Memory tester with data compression

• US 6,360,340 B1
• Filed: 11/19/1996
• Issued: 03/19/2002
• Est. Priority Date: 11/19/1996
• Status: Expired due to Term

• Current Assignee: Teradyne Incorporated
• Original Assignee: Teradyne Incorporated
• Inventors: Brown, Benjamin J., Joffe, Alexander, Donaldson, John F., Gage, Robert B.
• Primary Examiner(s): Iqbal, Nadeem
• Application Number:
  US08/752,414
• Time in Patent Office: 1,946 Days
• Field of Search: 371/21.1, 371/21.6, 371/27.5, 371/40.2, 371/40.3, 371/41, 395/182.03, 395/182.06, 395/183.07, 395/183.13, 395/183.21, 395/185.01, 324/73.1, 348/397, 714/25, 714/27, 714/30, 714/42, 714/48, 714/718, 714/723
• US Class Current: 714/718
• CPC Class Codes: G01R 31/31912 Tester/user interface
• CPC Class Codes: G01R 31/31935 Storing data, e.g. failure memory
• CPC Class Codes: G11C 29/44 Indication or identification of errors, e.g. for repair
• CPC Class Codes: G11C 29/56 External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Abstract

A semiconductor memory test system with improved fault data processing and display capabilities. The memory tester includes a lossless data compressor for failure data. Compression allows failure data to be more rapidly transferred to a display device that is part of a work station controlling the memory tester. It also reduces the amount of data that must be stored in the display memory, thereby providing a cost effective way to store data from multiple tests. By allowing data for multiple tests to be stored, the data from a prior test can be used to control the formatting of data for a subsequent test. Such formatting is useful for such things as observing failure mechanisms as the operating temperature or speed of the semiconductor memory under test increases.

Claims

1. A memory test system comprising:

a) a semiconductor memory tester;

b) means, within the semiconductor memory tester, for generating a stream of data representing faulty cells within a memory under test;

c) an output device;

d) a bus connecting the output device to the semiconductor memory tester; and

e) a display processor, connected to receive the stream of data as an input and to provide a processed stream of data as an output on the bus, the display processor comprising a lossless data compression circuit.

2. The memory test system of claim 1 wherein the output device comprises a display screen.

3. The memory test system of claim 1 wherein the lossless data compression circuit comprises a run length encoder.

4. The memory test system of claim 1 wherein the display processor includes a display memory and the lossless data compression circuit is connected at the input of the display memory to store compressed data in the display memory.

5. The memory test system of claim 1 wherein the display processor includes a display memory and the lossless data compression circuit is connected at the output of the display memory to compress data from the display memory as it is passed to the bus.

6. The memory test system of claim 5 wherein the output device comprises a work station with a display screen and the lossless data compressor is controlled by commands sent by the work station over the bus.

7. The memory test system of claim 1 wherein the display processor comprises a plurality of display memories, each holding compressed data for at least one test.

8. The memory test system of claim 7 additionally comprising means, connected to the plurality of display memories, for combining the data from a first test with data from a second test and storing the combined data in one of the plurality of display memories.

9. The memory test system of claim 8 wherein the data from the first test and the data from the second test is combined to indicate new failures in the second test not occurring in the first test.

10. A memory test system comprising:

a) a semiconductor memory tester;

b) means, within the semiconductor memory tester, for generating a stream of data representing faulty cells within a memory under test;

c) an output device;

d) a display processor, connected to receive the stream of data as an input and to provide a processed stream of data to the output device, the display processor comprising a gating circuit having a first data input and a second data input, the first data input coupled to the stream of data as an input, the gating circuit comprising means for combining values at the first data input with values at the second data input in accordance with a programmable function to provide the processed data output;

e) at least one memory having an input and an output, the at least one memory connected to selectively receive the processed data at its input and to provide data from its output to the second data input of the gating circuit.

11. The memory test system of claim 10 wherein the gating circuit comprises means for generating a logical one output when a bit at the first data input is a logical 1 and the corresponding bit at the second data input is a logical 0.

12. The memory test system of claim 10 wherein the gating circuitry comprises means for selectively inverting the data stream at the first data input.

13. The memory test system of claim 10 wherein the means for combining values at the first data input and the second data input comprises means for logically ANDing the values at the first data input and the second data input.

14. The memory test system of claim 13 wherein the means for combining values at the first data input and the second data input comprises means for logically ORing the values at the first data input and the second data input.

15. The memory test system of claim 10 additionally comprising:

a) means, within the display processor, for compressing the processed data stream;

b) means, connected between the output of the at least one memory and the second data input of the display processor, for decompressing data.

16. The memory test system of claim 10 additionally comprising:

a) a counter connected to the output of the gating circuit; and

b) an error stack for receiving the output of the counter after the display processor has processed data for a test.

17. A memory test system comprising:

a) a semiconductor memory tester;

b) means, within the semiconductor memory tester, for generating a stream of data representing faulty cells within a memory under test;

c) a display processor, connected to receive the stream of data as an input, including a run length encoder, the run length encoder providing as an output a compressed data stream.

18. The memory test system of claim 17 additionally comprising a display memory with an input, with the run length encoder connected to compress data provided to the input of the display memory.

19. The display memory of claim 17 additionally comprising:

a) a display memory with an input and an output,

b) a work station connected to receive data from the display processor, with the run length encoder connected to compress data read at the output of the display memory.

20. The memory test system of claim 19 additionally comprising:

a) a work station with a display means; and

b) a bus connecting the work station to the display processor with the run length encoder directly connected to the display memory.