Four color trilinear CCD scanning
DCFirst Claim
1. A method for scanning an image on a substrate containing defects which uses a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, said method comprising:
- illuminating the image at a first scan time with a first light source functionally free of infrared light;
sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image;
illuminating the image at a second scan time with a second light source containing infrared light;
sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects.
11 Assignments
Litigations
0 Petitions
Accused Products
Abstract
A single pass scanner having a trilinear array, a source of white light, filters of the three primary colors and a separate source of infrared light is used in various methods of removing medium-based defects from a scanned film image. The method generates an infrared channel in addition to the common visible channels by covering the parallel rows of sensors in the trilinear array respectively with a red, green and blue filter to create the three color channels. Normally, each of the three color filters also passes infrared light, which is removed by filters external to the sensors. In a specific embodiment, interstitial in time between two visible light scans, the sensor is exposed to infrared light for a single scan. As the trilinear array sweeps across an image in time and spatial synchronization with the exposing lights, at least two visible channels and an infrared channel are generated.
159 Citations
50 Claims
-
1. A method for scanning an image on a substrate containing defects which uses a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, said method comprising:
-
illuminating the image at a first scan time with a first light source functionally free of infrared light;
sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image;
illuminating the image at a second scan time with a second light source containing infrared light;
sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects. - View Dependent Claims (2, 3, 4)
-
-
5. A method for scanning an image on a substrate containing defects which uses a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, said method comprising:
-
illuminating the image at a first scan time with a first light source functionally free of infrared light;
sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image, wherein the first group and second group of sensors are arranged in first and second parallel rows separated by an offset;
illuminating the image at a second scan time with a second light source containing infrared light;
sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
conducting a first group of individual scans selective to infrared, green, and blue light at a first pixel row site; conducting a second group of individual scans selective to infrared, red, and blue light at a second pixel row site adjacent to the first pixel row site; and
conducting a third group of individual scans selective to infrared, red, and green light at a third pixel row site adjacent to the second pixel row site.
-
-
15. The method of claim 14 wherein a value for green is calculated for a pixel at the second pixel row site.
-
16. The method of claim 14 wherein a value for red is calculated for a pixel at the first pixel row site, a value for green is calculated for a pixel at the second pixel row site, and a value for blue is calculated for a pixel at the third pixel row site.
-
17. The method of claim 15 wherein the calculation for a value of green in the second pixel row site includes the step of averaging the value for green in adjacent pixels in the first and third pixel row sites.
-
18. The method of claim 17 wherein the calculation further comprises calculating the change of red value in adjacent pixels between the first and second pixel row sites.
-
19. The method of claim 17 wherein the calculation further comprises calculating the change of red value in adjacent pixels between the first and second pixel row sites, and the change in blue value in adjacent pixels between the third and second pixel row sites.
-
20. A method for scanning an image on a substrate containing defects which uses a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, said method comprising:
-
illuminating the image at a first scan time with a first light source functionally free of infrared light;
sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image, wherein the first group of sensors is arranged in a two dimensional grid;
illuminating the image at a second scan time with a second light source containing infrared light;
sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects.
-
-
21. A method for scanning an image on a substrate containing defects which uses a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, said method comprising:
-
illuminating the image at a first scan time with a first light source functionally free of infrared light;
sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image, wherein the first color is red, the second color is green, and further comprising a third group of sensors behind a third filter material selective to blue light and infrared light;
illuminating the image at a second scan time with a second light source containing infrared light;
sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects.
-
-
22. A method for scanning an image on a substrate containing defects which uses a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, said method comprising:
-
illuminating the image at a first scan time with a first light source functionally free of infrared light;
sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image;
illuminating the image at a second scan time with a second light source containing infrared light, wherein the second light source also comprises visible light;
sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects. - View Dependent Claims (23, 24, 25)
-
-
26. An apparatus for scanning an image on a substrate containing defects comprising:
-
a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light;
means for illuminating the image at a first scan time with a first light source functionally free of infrared light;
means for sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image;
means for illuminating the image at a second scan time with a second light source containing infrared light;
means for sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
means for generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects. - View Dependent Claims (27, 28, 29)
-
-
30. An apparatus for scanning an image on a substrate containing defects comprising:
-
a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, wherein the first group and second group of sensors are arranged in first and second parallel rows separated by an offset;
means for illuminating the image at a first scan time with a first light source functionally free of infrared light;
means for sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image;
means for illuminating the image at a second scan time with a second light source containing infrared light;
means for sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
means for generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects. - View Dependent Claims (31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44)
-
-
45. An apparatus for scanning an image on a substrate containing defects comprising:
-
a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light, wherein the first color is red, the second color is green, and further comprising a third group of sensors behind a third filter material selective to blue light and infrared light;
means for illuminating the image at a first scan time with a first light source functionally free of infrared light;
means for sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image;
means for illuminating the image at a second scan time with a second light source containing infrared light;
means for sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
means for generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects.
-
-
46. An apparatus for scanning an image on a substrate containing defects comprising:
-
a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light;
means for illuminating the image at a first scan time with a first light source functionally free of infrared light;
means for sensing light of the first color with the first group of sensors to generate a first color image, and light of the second color with the second group of sensors to generate a second color image;
means for illuminating the image at a second scan time with a second light source containing infrared light, wherein the second light source emits visible light;
means for sensing infrared light with at least one of the first or second group of sensors to generate an infrared image; and
means for generating from the first color image, second color image, and infrared image, a corrected color image substantially free of the defects. - View Dependent Claims (47, 48, 49)
-
-
50. An apparatus for scanning an image on a substrate containing defects comprising:
-
a plurality of sensors arranged in groups, wherein a first group is behind a first filter material selective to a first color of light and infrared light, and a second group is behind a second filter material selective to a second different color of light and infrared light;
a first light source configured to illuminate an image at a first scan time with light functionally free of infrared light, wherein the first group of sensors sense the first color of the light to generate a first color image and the second group of sensors sense the second color of the light to generate a second color image;
a second light source configured to illuminate the image at a second scan time with infrared light, wherein at least one of the first or second group of sensors sense the infrared light to generate an infrared image; and
at least one computing device configured to generate a corrected color image from the first color image, the second color image, and the infrared image.
-
Specification