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Electronic over stress detector circuit for magnetoresistive devices in data storage devices such as disc drives

  • US 6,339,380 B1
  • Filed: 04/07/2000
  • Issued: 01/15/2002
  • Est. Priority Date: 08/25/1999
  • Status: Expired due to Fees
First Claim
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1. An electrical over stress detection circuit for detecting an over stress condition for a transducer in a data storage device during device manufacture which could adversely affect the read/write transducer in the device after device manufacture, the circuit comprising:

  • a reference voltage; and

    an amplifier in a transducer preamplifier connected to the transducer and to a comparator, the comparator being connected to the reference voltage and to an output of the amplifier wherein the comparator provides a first output state if the amplifier output does not exceed the reference voltage, and provides a second output state indicating an over stress condition if the amplifier output exceeds the reference voltage.

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