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CMOS image sensor with high quantum efficiency

  • US 6,350,979 B1
  • Filed: 04/28/1999
  • Issued: 02/26/2002
  • Est. Priority Date: 04/28/1999
  • Status: Expired due to Fees
First Claim
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1. An imaging integrated circuit, comprising:

  • a plurality of pixel cells, each pixel cell including a substrate portion configured to accumulate photon-generated electric charge, a photogate over said substrate portion, a floating diffusion sense node adjacent said photogate, an output transistor connected to said floating diffusion sense node, and wherein said photogate forms a plurality of gaps allowing light to penetrate to said substrate portion without having to pass through said photogate, said gaps extending toward said floating diffusion without being blocked by any portion of said photogate.

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