Self-test electronic assembly and test system
First Claim
1. A self-test system, comprising:
- an electronic circuit comprising a plurality of interconnected components;
one or more memory storage devices linked to said electronic circuit, at least one of said one or more of said memory storage devices including test logic for testing said electronic circuit;
a processor within said system and linked to said electronic circuit, said processor adapted to retrieve said test logic for testing said electronic circuit from one or more of said memory storage devices, perform said testing based upon said test logic, and store results of said testing on at least one of said at least one memory storage devices; and
wherein said processor tracks and logs the identity of said interconnected components that contain identification information and stores said identification information on at least one of said at least one memory storage devices.
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0 Petitions
Accused Products
Abstract
A self-test electronic assembly performs self-testing, such as diagnostic or run-in testing of components and circuits, based upon internally stored test procedures. The results of self-testing are stored internally to the device, providing valuable information regarding the self-test electronic assembly, both during the manufacturing process, and preferably for ongoing in-situ operation. A test system is preferably linked to one or more self-test electronic assemblies, and provides loopback circuitry for each installed self-test electronic assembly, whereby the self-test electronic assemblies can further test components, circuitry, and security encoding and decoding operation. The preferred test rack also provides efficient and consistent monitoring and quality control over the self-testing of self-test electronic assemblies. During in-situ operation, the self-test electronic assemblies preferably monitor operating parameters, and continue to periodically perform self-testing, while storing the information within the device, and preferably transmitting the information to an external location.
155 Citations
37 Claims
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1. A self-test system, comprising:
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an electronic circuit comprising a plurality of interconnected components;
one or more memory storage devices linked to said electronic circuit, at least one of said one or more of said memory storage devices including test logic for testing said electronic circuit;
a processor within said system and linked to said electronic circuit, said processor adapted to retrieve said test logic for testing said electronic circuit from one or more of said memory storage devices, perform said testing based upon said test logic, and store results of said testing on at least one of said at least one memory storage devices; and
wherein said processor tracks and logs the identity of said interconnected components that contain identification information and stores said identification information on at least one of said at least one memory storage devices. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
a loop back circuit for connecting said means for transmitting said output signal to said means for receiving an input signal; and
whereby processor includes means for sending a test signal over said loop back circuit to test said means for transmitting said output signal and said means for receiving an input signal.
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3. The self-test system of claim 2, wherein said output signal and said input signal are audio signals.
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4. The self-test system of claim 2, wherein said output signal and said input signal are video signals.
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5. The self-test system of claim 2, wherein said output signal and said input signal are data signals.
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6. The self-test system of claim 2, wherein said output signal and said input signal are encoded signals.
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7. The self-test system of claim 1, wherein said processor transmits a signal in response to said results of said testing.
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8. The self-test system of claim 1, further comprising:
a connected computer wherein said stored results of said testing are retrievable by said computer.
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9. The self-test system of claim 8, wherein said connected computer is located remotely from said electronic circuit.
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10. The self-test system of claim 8, wherein said connected computer is a test computer.
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11. The self-test system of claim 8, wherein said connected computer is a repair computer.
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12. The self-test system of claim 1, wherein said electronic circuit includes means for monitoring an operating parameter of said assembly, and wherein said processor retrievably stores said monitored operating parameter on at least one of said at least one memory storage devices.
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13. The self-test system of claim 1, wherein at least one of said one or more of said memory storage devices includes security software, and further comprising:
a security microprocessor having internal memory, said security microprocessor including means for receiving said security software, means for placing said security software into said internal memory, means for producing a security key pair comprising a private key and a public key, means for storing said private key in said internal memory, and means for transmitting said public key.
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14. The self-test system of claim 13, wherein said security microprocessor includes means for preventing changes to said internal memory.
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15. An electronic assembly test system, comprising:
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an electronic circuit having a plurality of interconnected components;
a test procedure stored within at least one of said plurality of interconnected components;
means for testing at least one of said plurality of interconnected components based upon said stored test procedure;
test results retrievably stored within at least one of said plurality of interconnected components; and
means for retrievably storing the readable identification information of said interconnected components within at least one of said plurality of interconnected components. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
a loop back circuit for connecting said means for transmitting said output signal to said means for receiving an input signal; and
whereby said means for testing includes means for sending a test signal over said loop back circuit to test said means for transmitting said output signal and said means for receiving an input signal.
