Apparatus and method for characterizing libraries of different materials using X-ray scattering

• US 6,371,640 B1
• Filed: 10/03/2000
• Issued: 04/16/2002
• Est. Priority Date: 12/18/1998
• Status: Expired due to Fees

• Current Assignee: Symyx Technologies Incorporated (Dassault Systemes SA)
• Original Assignee: Symyx Technologies Incorporated (Dassault Systemes SA)
• Inventors: Bennett, James, Jain, Rakesh, Hajduk, Damian
• Primary Examiner(s): DUNN, DREW A
• Application Number:
  US09/680,154
• Time in Patent Office: 560 Days
• Field of Search: 378/208, 378/79, 378/86
• US Class Current: 378/208
• CPC Class Codes: B01J 19/0046 Sequential or parallel reactions, e.g. for the synthesis of polypeptides or polynucleotides; Apparatus and devices for combinatorial chemistry or for making molecular arrays synthesis methods per se C40B50/00
• CPC Class Codes: B01J 2219/00315 Microtiter plates
• CPC Class Codes: B01J 2219/00511 Walls of reactor vessels
• CPC Class Codes: B01J 2219/00585 Parallel processes
• CPC Class Codes: B01J 2219/00596 Solid-phase processes
• CPC Class Codes: B01J 2219/00659 Two-dimensional arrays
• CPC Class Codes: B01J 2219/00704 integrated with the reactor apparatus
• CPC Class Codes: B01J 2219/00707 separated from the reactor apparatus
• CPC Class Codes: B01J 2219/00745 Inorganic compounds
• CPC Class Codes: C40B 40/18 Libraries containing only inorganic compounds or inorganic materials
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: Y10T 436/25 including sample preparation

Abstract

An apparatus for characterizing a library is provided in which the library contains an array of elements and each element contains a different combination of materials. The apparatus includes an x-ray beam directed at the library, a chamber which houses the library and a beamline for directing the x-ray beam onto the library in the chamber. The chamber may include a translation stage that holds the library and that is programmable to change the position of the library relative to the x-ray beam and a controller that controls the movement of the translation stage to expose an element to the x-ray beam in order to rapidly characterize the element in the library. During the characterization, the x-ray beam scatters off of the element and a detector detects the scattered x-ray beam in order to generate characterization data for the element.

Claims

1. An apparatus for characterizing a library, the library containing an array of members elements, at least a plurality of the members in the array containing a different combination of materials, the apparatus comprising:

an x-ray beam source which directs x-rays towards the library;

a chamber which houses the library;

a beamline for directing the x-ray beam onto the library in the chamber;

the chamber further comprising a translation stage that holds the library and that is programmable to change the position of the library relative to the x-ray beam and a controller that controls the movement of the translation stage to expose an element to the x-ray beam in order to rapidly characterize the member in the library, the x-ray beam scattering off of the member; and

a detector which detects the scattered x-ray beam in order to generate characterization data for the member.

2. The apparatus of claim 1, wherein the translation stage comprises a first positioning mechanism for positioning the library along a first axis and a second positioning mechanism for positioning the library along a second axis.

3. The apparatus of claim 2, wherein the first and second positioning mechanisms comprise a stepper motor.

4. The apparatus of claim 1, wherein the controller further comprises a computer system having a user interface so that each member of the library is independently selectable by the user.

5. The apparatus of claim 1, wherein the detector and the beamline are mounted onto a rotation stage so that the positions of the detector and beamline are adjustable based on the reflective scattering angle of the x-ray beam off of the element in the library.

6. The apparatus of claim 1, wherein the x-ray beam source comprises a rotating anode x-ray generator.

7. The apparatus of claim 1, wherein the x-ray beam source comprises a synchrotron.

8. The apparatus of claim 1, wherein the x-ray beam source comprises a stationary target x-ray generator.

9. The apparatus of claim 1, wherein said plurality of members comprises at least 10 members.

10. The apparatus of claim 1, wherein said plurality of members comprises at least 25 members.

11. The apparatus of claim 1, wherein said plurality of members comprises at least 50 members.

12. The apparatus of claim 1, wherein said plurality of members comprises at least 100 members.

13. A method for characterizing a library, the library containing an array of members, at least a plurality of the members containing a different combination of materials, the method comprising:

directing an x-ray beam generated by an x-ray source towards the library housed within a chamber;

directing the x-ray beam onto the library in the chamber;

moving the library in a predetermined manner to expose a member of the library to the x-ray beam in order to rapidly characterize each member in the library, the x-ray beam scattering off of the member; and

detecting the scattered x-ray beam in order to characterize the member.

14. The method of claim 13, wherein moving the library comprises positioning the library along a first axis and positioning the library along a second axis.

15. The method of claim 13 further comprising selecting, based on user input, one or more members of the library to be characterized and automatically moving the library to expose the one or more selected elements of the library to the x-ray beam in order to characterize the one or more selected elements.

16. The method of claim 13, wherein said plurality of members comprises at least 10 members.

17. The method of claim 13, wherein said plurality of members comprises at least 25 members.

18. The method of claim 13, wherein said plurality of members comprises at least 50 members.

19. The method of claim 13, wherein said plurality of members comprises at least 100 members.

20. An apparatus for characterizing a library, the library containing an array of members, at least a plurality of members containing a different combination of materials, the apparatus comprising:

means for generating an x-ray beam which is directed towards the library;

a chamber which houses the library;

means for directing the x-ray beam onto the library in the chamber;

the chamber further comprising means for holding the library, means for changing the position of the library relative to the x-ray beam to expose a member to the x-ray beam in order to rapidly characterize the member, the x-ray beam scattering off of the member; and

means for detecting the scattered x-ray beam in order to characterize the member.

21. The apparatus of claim 20 wherein the position changing means comprises means for positioning the library along a first axis and means for positioning the library along a second axis.

22. The apparatus of claim 20 wherein the first and second positioning means comprise a stepper motor.

23. The apparatus of claim 20 wherein the positioning changing means comprises means for selecting one or more of the elements of the library to be characterized and means for positioning the library to expose the one or more selected elements to be x-ray beam to characterize the one or more selected elements.

24. The apparatus of claim 20 wherein the detector means and the directing means are mounted onto a rotation stage so that the positions of the detector and beamline are adjustable based on the reflective scattering angle of the x-ray beam off of the element in the library.