Systems and methods for two-sided etch of a semiconductor substrate
First Claim
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1. A method for processing a semiconductor substrate comprising:
- generating a reactive species for processing the substrate;
inducing a flow of the reactive species toward the substrate;
allowing a first portion of the flow to reach a first side of the substrate for processing; and
diverting a second portion of the flow to bypass the first side and flow to a second side of the substrate for processing.
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Abstract
A system and method for two-sided etch of a semiconductor substrate. Reactive species are generated and flowed toward a substrate for processing. A diverter is positioned between the generation chamber and the substrate. A portion of the reactive species flows through the diverter for processing the front of the substrate. Another portion is diverted around the substrate to the backside for processing. A flow restricter is placed between the substrate and the exhaust system to increase the residence time of reactive species adjacent to the backside.
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Citations
20 Claims
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1. A method for processing a semiconductor substrate comprising:
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generating a reactive species for processing the substrate;
inducing a flow of the reactive species toward the substrate;
allowing a first portion of the flow to reach a first side of the substrate for processing; and
diverting a second portion of the flow to bypass the first side and flow to a second side of the substrate for processing. - View Dependent Claims (3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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2. A reactor system for etching two sides of a semiconductor substrate, said reactor system comprising:
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a generation chamber for producing reactive species, a gas inlet for providing gas to said generation chamber, a process chamber within which a semiconductor substrate is processed, a gas outlet for exhausting the gas from the process chamber, wherein a flow of reactive species is induced from said generation chamber through said process chamber to the gas outlet, and a diverter between said generation chamber and said semiconductor substrate, wherein said substrate has a first side facing substantially towards said diverter and a second side facing substantially away from said diverter, wherein the diverter is configured to divert a portion of the reactive species to bypass the first side of the semiconductor substrate and enhance processing of the second side of the substrate.
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14. A system for processing a first side and a second side of a semiconductor substrate, the system comprising:
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a generation chamber for producing plasma products;
a support for the semiconductor substrate configured to expose the first side and the second side of the semiconductor substrate for processing; and
a diverter disposed between the generation chamber and the support, the diverter configured to divert a portion of the plasma products to bypass the first side of the substrate and flow to the second side of the substrate for processing. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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Specification