Diode defect detecting device

• US 6,342,791 B1
• Filed: 02/10/2000
• Issued: 01/29/2002
• Est. Priority Date: 02/10/1999
• Status: Expired due to Fees

• Current Assignee: Nas-Toa Company Limited (Nippon Yakin Kogyo Company Limited), Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Original Assignee: Nas-Toa Company Limited (Nippon Yakin Kogyo Company Limited), Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: Ichikawa, Kinya, Okado, Chihiro, Fujino, Suteo, Izume, Takatomo, Sakata, Yasuo, Kurata, Koichiro
• Primary Examiner(s): Metjahic, Safet
• Assistant Examiner(s): KERVEROS, DEMETRIOS C
• Application Number:
  US09/501,243
• Time in Patent Office: 719 Days
• Field of Search: 324/767, 324/765, 323/224, 323/229, 327/172, 363/41
• US Class Current: 324/762.07
• CPC Class Codes: G01R 31/2632 for testing diodes
• CPC Class Codes: G01R 31/27 Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements testing printed circuit boards G01R31/2801

Abstract

This invention is a diode defect detecting device including a current detector for detecting the primary current of a transformer, a comparator for comparing the detection current detected by the current detector with a current reference and outputting a reset signal if the detection current is larger than the current reference, an oscillator for generating a clock signal, a flip-flop circuit for receiving a set signal on the basis of a front and an end edge of the clock signal generated by the oscillator and receiving the output reset signal from the comparator, a polarity changing circuit for outputting a polarity changing signal for changing the polarities of the plurality of diodes on the basis of the output clock signal from the flip-flop circuit, and a determination circuit for calculating, in order to detect malfunctions of the plurality of diodes, any impedance change on the secondary side viewed from the primary side of the transformer on the basis of the pulse width of each polarity of the output clock signal from the flip-flop circuit.

Claims

1. A diode defect detecting device used in a controller in which an inverter converts a direct current into an alternate current and supplies the alternate current to a primary side of a transformer, and a rectifying circuit having a plurality of diodes connected to a secondary side of said transformer rectifies an alternate current induced on the secondary side into a direct current and supplies the direct current to a load, comprising:

a current detector for detecting a primary current of said transformer;

a comparator for comparing the detection current detected by said current detector with a current reference and outputting a reset signal if the detection current is larger than the current reference;

an oscillator for generating a clock signal;

a flip-flop circuit for receiving a set signal based on a front and an end edge of the clock signal generated by said oscillator and receiving the output reset signal from said comparator;

a polarity changing circuit for outputting a polarity changing signal for changing polarities of said plurality of diodes on the basis of the output clock signal from said flip-flop circuit; and

a determination circuit for calculating, in order to detect malfunctions of said plurality of diodes, an impedance change on the secondary side viewed from the primary side of said transformer based on a pulse width of each polarity of output clock signal from said flip-flop circuit.

2. A device according to claim 1, wherein said determination circuit calculates the impedance change by using a modulation factor of the pulse width of each polarity and a peak value of the primary current detected by said current detector, thereby detecting a diode malfunction.

3. A device according to claim 1, wherein said determination circuit calculates the impedance change by using a modulation factor of the pulse width of each polarity and the current reference, thereby detecting a diode malfunction.

4. A device according to claim 1, wherein said determination circuit detects a diode malfunction when the modulation factor of the pulse width of each polarity becomes not more than a predetermined value.

5. A device according to claim 1, wherein said determination circuit obtains a pulse width of each polarity during a few cycles after said inverter is started.

6. A device according to claim 1, wherein said determination circuit detects a diode malfunction if a value obtained by dividing a pulse width of one polarity by a pulse width of the other polarity is larger than a predetermined value.

7. A device according to claim 1, further comprising:

an alarm generating circuit for generating alarm when said determination circuit detects a diode malfunction.

8. A device according to claim 1, wherein the pulse width of each polarity is obtained by counting the pulse width of each polarity of the output clock signal from said flip-flop circuit by using a counter.

9. A diode defect detecting device used in a controller in which an inverter converts a direct current into an alternate current and supplies the alternate current to a primary side of a transformer, and a rectifying circuit having a plurality of diodes connected to a secondary side of said transformer rectifies an alternate current induced on the secondary side into a direct current and supplies the direct current to a load, comprising:

a current detector for detecting a primary current of said transformer;

a comparator for comparing the detection current detected by said current detector with a current reference and outputting a reset signal if the detection current is larger than the current reference;

an oscillator for generating a clock signal;

a flip-flop circuit for receiving a set signal on the basis of a front and an end edge of the clock signal generated by said oscillator and receiving the output reset signal from said comparator;

a polarity changing circuit for outputting a polarity changing signal for changing polarities of said plurality of diodes on the basis of the output clock signal from said flip-flop circuit;

a current change rate detector for detecting a change rate of the primary current of said transformer;

a first latch circuit for latching the current change rate detected by said current change rate detector at an input timing of an end edge of a positive side clock signal of the clock signal of each polarity output from said flip-flop circuit;

a second latch circuit for latching the current change rate detected by said current change rate detector at an input timing of an end edge of a negative side clock signal of the clock signal of each polarity output from said flip-flop circuit; and

a circuit for detecting malfunctions of said plurality of diodes if a difference between the current change rates latched by said first and second latch circuits is not less than a predetermined value.