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Silicon carbide LMOSFET with gate reach-through protection

  • US 6,355,944 B1
  • Filed: 12/21/1999
  • Issued: 03/12/2002
  • Est. Priority Date: 12/21/1999
  • Status: Expired due to Fees
First Claim
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1. A lateral metal-oxide-semiconductor field effect transistor (LMOSFET) comprising:

  • a first layer of silicon carbide semiconductor material having a p-type conductivity;

    a second layer of silicon carbide semiconductor material having an n-type conductivity formed on the first layer;

    source and drain regions having n-type conductivities formed in the second silicon carbide semiconductor layer, the n-type conductivities of the source and drain regions being greater than then-type conductivity of the second silicon carbide layer;

    a trench extending through the second silicon carbide semiconductor layer and partially into the first silicon carbide semiconductor layer, so that the source and drain regions are substantially lateral thereto, the drain region being spaced apart from the trench by a portion of the second layer which forms a drift region, the trench coated with a layer of an electrically insulating oxide material and partially filled with a layer of metallic material, the layers of oxide and metallic material forming a self-aligned gate structure;

    a channel region defined in the first layer beneath the gate structure; and

    electrical contacts associated with the source and drain regions, and the gate structure thereby establishing source, drain, and gate electrodes;

    wherein the gate structure is adapted to provide a current path in the channel region which avoids sharp corners.

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