×

Large-scale integrated circuit and method for testing a board of same

  • US 6,343,365 B1
  • Filed: 11/04/1998
  • Issued: 01/29/2002
  • Est. Priority Date: 02/17/1998
  • Status: Expired due to Fees
First Claim
Patent Images

1. A large-scale integrated circuit having a structure that has a scan path formed by a series connection of flip-flops, said scan path being divided into an I/O scan path formed by a series connection of only flip-flops, each of which is in a region near the respective I/O pins, and an internal scan path formed by a series connection of flip-flops other than those as afore-mentioned, and said large-scale integrated circuit further comprising a selector that selects either all scan paths or only said I/O scan path.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×