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Voltage and clock margin testing of memory-modules using an adapter board mounted to a PC motherboard

  • US 6,351,827 B1
  • Filed: 10/30/2000
  • Issued: 02/26/2002
  • Est. Priority Date: 04/08/1998
  • Status: Expired due to Term
First Claim
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1. A test system for margin-testing memory modules comprising:

  • a motherboard, the motherboard being a main board for a computer using memory modules as a memory, the motherboard containing a processor for executing a test program that writes and reads memory;

    a test adaptor board, mounted to the motherboard, the test adaptor board having a test socket for connecting memory modules for testing by the motherboard, the test adaptor board for electrically connecting a memory module connected to the test socket to the motherboard attached to the test adaptor board, the motherboard using the memory module inserted into the test socket as a portion of the memory of the motherboard; and

    a voltage margin circuit, coupled between a power-supply and a power-supply input to the test socket, for adjusting a power-supply voltage applied to the memory module inserted into the test socket to a value that differs from the power-supply voltage on the motherboard by a voltage margin;

    wherein the test program executing on the motherboard margin tests the memory module receiving a power-supply voltage that differs from the motherboard power-supply voltage by the voltage margin, whereby margin testing of the memory module is performed without altering the power-supply voltage on the motherboard.

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