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Self-test electronic assembly and test system

  • US 6,385,739 B1
  • Filed: 07/19/1999
  • Issued: 05/07/2002
  • Est. Priority Date: 07/19/1999
  • Status: Expired due to Term
First Claim
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1. A self-test system, comprising:

  • an electronic circuit comprising a plurality of interconnected components;

    one or more memory storage devices linked to said electronic circuit, at least one of said one or more of said memory storage devices including test logic for testing said electronic circuit;

    a processor within said system and linked to said electronic circuit, said processor adapted to retrieve said test logic for testing said electronic circuit from one or more of said memory storage devices, perform said testing based upon said test logic, and store results of said testing on at least one of said at least one memory storage devices; and

    wherein said processor tracks and logs the identity of said interconnected components that contain identification information and stores said identification information on at least one of said at least one memory storage devices.

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