Magnetoresistive element and magnetic recording apparatus

• US 6,348,274 B1
• Filed: 12/27/1999
• Issued: 02/19/2002
• Est. Priority Date: 12/28/1998
• Status: Expired due to Fees

• Current Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Original Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: Yuasa, Hiromi, Sahashi, Masashi, Iwasaki, Hitoshi, Kamiguchi, Yuzo
• Primary Examiner(s): KILIMAN, LESZEK B
• Application Number:
  US09/472,144
• Time in Patent Office: 785 Days
• Field of Search: 428/697, 428/654.R, 428/694.T, 428/694.TS, 428/694.TM, 428/694.RL, 428/300, 360/113
• US Class Current: 428/811
• CPC Class Codes: B82Y 10/00 Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
• CPC Class Codes: B82Y 25/00 Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
• CPC Class Codes: G11B 2005/3996 large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
• CPC Class Codes: G11B 5/3903 using magnetic thin film layers or their effects, the films being part of integrated structures
• CPC Class Codes: H01F 10/3259 Spin-exchange-coupled multilayers comprising at least a nanooxide layer [NOL], e.g. with a NOL spacer
• CPC Class Codes: H01F 10/3263 the exchange coupling being symmetric, e.g. for dual spin valve, e.g. NiO/Co/Cu/Co/Cu/Co/NiO
• CPC Class Codes: H01F 41/325 applying a noble metal capping on a spin-exchange-coupled multilayer, e.g. spin filter deposition
• CPC Class Codes: Y10S 428/90 Magnetic feature
• CPC Class Codes: Y10T 428/1107 Magnetoresistive
• CPC Class Codes: Y10T 428/1171 with defined laminate structural detail

Abstract

A magnetoresistive element includes a pinned layer, free layer and non-magnetic spacer film between them. The pinned layer is made up of a first ferromagnetic metal layer, first non-metal layer on the first ferromagnetic metal layer, second non-metal layer on the first non-metal layer and different in composition from the first non-metal layer, and second ferromagnetic metal layer on the second non-metal layer. Thus, the magnetoresistive element, which may be used in a magnetic head of a magnetic recording apparatus, ensures a good bias property of the pinned film while maintaining a large MR changing rate of a specular spin valve structure, and it is simultaneously improved in soft magnetic property.

Claims

1. A magnetoresistive element having a spin valve structure comprising a first magnetic film, a second magnetic film, and a non-magnetic spacer film interposed between said first magnetic film and said second magnetic film;

one of said first and second magnetic films including a first ferromagnetic metal layer;

a first non-metal layer provided on said first ferromagnetic metal layer;

a second non-metal layer provided on said first non-metal layer and different in composition from said first non-metal layer; and

a second ferromagnetic metal layer provided on said second non-metal layer;

said first and second non-metal layers being an electron reflecting layer.

9. The magnetoresistive element according to claim 1, wherein said non-magnetic spacer film contains at least one selected from oxides, nitrides, and fluorides.

10. The magnetoresistive element according to claim 1, wherein a total thickness of said first and second non-metal layers is not larger than 3 nm.

11. The magnetoresistive element according to claim 1, wherein one of said first and second non-metal layers, which is remoter from said non-magnetic spacer film, includes a material containing at least nickel.

2. A magnetoresistive element having a spin valve structure comprising a first magnetic film, a second magnetic film, and a non-magnetic spacer film interposed between said first magnetic film and said second magnetic film;

one of said first and second magnetic films including a first ferromagnetic metal layer;

a second ferromagnetic metal layer provided on said first ferromagnetic metal layer and different in composition from said first ferromagnetic metal layer;

a non-metal layer provided on said second ferromagnetic metal layer; and

a third ferromagnetic metal layer provided on said non-metal layer;

said non-metal layer being an electron reflecting layer.

12. The magnetoresistive element according to claim 2, wherein said non-magnetic spacer film contains at least one selected from oxides, nitrides and fluorides.

13. The magnetoresistive element according to claim 2, wherein one of said first and second ferromagnetic metal layers, which is remoter from said non-magnetic spacer film, contains nickel alloy.

3. A magnetoresistive element having a spin valve structure comprising a first magnetic film, a second magnetic film, and a non-magnetic spacer film interposed between said first magnetic film and said second magnetic film;

one of said first and second magnetic films including a first ferromagnetic metal layer;

a first non-metal layer provided on said first ferromagnetic metal layer;

a second ferromagnetic metal layer provided on said first non-metal layer;

a second non-metal layer provided on said second ferromagnetic metal layer; and

a third ferromagnetic metal layer provided on said second non-metal layer;

said first and second non-metal layers being an electron reflecting layer.

