Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time

• US 6,377,901 B1
• Filed: 03/01/1999
• Issued: 04/23/2002
• Est. Priority Date: 03/01/1999
• Status: Expired due to Fees

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Crook, David T., List, Steven K
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): Barbee, Manuel L.
• Application Number:
  US09/259,866
• Publication Number:
  US 20020045997A1
• Time in Patent Office: 1,149 Days
• Field of Search: 702/57-59, 702/64-66, 702/69, 702/79, 702/108, 702/117-119, 702/120-123, 702/125, 702/177, 702/178, 702/183-185, 702/189, 324/500, 324/537, 714/724, 714/733, 714/734, 714/811, 714/815
• US Class Current: 702/119
• CPC Class Codes: G01R 31/3016 Delay or race condition test, e.g. race hazard test
• CPC Class Codes: G01R 31/31937 Timing aspects, e.g. measuring propagation delay G01R31/3191 and G01R31/31922 take precedence; marginal testing G06F11/24

Abstract

An adaptive delay learning algorithm is presented that reduces the amount of delay before making test measurements in an automated test that requires a delay of any type to be completed before a measurement is made in order to remove the possibility that a tester component lying in the measurement path has not achieved a ready state. In the execution of an automated test, a current delay time is set to an initial delay value. Test execution does not begin until the current delay time elapses. If, upon execution, the test fails, the current delay time is set to a different delay time, and the test is reexecuted only after the updated current delay time has elapsed.

Claims

1. A method for adaptively learning systematic delay times of a test configuration circuit, said test configuration circuit operable to execute a test which obtains one or more measurements from a device under test via one or more measurement paths, comprising:

setting a current test configuration setup delay time to an initial delay value;

initiating configuration of said test configuration circuit;

waiting said current test configuration setup delay time;

executing said test; and

if said test fails;

resetting said current test configuration setup delay time to a different delay time;

waiting said current test configuration setup delay time; and

reexecuting said test.

2. A method in accordance with claim 1, wherein:

said different delay time comprises a pre-determined maximum delay time.

3. A method in accordance with claim 1, wherein:

if said reexecuted test passes;

setting said initial delay value to a new delay value.

4. A method in accordance with claim 3, wherein:

said new delay value comprises said current test configuration setup delay time.

5. A method in accordance with claim 3, wherein:

said new delay value comprises a value less than said pre-determined maximum delay time.

6. A method in accordance with claim 1, wherein:

if said reexecuting step results in a fail status;

repeating said resetting step through said reexecuting step until either said test passes or said different delay time comprises a pre-determined maximum delay time.

7. A method in accordance with claim 1, comprising:

periodically performing an audit function in which periodically said initial delay value is selected.

8. A method in accordance with claim 7, wherein:

said initial delay value is selected by;

setting said initial delay value to a maximum relay wait time;

initiating configuration of said test configuration circuit;

waiting an amount of time indicated by said initial delay value;

executing said test;

if said test passes;

resetting said test configuration circuit;

setting said initial delay time to a different delay time, said different delay time being less than said initial delay time;

initiating configuration of said test configuration circuit;

waiting said reset initial delay time;

reexecuting said test; and

repeating said resetting step through said repeating step if said test passes.

9. A method in accordance with claim 7, wherein:

said initial delay value is selected by;

initializing said initial delay value to an initial time;

initiating configuration of said test configuration circuit;

waiting a sample time;

incrementing said initial delay value by said sample time;

executing said test;

determining whether said test passed or failed; and

repeating said waiting a sample time step through said repeating step if said test failed.

10. A method in accordance with claim 1, comprising:

selecting said initial delay value.

11. A method in accordance with claim 10, wherein:

said selecting step comprises;

setting said initial delay value to a maximum relay wait time;

initiating configuration of said test configuration circuit;

waiting an amount of time indicated by said initial delay value;

executing said test;

if said test passes;

resetting said test setup;

setting said initial delay time to a different delay time, said different delay time being less than said initial delay time;

initiating configuration of said test configuration circuit;

waiting said reset initial delay time;

reexecuting said test; and

repeating said resetting step through said repeating step if said test passes.

12. A method in accordance with claim 10, wherein:

said selecting step comprises;

initializing said initial delay value to an initial time;

initiating configuration of said test configuration circuit;

waiting a sample time;

incrementing said initial delay value by said sample time;

executing said test;

determining whether said test passed or failed; and

repeating said waiting a sample time step through said repeating step if said test failed.

13. An automated method for adaptively learning relay wait times of relays in an automated test system performing a test of a component under test, comprising:

configuring said relays;

waiting a current relay wait time;

obtaining measurements of said component under test;

determining whether said test passed or failed based on said obtained measurements;

if said test failed;

waiting a retry relay wait time;

reobtaining said measurements of said component under test; and

redetermining whether said test passed or failed based on said reobtained measurements.

14. A method in accordance with claim 13, wherein:

said retry relay wait time comprises a wait time greater than said current relay wait time.

15. A method in accordance with claim 14, wherein:

if said retry relay wait time comprises a wait time greater than a predetermined maximum relay wait time, said retry relay wait time is set to said predetermined maximum relay wait time.

16. An automated testing system for testing a component under test, comprising:

a test configuration circuit that connects to said component under test;

a test measurement circuit connected to said test configuration circuit which is responsive to a measurement request to obtain measurements from said component under test;

a test process which waits a initial delay time, requests said measurements from said test measurement circuit, receives said obtained measurements, determines whether said component under test passes or fails based on said obtained measurements, and if said test fails;

waits a retry delay time, re-requests said measurements from said test measurement circuit, re-receives said obtained measurements, and re-determines whether said component under test passes or fails based on said re-obtained measurements; and

an adaptive delay learning process which sets said current delay time to an initial delay value, and selects said retry delay time if said component under test fails.

17. A system in accordance with claim 16, wherein:

said retry delay time comprises a pre-determined maximum delay time.

18. A system in accordance with claim 16, wherein:

said adaptive delay learning process comprises an audit function which allows said initial delay value to be periodically reselected.