Method and apparatus for assigning pins for electrical testing of printed circuit boards

• US 6,348,805 B1
• Filed: 03/10/1999
• Issued: 02/19/2002
• Est. Priority Date: 03/10/1998
• Status: Expired due to Fees

• Current Assignee: Mania-Barco GmbH
• Original Assignee: Mania-Barco GmbH
• Inventors: Jackson, William E., Guthrie, Thomas L.
• Primary Examiner(s): MAI, SON LUU
• Application Number:
  US09/265,666
• Time in Patent Office: 1,077 Days
• Field of Search: 716/12-15, 324/754, 324/758, 324/761
• US Class Current: 324/750.16
• CPC Class Codes: G01R 1/07328 for testing printed circuit boards
• CPC Class Codes: G01R 3/00 Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments , e.g. of probe tips
• CPC Class Codes: G01R 31/2808 Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards probe, multiprobe, probe manipulator or probe fixture G01R1/067
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06

Abstract

A process for creating a pin assignment for a test fixture for electronic circuits is disclosed. A difficulty rating is determined for each test point on an electronic circuit. The difficult areas are assigned the pins on a test grid, with the difficulty rating of adjacent test points being iteratively determined as the process continues. If a pin cannot be assigned because of conflicts, one or more adjacent test points are reassigned pins, with the difficulty matrix being recalculated with each change and with pins being reassessed and reassigned. When all test points are assigned a pin, the pins are checked to see if they interfere with each other, and further iterations may result.

Claims

1. A method for determining a pin layout for a test fixture for an electrical interconnect device, the test fixture having a plurality of test points each of which is to be connected to one of a plurality of grid points using one of a plurality of pins that is associated with said one of a plurality of grid points, comprising the steps of:

for each of a plurality of said test points, identifying adjacent grid points that are within a first predetermined deflection distance;

determining a difficulty metric for each of said plurality of test points based on the number, density and location of competing test points;

assigning one of said pins and its associated grid point to each of said test points according to the difficulty metric, with the test points having the highest difficulty metric being assigned pins first; and

redetermining the difficulty metric for those test points within a maximum deflection distance of each test point as it is assigned a pin.

2. A method as defined in claim 1, comprising the further step of:

determining if a pin cannot be assigned to a test point because all adjacent grid points and their associated pins have been assigned, and if so, then identifying the test points within said predetermined distance of the test point that cannot be assigned a pin, and selecting one of the pins associated with those test points to borrow a pin from, and redetermining the difficulty metric for the borrowed pin and the other pins associated with said test points that were considered for borrowing.

3. A method as defined in claim 2, comprising the further step of:

determining if a pin cannot be assigned to a test point because all adjacent grid points and their associated pins have been assigned, and if so, borrowing a pin previously assigned to a test point within said predetermined deflection distance of the test point that could not previously be assigned a pin.

4. A method as defined in claim 2, comprising the further step of determining whether any pins interfere with each other and identifying any pins having such interference.

5. A method as defined in claim 2, comprising the further step of determining whether any pins interfere with each other, identifying any pins having such interference, and for at least one pair of identified interfering pins, exchanging the test points that are connected to the pins.

6. A method as defined in claim 4, comprising the further step of determining whether any pins interfere with each other, identifying any pins having such interference, and for at least one pair of identified interfering pins, identifying other test points within said predetermined distance of one of the test points associated with an interfering pin and selecting one of the pins associated with those other test points to borrow a pin from, and redetermining the difficulty metric for the borrowed pin and the other pins associated with said test points that were considered for borrowing.

7. A test fixture having pins assigned according to the method of claim 1.

8. A test fixture having pins assigned according to the method of claim 6.

9. A method for determining a pin layout for a test fixture for an electrical interconnect device, the test fixture having a plurality of test points each of which is to be connected to one of a plurality of grid points using one of a plurality of pins, each pin having a maximum permitted deflection, comprising the steps of:

selecting a first test point and identifying adjacent test points that are within a predetermined pin deflection as being close enough to compete with grid points that may be assigned to the first test point, and assigning a test point density number based on the number of test points so identified, and repeating the selecting, identifying and test point density number assigning steps for each of the plurality of test points;

selecting a first grid point within a first predetermined pin deflection of the first test point, and identifying the grid points adjacent that first grid point that are within a second predetermined pin deflection, and assigning a grid point density number to the first grid point based on the number of adjacent grid points so identified, and repeating the grid point selecting, grid point identifying and grid point density number assigning steps for each of the plurality of grid points;

ranking a plurality of the test points based on at least one of (a) the resulting pin deflection needed to connect a grid to the test point, (b) the grid point density number, and (c) the test point density number;

using the ranking to identify a test point that is difficult to connect to a grid point with a pin and assigning a pin to that test point, and repeating the pin assigning step for each of the non-assigned pins; and

backtracking the assigning step if there are no pins to assign to an unassigned test point.

10. A method as defined in claim 9, wherein the backtracking step comprises the step of taking an assigned pin and reassigning it to the unassigned test point and repeating the ranking and assigning steps to assign a pin to the grid point from which the reassigned pin was taken.

