Real-time test controller

• US 6,338,148 B1
• Filed: 04/19/1999
• Issued: 01/08/2002
• Est. Priority Date: 11/10/1993
• Status: Expired due to Fees

• Current Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Original Assignee: Compaq Computer Corporation (HP Inc.)
• Inventors: Keels, Kenneth G., Brisky, Philip J., Gillenwater, Russell L.
• Primary Examiner(s): LE, DIEU MINH T
• Application Number:
  US09/295,465
• Time in Patent Office: 995 Days
• Field of Search: 714/25, 714/26, 714/27, 714/30, 714/718, 714/724
• US Class Current: 714/25
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G06F 11/2273 Test methods

Abstract

The real-time test controller maintains a failure database containing a history of past failures for devices under test and selectively sorts the history for the device to be tested. The diagnostic testing sequence is then rearranged with tests having higher failure rates being conducted first. If faults are detected, a message is provided to the operator and the failure database is either manually or automatically updated with the latest fault information. In this manner, a continuously updated history of faults is maintained and the most efficient testing sequence is followed, resulting in significant time and cost savings.

Claims

1. A controller for controlling testing of manufactured products, comprising:

storage means for storing a plurality of diagnostic tests for use in testing the manufactured products;

testing means for testing the manufactured products using the plurality of diagnostic tests, wherein the testing means uses the plurality of diagnostic tests in a predetermined sequence;

memory means for storing test failure data indicative of failure rates of previously failed diagnostic tests from previous test runs;

processing means for reading a selected amount of the test failure data indicative of failure rates and determining an optimum sequence for using the plurality of diagnostic tests in a current test run by sorting each of the diagnostic tests in order of the failure rates of the previously failed diagostic tests; and

control means for, before the beginning of the current test run, replacing the predetermined sequence with the optimum sequence for using the plurality of diagnostic tests for the current test run, to cause the testing means to test the manufactured products using the plurality of diagnostic tests in accordance with the optimum sequence.

2. A controller according to claim 1, wherein the processing means includes spectrum generating means for generating a spectrum of failed diagnostic tests over a selectable period of time, and optimized sequence generation means for generating the optimized sequence for conducting the plurality of diagnostic tests based on the spectrum of failed diagnostic tests.

3. A controller according to claim 1, the testing means further including notification means for sending the control means a notification signal indicative of results of the diagnostic tests.

4. A controller according to claim 3, wherein the control means includes update means, responsive to the notification signal, for selectively updating the information stored in the memory means.

5. A method for controlling testing of manufactured products, the method comprising the steps of:

storing a plurality of diagnostic tests for use in testing the manufactured products;

storing a plurality of test failure data records indicative of failure rates of previously failed diagnostic tests from previous test runs;

reading a selected number of the stored test failure data records indicative of failure rates;

determining an optimized sequence for the current test run for using the plurality of diagnostic tests based on the reading of the test failure data records by sorting the diagnostic tests in order of the failure rates of the previously failed diagnostic tests; and

testing the manufactured goods using the plurality of diagnostic tests in accordance with the optimized sequence.

6. A method according to claim 5, wherein the step of reading includes the step of:

selecting a set of stored test failure data records; and

searching for matches between the selected set of stored test failure data records and the stored plurality of diagnostic tests.

7. A method according to claim 6, wherein the step of determining includes the step of:

maintaining a count of matches found for each of the stored plurality of diagnostic tests; and

producing the optimized sequence for using the stored plurality of diagnostic tests based upon the count of matches found for each of the stored plurality of diagnostic tests.

8. A method according to claim 7, wherein the optimized sequence is produced such that a diagnostic test having the highest count is used first, and a diagnostic test having the lowest count is used last.

9. A diagnostic test apparatus, comprising:

user input means for receiving instructions from a user of the test apparatus;

storage means for storing a plurality of diagnostic tests;

memory means for storing test failure data indicative of failure rates of previously failed diagnostic tests from previous test runs;

optimizing means, responsive to the user input means, before the beginning of a current test run, for reading the stored test failure data indicative of failure rates and determining an optimized sequence for using the stored plurality of diagnostic tests in a current test run by sorting the diagnostic tests in order of the failure rates of the previously failed diagnostic tests; and

testing means for testing a product using the plurality of diagnostic tests in accordance with the optimized sequence.

10. An apparatus according to claim 9, wherein the user input means comprises a command module.

11. An apparatus according to claim 9, wherein the user input means comprises a general purpose digital computer.

12. An apparatus according to claim 9, wherein the memory means comprises a mass storage device.

13. An apparatus according to claim 12, wherein the mass storage device stores a database of test failure data records indicative of previously failed diagnostic tests.

14. An apparatus according to claim 13, wherein the test failure data records are stored in chronological order.

15. An apparatus according to claim 9, further including test failure recordation means for recording test failure data in the memory means when the product fails one of the plurality of diagnostic tests.

16. An apparatus according to claim 15, wherein the test failure recordation means automatically records test failure data in the memory means when the product fails one of the plurality of diagnostic tests.

17. An apparatus according to claim 15, wherein the user input means includes a display for displaying information to the user, and wherein the test failure recordation means displays a message to the user on the display when the product fails one of the plurality of diagnostic tests.

18. An apparatus according to claim 15, wherein the test failure recordation means includes mode selection means for selecting between a first operating mode in which test failure data is automatically recorded in the memory means when the product fails one of the plurality of diagnostic tests, and a second operating mode in which the test failure recordation means waits for an instruction from the user before recording the test failure data.

19. An apparatus according to claim 9, further including instruction storage means for storing a plurality of instruction parameters input by the user.

