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Current monitor system and a method for manufacturing it

  • US 6,356,068 B1
  • Filed: 05/12/1999
  • Issued: 03/12/2002
  • Est. Priority Date: 09/15/1997
  • Status: Expired due to Term
First Claim
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1. A system for galvanically insulated current measurement, comprising:

  • a CMOS die having a structured surface with an integrated circuit including at least one Hall sensor and bonding pads for external connections to the integrated circuit and leads connectable to the bonding pads and a current path short-cutting at least two leads, whereby the leads and the current path are parts of the same lead frame onto which the die is mounted with its structured surface facing the lead frame and with the current path and the ends of the leads fixed to the structured surface of the die with the aid of electrically insulating connecting means, characterized in that the least one Hall sensor is sensitive perpendicular to the die surface and in that the longitudinal edge of the current path is positioned near the center of the sensitive plane of the at least one Hall sensor.

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