Image acquisition system for machine vision applications

• US 6,346,966 B1
• Filed: 07/07/1997
• Issued: 02/12/2002
• Est. Priority Date: 07/07/1997
• Status: Expired due to Fees

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Toh, Peng Seng
• Primary Examiner(s): Garber, Wendy R.
• Assistant Examiner(s): White, Mitchell
• Application Number:
  US08/889,076
• Time in Patent Office: 1,681 Days
• Field of Search: 348/79, 348/91, 348/92, 348/164, 348/162, 348/342, 348/340, 348/262, 356/73, 356/239.8, 356/237.3, 356/237.2, 356/239.7, 356/239.1, 250/458.1, 382/145, 382/147, 382/148, 382/191, 359/368, 359/385, 359/388, 359/389
• US Class Current: 348/79
• CPC Class Codes: H04N 23/56 provided with illuminating means
• CPC Class Codes: H04N 23/74 by influencing the scene brightness using illuminating means

Abstract

An image acquisition system is provided that allows different lighting techniques to be applied to a scene containing an object of interest concurrently. Within a single position, multiple images which are illuminated by different lighting techniques can be acquired by selecting specific wavelength bands for acquiring each of the images. In a typical application, both back lighting and front lighting can be simultaneously used to illuminate an object, and different image analysis methods may be applied to the images.

Claims

1. An image inspection system for inspecting an object, comprising:

a back light source positioned generally behind the object for transmitting light past the object in a predetermined direction in order to project a silhouette image of the object, the back light source being limited to a first wavelength band,

a front light source positioned generally in front of the object for reflecting light off the object in the predetermined direction in order to project a reflective image of the object, the front light source being limited to a second wavelength band having minimal overlap with the first wavelength band,

separating means positioned generally in front of the object to receive the transmitted and reflected light in said predetermined direction from the object, and to separate the transmitted and reflected light into light traveling along a first path and light traveling along a second path,

a first image sensor positioned in the first path to acquire a first image of the object from the light traveling along the first path,

a second image sensor positioned in the second path to acquire a second image of the object from the light traveling along the second path, and

filtering means to attenuate in the first path light from the second wavelength band, and to attenuate in the second path light from the first wavelength band, such that the first image acquired by the first sensor is substantially a back-lit silhouette image, and the second image acquired by the second sensor is substantially a front-lit reflective image in the second wavelength band.

2. An image inspection system according to claim 1, wherein the filtering means comprises a wavelength filter located in each of the first and second paths.

3. An image inspection system according to claim 1, wherein the separating means comprises a beam splitter.

4. An image inspection system according to claim 1, further comprising means for regulating the intensity of the light in each of the first and second paths.

5. An image inspection system according to claim 4, wherein the regulating means comprises neutral density filters located in each of the first and second paths.

6. A method of inspecting an object comprising:

transmitting light past the object in a predetermined direction using a back light source positioned generally behind the object in order to project a silhouette image of the object, the back light source emitting light in a first wavelength band,

reflecting light off the object in the predetermined direction using a front light source positioned generally in front of the object in order to project a reflective image of the object, the front light source emitting light in a second wavelength band having minimal overlap with the first wavelength band,

separating the transmitted and reflected light into light traveling along a first path and light traveling along a second path,

attenuating in the first path light from the second wavelength band,

attenuating in the second path light from the first wavelength band,

acquiring a back-lit silhouette image of the object from the light travelling along the first path, and

acquiring a front-lit reflective image of the object in the second wavelength band from the light traveling along the second path.

7. A method according to claim 6, wherein the steps of attenuating the light in the first and second paths comprises filtering the light using a wavelength filter in each of the first and second paths.

8. A method according to claim 6, wherein the steps of acquiring the images comprises receiving the images using an image sensor in each of the first and second paths.