11. A method as defined in claim 9, wherein the ranking step is performed after each pin assigning step.

12. A method as defined in claim 10, wherein the ranking step is performed after each pin assigning step.

13. A method as defined in claim 9, wherein the ranking step is based on the distance between test points.

14. A method as defined in claim 9, wherein the ranking step is based on the distance between test points and the grid point density number.

15. A method as defined in claim 11, wherein the ranking step is based on the distance between test points and the grid point density number.

16. A method as defined in claim 11, wherein at least one of the predetermined lengths is the maximum permitted pin deflection.

17. A method as defined in claim 11, comprising the further step of making a test fixture having pins located as determined by said method.

18. A method as defined in claim 11, comprising the further step of determining whether any of the pins interfere with each other, and if two pins interfere, then switching said pins.

19. A method as defined in claim 18, wherein if pins still interfere with each other after being switched, repeating the calculating, assigning and recalculating steps to reassign previously assigned pins.

20. A method as defined in claim 11, wherein if no grid point is available and a previously reassigned pin could connect to the unassigned test point, then undoing the previous reassignment and connecting the pin to the unassigned test point, and repeating the calculating, assigning and recalculating steps to reassign previously assigned pins.

21. A method for determining a pin layout for an electronic test fixture having a plurality of test points each of which is to be connected to one of a plurality of grid points using one of a plurality of pins, comprising the steps of:

inserting a plurality of said test point locations into a test point grid;

inserting a plurality of grid point locations into a grid point grid; and

assigning a pin between the test points and grid points based on a predetermined algorithm that ranks the test points to identify those that are assigned pins first, wherein if the pin assigning step can no longer assign a pin when there is an unassigned test point and at least one grid point left, then taking a previously assigned pin within an acceptable pin deflection distance and reassigning it to the unassigned test point, and repeating the assigning step.

22. A method as defined in claim 21, comprising the further step of recalculating the pin assignment algorithm to re-rank the test points after each pin is assigned.

23. A method as defined in claim 21, wherein the assigning step is determined by the deflection of the pin.

24. A method as defined in claim 23 wherein the assigning step is also determined by the number of grid points within a predetermined deflection distance of the test point.

25. A method as defined in claim 21, wherein the assigning step is determined by the number of grid points within a predetermined deflection distance of the test point.

26. A method as defined in claim 21, wherein the assigning step is determined by the number of other test points within a predetermined deflection distance of the test point.

27. A method as defined in claim 21, wherein if a pin is reassigned the pin being reassigned is selected as having the greatest permissible deflection.

28. A method as defined in claim 21, comprising the further step of making a test fixture having pins located as determined by said method.

29. A method as defined in claim 21, comprising the further step of determining whether any of the pins interfere with each other, and if two pins interfere, then switching the interfering pins.

30. A method as defined in claim 29, wherein if pins still interfere with each other after being switched, repeating the calculating, assigning and recalculating steps to reassign previously assigned pins.

31. A method for determining a pin layout for an electronic test fixture having a plurality of test points each of which is to be connected to one of a plurality of grid points using one of a plurality of pins that is within a maximum deflection distance of said test point, comprising the steps of:

calculating a ranking index for a plurality of test points;

assigning a pin to one of said plurality of test points based on the ranking index;

recalculating the index for the remaining test points that have not been assigned a pin; and

repeating the calculating, assigning and recalculating steps.

32. A method as defined in claim 31, wherein the step of repeating the calculating, reassigning and recalculating steps are repeated until either (a) all the test points are assigned, or (b) there are no available grid points for an unassigned test point.

33. A method as defined in claim 32, wherein if there are no available grid points for an unassigned test point, then comprising the further steps of reassigning a previously assigned pin to the unassigned test point, and repeating the calculating, assigning, recalculating and reassigning steps to assign further pins.

34. A method as defined in claim 32, wherein the ranking index is based on at least one of:

(a) the density of test points surrounding the test point being assigned a pin, and (b) the density of grid points surrounding a grid point which is being considered being assigned a pin.

35. A method as defined in claim 32, wherein the assigning step is determined by a deflection of the pin.

36. A method as defined in claim 32, wherein the assigning step is determined by the number of grid points within a predetermined deflection distance of the test point.

37. A method as defined in claim 32, wherein the assigning step is determined by the number of grid points within a predetermined deflection distance of the test point and a deflection of the pin.

38. A method as defined in claim 32, wherein the reassigning step further comprises reassigning a pin having the greatest permissible pin deflection that has not been previously reassigned.

39. A method as defined in claim 32, comprising the further step of making a test fixture having pins located as determined by said method.

40. A method as defined in claim 32, comprising the further step of determining whether any of the pins interfere with each other.

41. A method as defined in claim 39, wherein if pins interfere with each other, switching the interfering pins.

42. A method as defined in claim 40, wherein if pins still interfere with each other after being switched, repeating the calculating, assigning and recalculating steps to assign further pins.

43. A method as defined in claim 32, wherein if no grid point is available and a previously reassigned pin could connect to the unassigned test point, then undoing the previous reassignment and connecting the pin to the unassigned test point, and repeating the calculating, assigning and recalculating steps to assign further pins.

44. A method as defined in claim 42, wherein if no grid point is available after the undoing and reassignment, then the assigning step is performed based on the number of grid points within a predetermined distance of the unassigned test point, and said predetermined distance is increased so long as said distance does not exceed a maximum permissible deflection.