A.
• Application Number:
  US09/397,903
• Time in Patent Office: 788 Days
• Field of Search: 356/437, 356/438, 356/439, 250/338.5
• US Class Current: 356/437
• CPC Class Codes: G01N 21/15 Preventing contamination of the components of the optical system or obstruction of the light path
• CPC Class Codes: G01N 21/3504 for analysing gases, e.g. multi-gas analysis

Abstract

The present gas analyzer allows for the effective measurement of the concentration of one or more gases or vapors within a sample. The gas analyzer utilizes a plurality of reference filters that are located between the source and the sample region to enhance the measurements associated with the sample filters. The gas analyzer also utilizes a gas channel to facilitate the circulation of scrubbed gas between two separate housing sections.

Claims

1. A gas analyzer comprising:

a housing comprising;

a first housing section;

a second housing section longitudinally disposed from the first housing section to form an open air optical path measuring region between the first and second housing sections; and

a gas channel coupling the first housing section with the second housing section;

a source disposed within the housing; and

a detector disposed within the housing,

wherein the gas channel enables purged gas to flow between the first and second housing sections.

2. The invention of claim 1, wherein the source and the detector are approximately 5 inches apart.

3. The invention of claim 1, further comprising a second gas channel coupling the first housing section with the second housing section.

4. The invention of claim 1, further comprising a scrubber coupled with the housing.

5. The invention of claim 1, further comprising a scrubber located within the housing.

6. The invention of claim 1, further comprising a desiccant coupled with the housing.

7. The invention of claim 1, further comprising a desiccant located within the housing.

8. A gas analyzer comprising:

a housing comprising;

a first housing section;

a second housing section longitudinally disposed from the first housing section to form an open air optical path measuring region between the first and second housing sections; and

a plurality of gas channels coupling the first housing section with the second housing section;

a source disposed within the first housing section;

a scrubber disposed within the first housing section;

a desiccant disposed within the first housing section;

a filter member disposed within the first housing section, the filter member comprising first and second sample filters and first and second reference filters; and

a detector disposed within the second housing section, the detector being optically coupled with the source to create an open air optical path,

wherein the gas channels enable purged gas to flow between the first and second housing sections,

wherein the filter member is movably disposed to intermittently introduce the first and second sample filters and the first and second reference filters in an optical path between the source and the detector.

9. The invention of claim 8, wherein the first sample filter comprises a CO₂ filter.

10. The invention of claim 8, wherein the second sample filter comprises a H₂O filter.

11. The invention of claim 8, wherein the first sample filter comprises a band pass filter centered around 4.25 μ

m.

12. The invention of claim 8, wherein the second sample filter comprises a band pass filter centered around 2.59 μ

m.

13. The invention of claim 8, wherein the first reference filter comprises a band pass filter centered around 4.0 μ

m.

14. The invention of claim 8, wherein the second reference filter comprises a band pass filter centered around 2.3 μ

m.