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Diagnostic layer and methods for detecting structural integrity of composite and metallic materials

  • US 6,370,964 B1
  • Filed: 11/23/1999
  • Issued: 04/16/2002
  • Est. Priority Date: 11/23/1998
  • Status: Expired due to Term
First Claim
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1. A diagnostic layer for detecting a structural condition of a material, said diagnostic layer comprising:

  • a thin and flexible dielectric substrate having embedded therein;

    a network of actuators/sensors spatially distributed such that at least two actuators/sensors detect a propagating stress wave generated by at least one other actuators/sensors, wherein said actuators/sensors capable of generating electrical signals representative of a structural condition of said material;

    a plurality of conductive elements electrically interconnecting said actuators/sensors; and

    an output lead electrically connected to said conductive elements.

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