Enhancing voltmeter functionality
DCFirst Claim
1. Circuitry for dynamic testing of a circuit under load, comprising:
- a test load adapted to be coupled between inputs of a digital voltmeter, the test load replacing a component of the circuit under load; and
a switch adapted to short circuit test leads of the voltmeter through the test load.
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Abstract
Enhanced voltmeter leads includes load circuitry having a test load that can be switchably coupled between the leads to help identify faults in a circuit under test. In certain embodiments, the value of the test load can be any appropriate value set according to parameters or characteristics of the circuit under test. In these embodiments, the value of the test load can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. The leads include a switch whose setting is adjustable to couple and decouple the test load between the leads. The switch can be located in the leads or in a lead handle of the leads for easy access by a user/technician. The leads can also include a fuse or circuit breaker for safety reasons. The leads can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test with the switch both closed and open. Conventional test leads or the leads that include the switch to couple/decouple the test load can be used if the load circuitry is integrated into the voltmeter or if the load circuitry has a separate coupling or connection to the voltmeter inputs.
58 Citations
44 Claims
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1. Circuitry for dynamic testing of a circuit under load, comprising:
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a test load adapted to be coupled between inputs of a digital voltmeter, the test load replacing a component of the circuit under load; and
a switch adapted to short circuit test leads of the voltmeter through the test load. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for dynamic testing of a circuit under load, the method comprising:
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removing a component from the circuit under load;
coupling leads of a digital voltmeter to remaining terminals of the removed component in the circuit;
closing a switch to short circuit inputs of the digital voltmeter through a test load; and
making dynamic tests of the circuit under load using the digital voltmeter, the test load completing the circuit under load. - View Dependent Claims (9, 10)
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11. An enhanced functionality digital voltmeter comprising:
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circuitry for dynamic testing of a circuit under load, comprising;
a test load adapted to be coupled between inputs of a digital voltmeter, the test load replacing a component of the circuit under load; and
a switch adapted to short circuit test leads of the digital voltmeter through the test load. - View Dependent Claims (12)
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13. A method of enhancing digital voltmeter functionality, the method comprising:
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incorporating, in a digital voltmeter, circuitry for dynamic testing of a circuit under load, comprising;
incorporating a test load adapted to be coupled between inputs of the digital voltmeter for replacing a component of the circuit under load; and
incorporating a switch adapted to short circuit test leads of the digital voltmeter through the test load. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21)
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22. Circuitry for use in identifying a fault in a circuit under test, comprising:
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a test load adapted to be coupled between test leads of a digital voltmeter; and
a switch adapted, when closed, to couple the test load between the test leads and, when opened, to decouple the test load from the test leads, wherein when the test leads are coupled to the circuit under test and the switch is closed, the test load replaces a component of the circuit under test. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43)
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44. Test leads for testing a circuit under test with a digital voltmeter, comprising:
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a first test lead;
a second test lead; and
a load adapted to be switchably coupled between the first and second test leads such that, in one switchable state, the load completes the circuit under test, replacing a component of the circuit under test.
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Specification