×

Embedded mechanism offering real-time self failure detection for an analog to digital converter

  • US 6,396,426 B1
  • Filed: 10/05/1999
  • Issued: 05/28/2002
  • Est. Priority Date: 10/05/1998
  • Status: Expired due to Term
First Claim
Patent Images

1. A method of testing an analog-to-digital converter (ADC) comprising:

  • connecting an input signal having a predetermined voltage range to an input terminal of said ADC;

    connecting, during a first sample period, a reference voltage to said input terminal, said reference voltage being outside of said voltage range;

    disconnecting said reference voltage during a second sample period, said input signal remaining connected to said input terminal;

    converting voltage on said input terminal to a digital value during a conversion period;

    comparing said digital value to a predetermined set of digital values, said predetermined set corresponding to said voltage range; and

    detecting a failure of said ADC if said digital value is outside said predetermined set.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×