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Method for sorting integrated circuit devices

  • US 6,350,959 B1
  • Filed: 03/07/2000
  • Issued: 02/26/2002
  • Est. Priority Date: 01/17/1997
  • Status: Expired due to Fees
First Claim
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1. A recovery process for recovering integrated circuit devices from a group of previously rejected integrated circuit devices in accordance with a test standard that has since been relaxed, the integrated circuit devices having a substantially unique identification code, the method comprising:

  • providing a test standard that has been relaxed including at least two standards selected from a group comprising speed, access time, data setup time, data hold time, standby current, refresh current, and operating current;

    storing test results for each integrated circuit device of said previously rejected integrated circuit devices, said test results having the cause for rejection of each integrated circuit device of said previously rejected integrated circuit devices having the identification code of the rejected integrated circuit device of the previously rejected integrated circuit devices;

    reading the identification code from each integrated circuit device of the previously rejected integrated circuit devices;

    determining the test results stored in connection with each integrated circuit device from the identification code therefore;

    comparing the test result for each integrated circuit device of the previously rejected integrated circuit devices to the relaxed test standard; and

    sorting the previously rejected integrated circuit devices for integrated circuit devices that pass the relaxed test standard based upon the comparing of the test result of the integrated circuit device to recover any of the integrated circuit devices having test results that pass the relaxed test standard.

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