20. An apparatus according to claim 19, wherein the optimizing means includes:

parsing means for reading the stored plurality of instruction parameters;

filter means for determining, based on the read instruction parameters, a search filter for sorting test failure data stored in the memory means;

reading means for reading a predetermined amount of test failure data from the memory means based on the search filter;

test determining means for determining, based on the read instruction parameters, a set of selected diagnostic tests;

searching means for searching through the read predetermined amount of test failure data to determine an individual number of occurrences for each of the selected diagnostic tests;

sorting means for sorting the set of selected diagnostic tests based on the number of occurrences.

21. A method for diagnostic testing comprising the steps of:

receiving instructions from a user of the test apparatus;

storing a plurality of diagnostic tests;

storing, in a memory device, test failure data indicative of failure rates of previously failed diagnostic tests from previous test runs;

reading, in response to the received instructions, the stored test failure data indicative of failure rates;

determining, before the beginning of a current test run, an optimized sequence for using the stored plurality of diagnostic tests in the current test run by sorting the diagnostic tests in order of the failure rates of the previously failed diagnostic tests; and

testing a product using the plurality of diagnostic tests in accordance with the optimized sequence.

22. A method according to claim 21, wherein the receiving step comprises the steps of:

providing a command module for enabling a user to input commands; and

converting the commands input by the user through the command module into machine interpretable instructions.

23. A method according to claim 21, wherein the receiving step comprises the steps of:

providing a general purpose digital computer for enabling a user to input commands; and

converting the commands input by the user through the general purpose digital computer into machine interpretable instructions.

24. A method according to claim 21, wherein storing step comprises the steps of:

providing a mass storage device for storing the test failure data; and

loading the mass storage device with data indicative of previously failed diagnostic tests.

25. A method according to claim 24, wherein the loading step includes a step of creating historical database of test failure data records indicative of previously failed diagnostic tests.

26. A method according to claim 25, wherein the step of creating a historical database includes a step of loading test failure data records in chronological order.

27. A method according to claim 21, further including the step of recording test failure data in the memory device if the product fails one of the plurality of diagnostic tests.

28. A method according to claim 27, wherein the test failure data is automatically recorded in the memory device when the product fails one of the plurality of diagnostic tests.

29. A method according to claim 27, further including the step of providing a display for displaying information to the user, and the step of recording test failure data includes the step of displaying a message to the user on the display if the product fails one of the plurality of diagnostic tests.

30. A method according to claim 27, further including the step of selecting between a first operating mode in which test failure data is automatically recorded in the memory device when the product fails one of the plurality of diagnostic tests, and a second operating mode in which an instruction from the user is required before the test failure data will be recorded in the memory device.

31. A method according to claim 21, further including the step of storing a plurality of instruction parameters input by the user.

32. A method according to claim 31, wherein the determining step includes the steps of:

reading the stored plurality of instruction parameters;

determining, based on the read instruction parameters, a search filter for sorting test failure data stored in the memory device;

reading a predetermined amount of test failure data from the memory device based on the search filter;

determining, based on the read instruction parameters, a set of selected diagnostic tests;

searching through the read predetermined amount of test failure data to determine an individual number of occurrences for each of the selected diagnostic tests;

sorting the set of selected diagnostic tests based on the individual number of occurrences.

33. A system for testing, comprising:

a plurality of testing means for testing a manufactured product, wherein each of the plurality of testing means conducts at least one diagnostic test on the manufactured product;

moving means for moving the manufactured product between each of the plurality of testing means;

memory means for storing test failure data indicative of failure rates of previously failed diagnostic tests conducted at each of the plurality of testing means from previous test runs;

processing means for, before the beginning of the current test run, reading a selected amount of the stored test failure data indicative of failure rates and determining an optimum sequence for using the plurality of diagnostic tests in the current test run by sorting the diagnostic tests in order of the failure rates of the previously failed diagnostic tests; and

control means for controlling the moving means to move the manufactured product between the plurality of testing means in accordance with the optimum sequence for using the plurality of diagnostic tests in the current run.

34. A system for testing manufactured products, comprising:

storage means, located on the manufactured products, for storing a plurality of diagnostic tests for use in testing the manufactured products;

testing means, located external to the manufactured products, for accessing the storage means and testing each of the manufactured products using the plurality of diagnostic tests stored in the storage means on the products, wherein the testing means uses the plurality of diagnostic tests in a predetermined sequence;

memory means for storing test failure data indicative of failure rates of the previously failed diagnostic tests;

processing means for reading a selected amount of the stored test failure data indicative of failure rates and determining an optimum sequence for using the plurality of diagnostic tests for the current test run by sorting the diagnostic tests in order of the failure rates of the previously failed diagnostic tests; and

control means for, before the beginning of a current test run, the predetermined sequence with the optimum sequence, thereby causing the testing means to test the manufactured products using the plurality of diagnostic tests in accordance with the optimum sequence in the current test run.

35. A system for testing manufactured products according to claim 34, wherein the storage means comprises

a read only memory for storing a first plurality of diagnostic tests, the read only memory being readable by the processing means;

a random access memory for storing at least one additional diagnostic test or portion of a diagnostic test, the processing means being able to read information from and write information to the random access memory.

36. A system for testing manufactured products according to claim 35, further comprising:

remote communication means, wherein the processing means communicates with the testing means through the remote communication means, the processing means being located in a first location and the testing means being located in a second location, the first and second locations being spaced apart by a predetermined distance.

37. A system for testing manufactured products according to claim 36, wherein the remote communication means comprises a local area network.

38. A system for testing manufactured products according to claim 36, wherein the processing means and the testing means each include a modem, the remote communication means comprising a telecommunication link between the modem in the processing means and the modem in the testing means.