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Determination of a best offset to detect an embedded pattern

  • US 6,330,673 B1
  • Filed: 10/14/1998
  • Issued: 12/11/2001
  • Est. Priority Date: 10/14/1998
  • Status: Expired due to Term
First Claim
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1. A method for determining a best offset with which to detect an embedded pattern in a digitized analog signal, the method comprising:

  • (a) selecting a range of two or more offsets of the digitized analog signal;

    (b) selecting a selected offset of the range of offsets;

    (c) forming a candidate basis signal in accordance with the selected offset of the digitized analog signal;

    (d) for each offset of the range of offsets;

    (i) shifting the digitized analog signal in accordance with the offset to form a shifted signal; and

    (ii) comparing the candidate basis signal to the shifted signal to provide a respective correlation signal; and

    (e) selecting the best offset of the range of offsets according to the respective correlation signals;

    wherein the selected offset is a central offset of the range of offsets.

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