Method and apparatus for wireless testing of integrated circuits

• US 6,331,782 B1
• Filed: 03/23/1998
• Issued: 12/18/2001
• Est. Priority Date: 03/23/1998
• Status: Expired due to Term

• Current Assignee: Skyworks Solutions Incorporated
• Original Assignee: Conexant Systems Incorporated (Synaptics Incorporated)
• Inventors: White, Stanley A., Walley, Kenneth S., Johnston, James W., Henderson, P. Michael, Hale, Kelly H., Andrews, Jr., Warner B., Siann, Jonathan I.
• Primary Examiner(s): Karlsen, Ernest
• Application Number:
  US09/046,011
• Time in Patent Office: 1,366 Days
• Field of Search: 324/763, 324/765, 324/767, 324/501, 714/733, 714/734
• US Class Current: 324/754.23
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/303 of integrated circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

A system for testing a microelectronic circuit includes a test bed for mounting a microelectronic circuit, and a signal source for applying a signal to a microelectronic circuit mounted on the test bed. The system additionally includes a test probe for wirelessly receiving electromagnetic response signals from the microelectronic circuit mounted on the test bed. In a preferred form, the electromagnetic response signals are radio-frequency signals. The test system additionally includes a computer connected to be test probe for analyzing the electromagnetic response signals. An integrated circuit for testing on the test system has a test circuit portion that emits electromagnetic radiation in response to a predetermined signal applied to the test circuit.

Claims

1. A system for testing a microelectronic circuit that includes a plurality of test portions configured to emit electromagnetic response signals in response to a predetermined signal, the system comprising:

a signal source for wirelessly applying said predetermined signal to said microelectronic circuit; and

a test probe for wirelessly receiving said electromagnetic response signals from said plurality of test portions of said microelectronic circuit mounted on a test bed, wherein each of the test portions uses a different frequency to transmit said electromagnetic response signals such that each frequency corresponds to a different test portion, and wherein the test probe comprises an electromagnetic receiver configured to detect said electromagnetic response.

2. The system of claim 1, wherein said electromagnetic response signals comprise radio-frequency signals.

3. The system of claim 1, wherein said electromagnetic response signals comprise infrared signals.

4. The system of claim 1, wherein said electromagnetic response signals comprise coherent optical signals.

5. The system of claim 1, additionally comprising a computer connected to said probe for analyzing said electromagnetic response signals received by said probe.

6. The system of claim 2, additionally comprising a computer connected to said probe for analyzing said radio-frequency response signals received by said probe.

7. The system of claim 1, wherein said signal source additionally wirelessly transmits electromagnetic test signals through said probe to said microelectronic circuit.

8. A test apparatus for testing an integrated circuit, the integrated circuit including a plurality of test portions configured to emit electromagnetic radiation in response to a predetermined signal, the test apparatus comprising:

a signal source for wirelessly applying to said integrated circuit the predetermined signal, such that said signal causes said plurality of test portions of said integrated circuit to emit said electromagnetic radiation, wherein each of the test portions uses a different frequency to transmit said electromagnetic radiation such that each frequency corresponds to a different test portion;

an electromagnetic radiation receiver configured to wirelessly detect said electromagnetic radiation emitted by said integrated circuit; and

a computer connected to said electromagnetic receiver for analyzing said electromagnetic radiation emitted by said integrated circuit.

9. The apparatus of claim 8, wherein said electromagnetic radiation is radio frequency radiation.

10. The apparatus of claim 8, wherein said electromagnetic radiation is infrared radiation.

11. The apparatus of claim 8, wherein said electromagnetic radiation is coherent optical radiation.

12. A combination comprising an integrated circuit and apparatus for testing said integrated circuit, the combination comprising:

an integrated circuit incorporating a plurality of test circuit portions, wherein said plurality of test circuit portions is configured so that as a first electrical effect is generated in each of said test circuit portions, said test circuit portion emits electromagnetic radiation, wherein each of the test portions uses a different frequency to transmit said electromagnetic radiation such that each frequency corresponds to a different test portion; and

a test device comprising;

an electromagnetic radiation receiver for wirelessly detecting said electromagnetic radiation emitted by said plurality of test circuit portions of said integrated circuit; and

an analyzer for analyzing said electromagnetic radiation detected by said receiver.

13. The integrated circuit and test apparatus combination of claim 12, wherein said analyzer analyzes said detected electromagnetic radiation to determine whether said plurality of test circuit portions is operating correctly.

14. The integrated circuit and test apparatus combination of claim 13, wherein said electromagnetic radiation is radio frequency radiation.

15. The integrated circuit and test apparatus combination of claim 13, wherein said electromagnetic radiation is infrared radiation.

16. The integrated circuit and test apparatus combination of claim 13, wherein said electromagnetic radiation is coherent optical radiation.