×

Ultra-high-frequency current probe in surface-mount form factor

  • US 6,337,571 B2
  • Filed: 11/13/1998
  • Issued: 01/08/2002
  • Est. Priority Date: 11/13/1998
  • Status: Expired due to Term
First Claim
Patent Images

1. An ultra high frequency current probe for providing an output signal indicative of an amount of current flowing in a current path of a device under test, said ultra high frequency current probe comprising:

  • a surface mount chassis adapted to be permanently mounted to a circuit board of said device under test, said surface mount chassis including;

    a current input terminal coupled to a current signal source for receiving an ultra high frequency signal;

    a high frequency ferrite transformer core;

    a primary winding, coupled between said current input terminal and a current output terminal, and threaded through said core;

    an input capacitance coupled between said current input terminal and a point of reference potential;

    an output capacitance coupled between said current output terminal and a point said point of reference potential;

    said current output terminal being coupled to a current signal sink; and

    a secondary winding, wound around the core, coupled between a test voltage output terminal and said source of reference potential, said secondary winding not receiving a bias current;

    said test voltage output terminal generating said output signal indicative of said amount of current flowing in said current path of said device under test, said current path including said primary winding extending from said current input terminal to said current output terminal;

    said test voltage output terminal providing said output signal to a test and measurement instrument;

    said current signal source exhibiting a characteristic impedance;

    said current signal sink exhibits said characteristic impedance; and

    said primary winding, said input capacitance, and said output capacitance form a lumped network exhibiting said characteristic impedance;

    said impedance characteristics of said circuit under test being substantially unaffected by monitoring of said circuit under test by said test and measurement instrument.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×