CMOS-compatible three-dimensional image sensor IC
First Claim
1. A method to determine distance Z within resolution Δ
- Z between at least one pixel detector and a target less than about 100 m distant, the method comprising the following steps;
(a) disposing said at least one pixel detector so as to detect optical energy reflected from said target, each said pixel detector having a pixel integration delay time exceeding 2·
Δ
Z/C, where C is speed of light, and for each said pixel detector disposing an associated pixel time interval counter;
(b) illuminating said target at time t0 with at least a first pulse of optical energy from an energy source;
(c) starting each said pixel time interval counter at said time t0 to count a clock signal operating at frequency at least about C/(2·
Δ
Z);
(d) halting each said pixel time interval counter when an associated said pixel detector detects optical energy reflected from said target resulting from said first pulse;
wherein detection time for said pixel detector includes actual time of flight (TOF) from said energy source to said target to said pixel detector, as well as pixel integration delay time for said pixel detector; and
(e) removing said pixel integration delay time on a per pixel detector basis to obtain said actual TOF, whereby said distance Z is obtained.
3 Assignments
0 Petitions
Accused Products
Abstract
A three-dimensional imaging system includes a two-dimensional array of pixel light sensing detectors and dedicated electronics and associated processing circuitry fabricated on a common IC using CMOS fabrication techniques. In one embodiment, each detector has an associated high speed counter that accumulates clock pulses in number directly proportional to time of flight (TOF) for a system-emitted pulse to reflect from an object point and be detected by a pixel detector focused upon that point. The TOF data provides a direct digital measure of distance from the particular pixel to a point on the object reflecting the emitted light pulse. In a second embodiment, the counters and high speed clock circuits are eliminated, and instead each pixel detector is provided with a charge accumulator and an electronic shutter. The shutters are opened when a light pulse is emitted and closed thereafter such that each pixel detector accumulates charge as a function of return photon energy falling upon the associated pixel detector. The amount of accumulated charge provides a direct measure of round-trip TOF. In either embodiment, the collection of TOF data permits reconstruction of the three-dimensional topography of the light-reflecting surface of the object being imaged. The CMOS nature of the array permits random-order readout of TOF data if desired. Using a light source of a known wavelength and filtering out incoming light of other wavelengths permits use of the system with or without ambient light.
-
Citations
25 Claims
-
1. A method to determine distance Z within resolution Δ
- Z between at least one pixel detector and a target less than about 100 m distant, the method comprising the following steps;
(a) disposing said at least one pixel detector so as to detect optical energy reflected from said target, each said pixel detector having a pixel integration delay time exceeding 2·
Δ
Z/C, where C is speed of light, and for each said pixel detector disposing an associated pixel time interval counter;
(b) illuminating said target at time t0 with at least a first pulse of optical energy from an energy source;
(c) starting each said pixel time interval counter at said time t0 to count a clock signal operating at frequency at least about C/(2·
Δ
Z);
(d) halting each said pixel time interval counter when an associated said pixel detector detects optical energy reflected from said target resulting from said first pulse;
wherein detection time for said pixel detector includes actual time of flight (TOF) from said energy source to said target to said pixel detector, as well as pixel integration delay time for said pixel detector; and
(e) removing said pixel integration delay time on a per pixel detector basis to obtain said actual TOF, whereby said distance Z is obtained. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
outputting multiple optical energy pulses; and
averaging detection time for each said pulse to enhance signal/noise ratio in said determining said distance Z.
- Z between at least one pixel detector and a target less than about 100 m distant, the method comprising the following steps;
-
11. The method of claim 1, wherein at least one of step (a), step (c), step (d), and step (e) are carried out on a common integrated circuit substrate.
-
12. A CMOS-implementable integrated circuit (IC) time of flight (TOF) measurement system used with a generator that outputs light pulses commencing at time t0 to determine distance Z within resolution Δ
- Z between said IC and a target less than about 100 m distant, the IC including;
an array comprising a plurality of pixel detectors to detect generated light pulse energy returned from said target, each of said pixel detectors having a pixel integration delay time exceeding 2·
Δ
Z/C, where C is speed of light, said array further comprising for each of said pixel detectors an associated pixel time interval counter;
a system clock providing countable clock pulses to each said pixel time interval counter, said clock having a frequency at least about C/(2·
Δ
Z);
logic to enable each said pixel time interval counter to count said clock pulses commencing with start of a generated light pulse at said time t0, and to disable each said pixel time interval counter from further counting clock pulses when an associated pixel detector detects energy from the generated said light pulse;
wherein detection time for each said pixel detector includes actual time of flight (TOF) from said generator to said target to said pixel detector, as well as pixel integration delay time for said pixel detector; and
wherein said pixel integration delay time may be removed on a per pixel detector basis to obtain said actual TOF such that a direct digital measurement proportional to said distance Z is obtained. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
said system clock has at least one characteristic selected from a group consisting of (a) a clock rate exceeding about 100 MHz, (b) said clock pulses are single-phase clock pulses, (c) said clock compensates for clock pulse phase at each of said pixel detectors, and (d) said clock includes means for maintaining relative clock edge integrity.