14. The magnetoresistive element according to claim 3, wherein said non-magnetic spacer film contains at least one selected from oxides, nitrides, and fluorides.

15. The magnetoresistive element according to claim 3, wherein said non-magnetic spacer film has an area of pin holes which is not larger than half of the area of the entirety.

4. A magnetoresistive element having a spin valve structure comprising a first magnetic film, a second magnetic film, and a non-magnetic spacer film interposed between said first magnetic film and said second magnetic film;

one of said first and second magnetic films including;

a first ferromagnetic metal layer containing at least one element selected from the group consisting of lithium (Li), beryllium (Be), sodium (Na), magnesium (Mg), aluminum (Al), silicon (Si), phosphorus (P), potassium (K), calcium (Ca), scandium (Sc), gallium (Ga), rubidium (Rb), strontium (Sr), yttrium (Y), cesium (Cs), barium (Ba) and elements belonging to the lanthanide series by not less than 1%, a non-metal layer formed on said first ferromagnetic metal layer; and

a second ferromagnetic metal layer formed on said non-metal layer;

said non-metal layer being an electron reflecting layer.

5. The magnetoresistive element according to claim 4, wherein said first ferromagnetic metal layer contains at least one element selected from the groups consisting of aluminum (Al), silicon (Si) and elements belonging to the lanthanide series by not less than 1%.

16. The magnetoresistive element according to claim 4, wherein said non-magnetic spacer film contains at least one selected from oxides, nitrides, and fluorides.

6. A magnetoresistive element having a spin valve structure which includes a first magnetic film, a second magnetic film, and a non-magnetic spacer film interposed between said first magnetic film and said second magnetic film, wherein:

one of said first and said second magnetic films includes a first ferromagnetic metal layer, a non-metal layer provided on said first ferromagnetic metal layer, and a second ferromagnetic metal layer provided on said non-metal layer,

said non-metal layer being made of an antiferromagnetic material which satisfies the equation;

17. The magnetoresistive element according to claim 6, wherein said non-magnetic spacer film is made of an antiferromagnetic material, and includes first and second magnetic atomic layers having a magnetization of an anti-ferromagnetic orientation respectively, and third magnetic layer interposed between said first and second magnetic atomic layers and having a magnetization of a ferromagnetic orientation, and an atomic surface of said third magnetic atomic layer is substantially parallel with the surface of said non-magnetic spacer film.

18. The magnetoresistive element according to claim 6, wherein said non-magnetic spacer film contains at least one selected from NiO, CoO, and Fe₂O₃.

7. A magnetoresistive element having a spin valve structure which includes a first magnetic film, a second magnetic film, and a non-magnetic spacer film interposed between said first magnetic film and said second magnetic film, wherein:

one of said first and said second magnetic films includes a first ferromagnetic metal layer, a non-metal layer provided on said first ferromagnetic metal layer, and a second ferromagnetic metal layer provided on said non-metal layer,

said non-metal layer being made of an antiferromagnetic material which satisfies the equation;

19. The magnetoresistive element according to claim 7, wherein said non-magnetic spacer film is made of an antiferromagnetic material, and includes first and second magnetic atomic layers having a magnetization of an anti-ferromagnetic orientation respectively, and third magnetic layer interposed between said first and second magnetic atomic layers and having a magnetization of a ferromagnetic orientation, and an atomic surface of said third magnetic atomic layer is substantially parallel with the surface of said non-magnetic spacer film.

20. The magnetoresistive element according to claim 7, wherein said non-magnetic spacer film contains at least one selected from NiO, CoO, and Fe₂O₃.

8. A magnetic recording apparatus having a magnetic head for recording or reproducing information on or form a magnetic recording medium, characterized in that said magnetic head includes a magnetoresistive element,

said magnetoresistive element having a spin valve structure comprising a first magnetic film, a second magnetic film, and an non-magnetic spacer film interposed between said first magnetic film and said second magnetic film,

one of said first and second magnetic films including a first ferromagnetic metal layer;

a first non-metal layer provided on said first ferromagnetic metal layer;

a second non-metal layer provided on said first non-metal layer and different in composition from said first non-metal layer; and

a second ferromagnetic metal layer provided on said second non-metal layer;

said first and second non-metal layers being an electron reflecting layer.