Built-in self test method for measuring clock to out delays

• US 6,356,514 B1
• Filed: 03/23/2001
• Issued: 03/12/2002
• Est. Priority Date: 09/17/1996
• Status: Expired due to Term

• Current Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Original Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Inventors: Conn, Robert O., Wells, Robert W., Patrie, Robert D.
• Primary Examiner(s): MISKA, VIT W
• Application Number:
  US09/816,712
• Time in Patent Office: 354 Days
• Field of Search: 368/110-113, 368/118-120, 324/73.R, 324/73.AT, 324/76, 324/77, 324/76.8, 324/617, 324/763, 324/765
• US Class Current: 368/113
• CPC Class Codes: G01R 27/04 in circuits having distributed constants , e.g. having very long conductors or involving high frequencies
• CPC Class Codes: G01R 31/2853 Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66
• CPC Class Codes: G01R 31/2882 Testing timing characteristics
• CPC Class Codes: G01R 31/3016 Delay or race condition test, e.g. race hazard test
• CPC Class Codes: G01R 31/31725 Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937
• CPC Class Codes: G01R 31/318516 Test of programmable logic devices [PLDs]
• CPC Class Codes: G01R 31/31937 Timing aspects, e.g. measuring propagation delay G01R31/3191 and G01R31/31922 take precedence; marginal testing G06F11/24

Abstract

A circuit measures the signal propagation delay through a selected test circuit. The test circuit is provided with a feedback path so that the test circuit and feedback path together form a free-running oscillator. The oscillator then automatically provides its own test signal that includes alternating rising and falling signal transitions on the test-circuit input node. These signal transitions are counted over a predetermined time period to establish the period of the oscillator. The period of the oscillator is then related to the average signal propagation delay through the test circuit. The invention can be applied to synchronous components that might fail to oscillate by connecting the asynchronous set or clear terminal to the output terminal so that the oscillator oscillates at a frequency determined by the clock-to-out delay of those components. The configuration can thus be used to characterize synchronous and asynchronous components to provide data for predicting the timing behavior of circuits that include those or similar components.

Claims

1. A delay circuit comprising:

a. a chain of at least first and last synchronous circuits, each synchronous circuit having;

1. a clock terminal;

2. a synchronous input terminal;

3. an asynchronous input terminal;

4. an output terminal; and

5. a delay element having an input terminal connected to the output terminal of the synchronous circuit and an output terminal connected to the asynchronous input terminal;

b. an inverting element having an inverting element output terminal connected to the first synchronous circuit clock terminal and an inverting element input terminal connected to last synchronous circuit output terminal; and

c. at least one connector connecting the output terminal of a synchronous circuit in the chain other than the last synchronous circuit to the clock terminal of a next synchronous circuit, thereby forming the chain.

2. The delay circuit of claim 1, wherein at least one of the synchronous circuits is a flip-flop.

3. A system for determining a maximum signal propagation delay from a clock input terminal of a synchronous test circuit to an output terminal of the synchronous test circuit, the system comprising:

a. a plurality of at least first and last synchronous test circuits, each synchronous test circuit having;

1. a clock terminal;

2. a synchronous input terminal;

3. an asynchronous input terminal;

4. an output terminal connected to the clock terminal of another of the synchronous components; and

5. a delay element having an input terminal connected to the output terminal of the synchronous component and an output terminal connected to the asynchronous input terminal; and

b. an inverting element having an inverting element output terminal connected to the first synchronous circuit clock terminal and an inverting element input terminal connected to last synchronous circuit output terminal; and

c. at least one connector connecting the output terminal of a synchronous circuit in the chain other than the last synchronous circuit to the clock terminal of a next synchronous circuit, thereby forming the chain; and

d. a counter including an input node and an output node, the input node being connected to at least one of the output terminals of the synchronous circuits.

4. The system of claim 3, further comprising a phase discriminator having an input node connected to at least one of the input and output terminals of the synchronous test circuit.

5. The system of claim 4, wherein the phase discriminator includes a sample clock sequentially producing alternating rising and falling signal transitions on a sample-clock node.

6. A method for measuring a maximum signal propagation delay from a clock input of a synchronous test circuit to an output node of the synchronous test circuit, the method comprising:

a. providing a signal transition on the clock input of the synchronous test circuit;

b. receiving an output signal transition on the output node of the synchronous test circuit in response to the signal transition on the clock input;

c. conveying the output signal transition to a second clock terminal of a second synchronous test circuit to clock the second synchronous test circuit; and

d. resetting the synchronous test circuit after a delay period sufficient to allow the second synchronous test circuit to clock.

7. The method of claim 6, wherein the signal transition is one of a rising edge and falling edge of a logic signal.

8. The method of claim 6, wherein the synchronous test circuit comprises a flip-flop.

9. A circuit configuration for measuring a maximum signal propagation delay from a clock input of a synchronous test circuit to an output node of the synchronous test circuit, the configuration comprising:

a. means for providing a signal transition on the clock input of the synchronous test circuit;

b. means for receiving an output signal transition on the output node of the synchronous test circuit in response to the signal transition on the clock input;

c. means for conveying the output signal transition to a second clock terminal of a second synchronous test circuit to clock the second synchronous test circuit; and

d. means for resetting the synchronous test circuit after a delay period sufficient to allow the second synchronous test circuit to clock.

10. A method of measuring a first signal-propagation delay time required for a signal transition to traverse a test circuit from an input node of the test circuit to an output node of the test circuit, the method comprising:

a. providing a train of sequential, alternating rising and falling signal transitions on the test-circuit input node, thereby producing a test signal comprised of a delayed series of alternating rising and falling signal transitions on the test circuit output node;

b. measuring the period of the test signal on the test-circuit output node; and

c. measuring the duty cycle of the test signal on the test-circuit output node.

11. The method of claim 10, further comprising multiplying the period of the test signal by the duty cycle of the test signal.

12. The method of claim 10, wherein measuring the period of the test signal comprises counting a number of test-signal periods over a predetermined time.

13. The method of claim 10, wherein the test signal comprises a series of alternating high and low logic levels, and wherein measuring the duty cycle of the test signal comprises:

a. sampling the test signal during the high logic levels at a sample rate to determine a first variable; and

b. sampling the test signal during the low logic levels at the sample rate to determine a second variable.