- Z between said IC and a target less than about 100 m distant, the IC including;
-
14. The IC of claim 12, wherein each said pixel time interval counter is a pseudo random sequence counter.
-
15. The IC of claim 12, further including means for providing sub-clock period capacitor charging to measure output of each said pixel time interval counter.
-
16. The IC of claim 12, further including means to average detection time of multiple said pulses to enhance signal/noise ratio in determining said distance Z.
-
17. The IC of claim 12, further including means for collecting data over multiple light pulses, said means for collecting data including at least one of (a) a look-up calibration table for said IC to compensate for said pixel integration delay, and (b) means for examining characteristics associated with various of said pixel detectors to compensate for said pixel integration delay.
-
18. The IC of claim 12, further including a processor to process outputs from each said pixel time interval counter to provide Z distance data relating to said target.
-
19. The IC of claim 18, wherein said processor can determine at least one of (a) said Z distance from said IC to said target, (b) velocity of said target, (c) relative shape of said target, and (d) relative identification of said target.
-
20. A method to determine distance Z between a detector array and a target less than about 100 m distant, the method comprising the following steps:
-
(a) disposing said array so as to detect optical energy reflected from said target, the array comprising a plurality of pixel detectors, and for each pixel detector providing an associated charge collector, and for each pixel detector an associated shutter disposed intermediate an associated said pixel detector and associated said charge collector to control ability of said charge collector to collect charge output by an associated said pixel detector;
(b) at time t0, illuminating said target with a first pulse of optical energy having pulse width PW and opening each said shutter to permit said collector to collect any output resulting from detected optical energy reflected from said target resulting from said pulse;
(c) beginning at said time t0 to accumulate in each said collector any charge output by an associated said pixel detector;
(d) at a time Tep, corresponding to approximately PW=Tep−
t0, closing each said shutter to disable each said associated collector from accumulating further charge;
(e) after said time Tep, evaluating charge associated in each said collector to obtain a measure of actual time of flight (TOF) for each said pixel detector to said target; and
(f) at a subsequent time outputting a second pulse of known PW and opening and retaining open each said shutter until cessation of detected energy from said second pulse;
wherein said distance Z to said target may be determined. - View Dependent Claims (21, 22)
wherein measurement accuracy is enhanced.
-
-
22. The method of claim 20, further including accumulating charge in at least one of said pixel detectors to obtain calibration data representing reflectivity of said target.
-
23. A CMOS-implementable integrated circuit (IC) time of flight (TOF) measurement system used with a generator outputting at least a first light pulse of pulse width PW to determine distance Z between said IC and a target less than about 100 m distant, the IC comprising:
-
an array of pixel detectors to detect generated light pulse energy returned from said target, each pixel detector having a pixel integration delay time exceeding 2·
Δ
Z/C where C is speed of light;
for each of said pixel detectors, an associated charge collector, and for each pixel detector an associated shutter disposed intermediate an associated said pixel detector and associated said charge collector to control ability of said charge collector to collect charge output by an associated said pixel detector;
logic that opens each said shutter at a time t0 representing start of a generated said first light pulse to permit said collector to collect any output resulting from detected optical energy reflected from said target resulting from said first pulse, said logic closing each said shutter at a time Tep corresponding to approximately PW=Tep−
t0 width of each said first pulse to disable each said associated collector from accumulating further charge;
means for evaluating accumulated charge after said time Tep accumulated in each said collector to obtain a measure of actual time of flight (TOF) for each said pixel detector to said target;
said logic further opening and retaining open each said shutter, at a subsequent time corresponding to output duration of a second pulse of known pulse width, until cessation of detected energy from said second pulse;
wherein said distance Z to said target may be determined. - View Dependent Claims (24, 25)
-
Specification