Temporary configuration with fall-back

• US 6,374,352 B1
• Filed: 03/18/1999
• Issued: 04/16/2002
• Est. Priority Date: 08/26/1998
• Status: Expired due to Term

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Hansen, Ol Krag, Goldman, Tomasz J.
• Primary Examiner(s): Heckler, Thomas M.
• Application Number:
  US09/271,803
• Time in Patent Office: 1,125 Days
• Field of Search: 713/1, 713/100
• US Class Current: 713/1
• CPC Class Codes: G06F 11/1417 Boot up procedures
• CPC Class Codes: G06F 11/1433 during software upgrading
• CPC Class Codes: G06F 11/2289 by configuration test
• CPC Class Codes: G06F 9/4411 Configuring for operating with peripheral devices; Loading of device drivers

Abstract

Mechanisms initializing a network device having a current configuration, a processor and a configuration storage, and testing a test configuration whereby the current configuration can be reused if the test configuration fails to initialize and operate the network device properly. The mechanisms store the current configuration in the configuration storage, detect a plurality of configuration records associated with the test configuration data, detect the test configuration data, determine whether the test configuration data is to be used during an initialization of the network device and storing the test and current configuration records in non-volatile memory.

Claims

1. A computer implemented device configuration method, comprising:

storing a first sequence of configuration records, each configuration record comprising device configuration data;

storing an escape record, the escape record comprising data designating the first sequence as a test sequence; and

establishing device configuration parameters in accordance with the configuration data in the test sequence.

2. The method of claim 1 wherein establishing device configuration parameters comprises:

altering escape record data to indicate an attempt to configure the device using configuration data in the test sequence; and

setting a device parameter in accordance with configuration data in a first configuration record in the test sequence.

3. The method of claim 2 wherein the escape record is stored in a non-volatile memory, the non-volatile memory comprising a plurality of bit value locations, the bit value locations being independently addressable when changing state between a first state value and a second state value, and the bit value locations being addressable as members of a interdependent plurality of locations when changing state between the second state value and the first state value.

4. The method of claim 3 wherein altering escape record data comprises altering a bit value location between the first state value and the second state value.

5. The method of claim 2 further comprising reinitializing the device, wherein reinitializing the device comprises detecting an escape record designating the first sequence as a test sequence and altering the detected escape record to designate the first sequence as a rejected sequence.

6. The method of claim 2 further comprising:

establishing an operational device configuration;

receiving data indicating whether the operational device configuration is to be accepted or rejected; and

selectively altering escape record data based on the received data to indicate whether the first sequence has been accepted or rejected.

7. The method of claim 6 wherein altering escape record data to indicate that the first sequence has been rejected further comprises storing a record designating the end of the first sequence.

8. A computer program residing on a computer-readable medium comprising instructions for causing a computer to:

store a first sequence of configuration records, each configuration record comprising device configuration data;

store an escape record, the escape record comprising data designating the first sequence as a test sequence; and

establish device configuration parameters in accordance with the configuration data in the test sequence.

9. The computer program of claim 8 wherein the instructions to establish device configuration parameters comprises instructions to:

alter escape record data to indicate an attempt to configure the device using configuration data in the test sequence; and

set a device parameter in accordance with configuration data in a first configuration record in the test sequence.

10. The computer program of claim 8 further comprising instructions to reinitialize the device, wherein the instructions to reinitialize the device comprises instructions to detect an escape record designating the first sequence as a test sequence and instructions to alter the detected escape record to designate the first sequence as a rejected sequence.

11. The computer program of claim 9 further comprising instructions to:

establish an operational device configuration;

receive data indicating whether the operational device configuration is to be accepted or rejected; and

selectively alter escape record data based on the received data to indicate whether the first sequence has been accepted or rejected.

12. The computer program of claim 11 wherein instructions to selectively alter escape record data to indicate that the first sequence has been rejected further comprises instructions to store a record designating the end of the first sequence.

13. A processor-based apparatus comprising:

a processor;

a configurable peripheral device operationally coupled to the processor;

a memory operationally coupled to the processor, the memory storing instructions causing the processor to;

store a first sequence of configuration records in a second memory, each configuration record comprising device configuration data;

store an escape record in the second memory, the escape record comprising data designating the first sequence as a test sequence;

configure the peripheral device in accordance with the configuration data in the test sequence.

14. The apparatus of claim 13 wherein the memory is a hard disk.

15. The apparatus of claim 13 wherein the second memory is flash-memory.