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Method and apparatus for measuring gate leakage current in an integrated circuit

  • US 6,348,806 B1
  • Filed: 03/18/1999
  • Issued: 02/19/2002
  • Est. Priority Date: 03/18/1999
  • Status: Expired due to Fees
First Claim
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1. An integrated circuit, comprising:

  • a first circuit; and

    a measurement circuit coupled to the first circuit, the measurement circuit adapted to measure gate leakage current of the first circuit, the measurement circuit comprising a quasi-breakdown indication means, the quasi-breakdown indication means adapted to provide a quasi-breakdown indication when the gate leakage current exceeds a predetermined threshold;

    wherein the measurement circuit comprises a current-to-frequency converter; and

    wherein the current-to-frequency converter comprises;

    a current controlled oscillator, comprising;

    a first current integrator adapted to integrate the gate leakage current into an input voltage;

    a first comparator adapted to compare the input voltage to a reference voltage;

    a latch coupled to an output of the first comparator and having an output; and

    a first charging circuit coupled to the first current integrator, the first comparator, and the output of the latch.

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