Closed loop system and method for heating a probe

• US 6,355,916 B1
• Filed: 05/18/1999
• Issued: 03/12/2002
• Est. Priority Date: 05/18/1999
• Status: Expired due to Term

• Current Assignee: Carefusion 303 Incorporated (Becton, Dickinson & Co)
• Original Assignee: ALARIS Medical Systems, Inc. (Becton, Dickinson & Co)
• Inventors: Siefert, Robert J.
• Primary Examiner(s): Gutierrez, Diego
• Assistant Examiner(s): PRUCHNIC, STANLEY J
• Application Number:
  US09/313,824
• Time in Patent Office: 1,029 Days
• Field of Search: 374/164, 374/185, 219/497, 219/500, 219/494, 219/503, 702/131, 700/299, 700/300, 600/549
• US Class Current: 219/494
• CPC Class Codes: G01K 7/42 Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature

Abstract

A system and method for rapidly preheating the probe of a thermometer to a temperature closer to the temperature of a patient to be measured. The system comprises a probe heater, a probe temperature sensor, a power source, and a processor for controlling the delivery of energy from the power source to the heater. The processor adds an offset to the drive level to the heater which is dependent on the ambient temperature and the power source voltage to achieve more rapid heater response. The processor maintains control over the drive level applied to the heater in accordance with the temperature sensor so that at all times a closed loop system is provided.

Claims

1. A closed loop heating system for heating a probe, comprising:

a sensor mounted to the probe, the sensor configured to sense the temperature of the probe and provide a time varying temperature signal in response to the temperature of the probe;

a heater mounted at the probe and responsive to heater control signals to provide heat to the probe;

a power source having a voltage;

a processor connected to the power source, the sensor, and the heater so as to provide a closed loop system in heating the probe, the processor providing a drive level of power from the power source to the heater to cause the heater to heat the probe, the processor applying a drive level offset to the drive level to the heater, the drive level offset being a non-zero value which is a function of ambient temperature and the power source voltage to more rapidly achieve heating of the probe to a target temperature in a stable controlled fashion.

2. The heating system of claim 1 wherein the processor senses the temperature of the probe and if the temperature of the probe is below a first threshold, the processor is configured to apply a larger level of drive energy to the heater to cause the probe to heat faster, and upon reaching the first threshold, the processor reduces the drive level of power to the heater in a proportional manner, the threshold being dependent on the drive level offset.

3. The heating system of claim 2, wherein upon the temperature of the probe reaching the first threshold, the processor is configured to reduce the drive level of power to the heater in a non-continuous manner.

4. The heating system of claim 2, wherein upon the temperature of the probe reaching the first threshold, the processor is configured to reduce the drive level of power to the heater in steps of decreasing drive level.

5. The closed loop heating system of claim 1 wherein the processor is further configured to restrict the drive level applied to the heater to a maximum value based upon the source voltage.

6. The closed loop heating system of claim 1 wherein the processor is further configured to apply the non-zero drive level offset to the drive level to maintain the probe at the target temperature, the processor evaluating the non-zero offset as a function of the error between the actual temperature and the target temperature and as a function of the power source voltage.

7. A method of heating a probe in a closed loop manner, comprising the steps of:

sensing the temperature of the probe and providing a time varying temperature signal in response to the temperature of the probe;

applying a drive level of power from a power source to a heater at the probe to heat the probe in response to the time varying temperature signal in a closed loop manner, the power source having a voltage; and

applying a drive level offset to the drive level to the heater, the offset being a non-zero value which is a function of ambient temperature and the power source voltage to more rapidly achieve heating of the probe to a target temperature in a stable controlled fashion.

8. The method of claim 7, further comprising restricting the drive level applied to the heater to a maximum value based upon the power source voltage.

9. The method of claim 7, further comprising:

applying the non-zero drive level offset to the drive level to maintain the probe at the target temperature; and

evaluating the non-zero offset as a function of the error between the actual temperature and the target temperature and as a function of the power source voltage.

10. The method of claim 7, further comprising:

sensing the temperature of the probe and if the temperature of the probe is below a first threshold, applying a larger level of drive energy to the heater to cause the probe to heat faster, and

wherein upon reaching the first threshold, reducing the drive level of power to the heater in a proportional manner, the threshold being dependent on the drive level offset.

11. The method of claim 7, further comprising:

sensing the temperature of the probe and if the temperature of the probe is below a first threshold, applying a larger level of drive energy to the heater to cause the probe to heat faster, and

wherein upon the temperature of the probe reaching the first threshold, reducing the drive level of power to the heater in a noncontinuous manner.

12. The method of claim 7, further comprising:

sensing the temperature of the probe and if the temperature of the probe is below a first threshold, applying a larger level of drive energy to the heater to cause the probe to heat faster, and

wherein upon the temperature of the probe reaching the first threshold, reducing the drive level of power to the heater in steps of decreasing drive level.

13. A method of heating a probe of a medical thermometer in a closed loop manner to a target temperature, comprising the steps of:

sensing on a time varying basis the temperature of the probe;

evaluating the difference between the sensed temperature of the probe and the target temperature; and

providing a drive level of power from a power source to a heater at the probe in a closed loop manner, the heater configured to heat the probe;

wherein an offset drive level is applied to the drive level to the heater, the offset drive level being a non-zero value that is a function of ambient temperature and a voltage of the power source, to more rapidly achieve heating of the probe to the target temperature in a stable controlled fashion.

14. The method of claim 13, further comprising restricting the drive level applied to the heater to a maximum value based upon the source voltage.

15. The method of claim 13, further comprising:

applying the non-zero drive level offset to the drive level to maintain the probe at the target temperature; and

evaluating the non-zero offset as a function of the error between the actual temperature and the target temperature and as a function of the power source voltage.

16. The method of claim 13, further comprising:

sensing the temperature of the probe and if the temperature of the probe is below a first threshold, applying a larger level of drive energy to the heater to cause the probe to heat faster, and

wherein upon reaching the first threshold, reducing the drive level of power to the heater in a proportional manner, the threshold being dependent on the drive level offset.

17. The method of claim 13, further comprising:

sensing the temperature of the probe and if the temperature of the probe is below a first threshold, applying a larger level of drive energy to the heater to cause the probe to heat faster, and

wherein upon the temperature of the probe reaching the first threshold, reducing the drive level of power to the heater in a noncontinuous manner.

18. The method of claim 13, further comprising:

sensing the temperature of the probe and if the temperature of the probe is below a first threshold, applying a larger level of drive energy to the heater to cause the probe to heat faster, and

wherein upon the temperature of the probe reaching the first threshold, reducing the drive level of power to the heater in steps of decreasing drive level.