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17. The electronic assembly test system of claim 16, wherein said output signal and said input signal are audio signals.
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18. The electronic assembly test system of claim 16, wherein said output signal and said input signal are video signals.
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19. The electronic assembly test system of claim 16, wherein said output signal and said input signal are data signals.
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20. The electronic assembly test system of claim 16, wherein said output signal and said input signal are encoded signals.
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21. The electronic assembly test system of claim 15, wherein said means for testing transmits a signal in response to said results of said testing.
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22. The electronic assembly test system of claim 15, further comprising:
a remote test computer connected to said electronic assembly, wherein said stored results of said testing are retrievable by said remote test computer.
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23. The electronic assembly test system of claim 15, further comprising:
A remote repair computer connected to said electronic assembly, wherein said stored results of said testing are retrievable by said remote repair computer.
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24. The electronic assembly test system of claim 15, wherein said electronic circuit includes means for monitoring an operating parameter of said assembly, and wherein said monitored operating parameter is retrievably stored within at least one of said plurality of interconnected components.
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25. The electronic assembly test system of claim 15, further comprising:
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security software stored within at least one of said plurality of interconnected components; and
a security microprocessor having internal memory, said security microprocessor including means for receiving said security software, means for placing said security software into said internal memory, means for producing a security key pair comprising a private key and a public key, means for storing said private key in said internal memory, and means for transmitting said public key.
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26. The electronic assembly test system of claim 25, wherein said security microprocessor includes means for preventing changes to said internal memory.
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27. A self-test system, comprising:
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a test bay rack having a plurality of test bays, each test bay having a backplane connector, said backplane connector having at least one signal connection, a power connection, and at least one loop back circuit;
at least one self-test electronic assembly installed in one of said plurality of test bays through said backplane connector, said self-test electronic assembly comprising an electronic circuit comprising a plurality of interconnected components, one or more memory storage devices linked to said electronic circuit, at least one of said one or more of said memory storage devices including test logic for testing said electronic circuit, and a processor within said assembly and linked to said electronic circuit, said processor adapted to retrieve said test logic for testing said electronic circuit from one or more of said memory storage devices, perform said testing based upon said test logic, and store results of said testing on at least one of said at least one memory storage devices; and
a computer having a connection to said test bay rack, said computer including means for monitoring said testing for said at least one of said installed self-test electronic assemblies. - View Dependent Claims (28, 29, 30, 31, 32, 33)
at least one test display monitor connected to one of said at least one signal connections of said test rack.
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32. The self-test system of claim 27, wherein each of said at least one self test electronic assembly includes security software stored within at least one of said memory storage devices, and further comprising:
a security microprocessor having internal memory, said security microprocessor including means for receiving said security software, means for placing said security software into said internal memory, means for producing a security key pair comprising a private key and a public key based on said security software, means for storing said private key in said internal memory, and means for transmitting said public key.
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33. The self-test system of claim 32, wherein said security microprocessor includes means for preventing changes to said internal memory.
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34. An electronic assembly system that produces a secure private/public key pair used for strictly controlling access to said system, comprising:
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an electronic circuit comprising a plurality of interconnected components;
one or more memory storage devices linked to said electronic circuit;
wherein at least one of said one or more of said memory storage devices includes security software;
a security microprocessor having internal memory;
software reception means on said security microprocessor for receiving said security software in said internal memory;
key production means for producing a security key pair comprising a private key and a public key;
storing said private key in said internal memory transmitting said public key to an external receiver; and
memory disabling means for disabling changes to said internal memory after said public key is transmitted. - View Dependent Claims (35)
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36. An electronic assembly system that produces a secure private/public key pair used for strictly controlling access to said system, comprising:
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a security microprocessor having internal memory;
software reception means on said security microprocessor for receiving security software in said internal memory;
key production means for producing a security key pair comprising a private key and a public key;
storing said private key in said internal memory;
transmitting said public key to an external receiver;
memory disabling means for disabling changes to said internal memory after said public key is transmitted;
wherein said public key is used to access said system; and
wherein said private key is not distributed outside of said security microprocessor. - View Dependent Claims (37)
an electronic circuit comprising a plurality of interconnected components;
one or more memory storage devices linked to said electronic circuit; and
wherein at least one of said one or more of said memory storage devices includes said security software.
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Specification