Ultra-high-frequency current probe in surface-mount form factor

• US 6,337,571 B2
• Filed: 11/13/1998
• Issued: 01/08/2002
• Est. Priority Date: 11/13/1998
• Status: Expired due to Term

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Crane, Albert S., Price, R. Kenneth, Murphy, Shawn C., Maddala, Vivek
• Primary Examiner(s): Metjahic, Safet
• Assistant Examiner(s): Deb, Anjan K
• Application Number:
  US09/190,967
• Publication Number:
  US 20010001536A1
• Time in Patent Office: 1,152 Days
• Field of Search: 324/754, 324/763, 324/755, 324/117.R, 324/127, 324/522, 336/173, 336/192, 336/200, 327/127, 327/522
• US Class Current: 324/117.00R
• CPC Class Codes: G01R 1/06772 High frequency probes
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

An ultra high frequency current probe is fabricated in the form of a surface mount device, designed to be a part of the circuit providing the current being observed.

Claims

1. An ultra high frequency current probe for providing an output signal indicative of an amount of current flowing in a current path of a device under test, said ultra high frequency current probe comprising:

a surface mount chassis adapted to be permanently mounted to a circuit board of said device under test, said surface mount chassis including;

a current input terminal coupled to a current signal source for receiving an ultra high frequency signal;

a high frequency ferrite transformer core;

a primary winding, coupled between said current input terminal and a current output terminal, and threaded through said core;

an input capacitance coupled between said current input terminal and a point of reference potential;

an output capacitance coupled between said current output terminal and a point said point of reference potential;

said current output terminal being coupled to a current signal sink; and

a secondary winding, wound around the core, coupled between a test voltage output terminal and said source of reference potential, said secondary winding not receiving a bias current;

said test voltage output terminal generating said output signal indicative of said amount of current flowing in said current path of said device under test, said current path including said primary winding extending from said current input terminal to said current output terminal;

said test voltage output terminal providing said output signal to a test and measurement instrument;

said current signal source exhibiting a characteristic impedance;

said current signal sink exhibits said characteristic impedance; and

said primary winding, said input capacitance, and said output capacitance form a lumped network exhibiting said characteristic impedance;

said impedance characteristics of said circuit under test being substantially unaffected by monitoring of said circuit under test by said test and measurement instrument.

2. The current probe of claim 1 wherein:

said input capacitance comprises a first capacitor having a first electrode coupled to said current input terminal and a second electrode coupled to ground; and

said output capacitance comprises a second capacitor having a first electrode coupled to said current output terminal and a second electrode coupled to ground.

3. The current probe of claim 2 wherein:

said first capacitor is formed by parasitic capacitance of said current input terminal; and

said second capacitor is formed by parasitic capacitance of said current output terminal.

4. The current probe of claim 1 wherein said secondary winding is comprised in output circuitry for exhibiting at the test voltage output terminal an output impedance equal to said characteristic impedance.

5. The current probe of claim 4 wherein said output circuitry comprises a series connection of an inductor and a resistor coupled between said test voltage output terminal and ground.