Real-time power conservation for electronic device having a processor

• US 6,397,340 B2
• Filed: 01/09/2001
• Issued: 05/28/2002
• Est. Priority Date: 10/30/1989
• Status: Expired due to Fees

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Watts, LaVaughn F. Jr., Wallace, Steven J.
• Primary Examiner(s): AUVE, GLENN ALLEN
• Application Number:
  US09/756,838
• Publication Number:
  US 20010005892A1
• Time in Patent Office: 504 Days
• Field of Search: 713/322,323,320,300,600,601
• US Class Current: 713/322
• CPC Class Codes: G06F 1/206 comprising thermal management
• CPC Class Codes: G06F 1/3203 Power management, i.e. event-based initiation of a power-saving mode
• CPC Class Codes: G06F 1/324 by lowering clock frequency
• CPC Class Codes: Y02D 10/00 Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

A real-time power conservation apparatus and method for portable computers employs a monitor to determine whether a CPU may rest based upon a real-time sampling of the CPU activity level and to activate a hardware selector to carry out the monitor'"'"'s determination. If the monitor determines the CPU may rest, the hardware selector reduces CPU clock time; if the CPU is to be active, the hardware selector returns the CPU to its previous high speed clock level. Switching back into full operation from its rest state occurs without a user having to request it and without any delay in the operation of the computer while waiting for the computer to return to a “ready” state. Furthermore, the monitor adjusts the performance level of the computer to manage power conservation in response to the real-time sampling of CPU activity. Such adjustments are accomplished within the CPU cycles and do not affect the user'"'"'s perception of performance and do not affect any system application software executing on the computer.

Claims

1. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor.

2. The apparatus of claim 1, wherein said monitor is a program installed on said processor.

3. The apparatus of claim 1, wherein said circuitry is external to said processor.

8. The apparatus of claim 1, wherein said monitor is self-tuning.

9. The apparatus of claim 8, wherein said monitor uses a control system of continuous feedback loops.

38. Any one of claims 1, 4-15, 18-21, or 24-37, wherein said processor is a central processing unit (CPU).

4. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor in response to usage of said processor being below a preselected level.

5. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor to reduce the idle time in said CPU.

6. The apparatus of claim 5, wherein said monitor inhibits the modification of said clock signal while said processor is processing critical I/O.

7. The apparatus of claim 5, wherein said processor sends signals to the circuitry requesting the circuitry to demodify the clock signal being sent to the processor in response to said monitor detecting a critical I/O request.

10. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor to minimize the relative amount of idle time in said processor.

11. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor.

12. The apparatus of claim 11, wherein said monitor inhibits the modification of said clock signal while said processor is processing critical I/O.

13. The apparatus of claim 11, wherein said processor sends signals to the circuitry requesting the circuitry to demodify the clock signal being sent to the processor in response to said monitor detecting a critical I/O request.

14. The apparatus of claim 11, wherein said monitor is self-tuning.

15. The apparatus of claim 14, wherein said monitor uses a control system of continuous feedback loops.

16. The apparatus of claim 11, wherein said monitor is a program installed on said processor.

17. The apparatus of claim 11, wherein said circuitry is external to said processor.

18. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor in response to usage of said processor being below a preselected level.

19. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor to control the amount of activity time in said processor.

20. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor to optimize the activity time within said CPU in response to usage of said processor being below a preselected level.

21. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time and activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor.

22. The apparatus of claim 21, wherein said monitor is a program installed on said processor.

23. The apparatus of claim 21, wherein said circuitry is external to said processor.

24. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time and activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor in response to usage of said processor being below a preselected level.

25. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time and activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor to control the amount of idle time and activity time in said CPU.

26. The apparatus of claim 25, wherein said monitor inhibits the modification of said clock signal while said processor is processing critical I/O.

27. The apparatus of claim 25, wherein said processor sends signals to the circuitry requesting the circuitry to demodify the clock signal being sent to the processor in response to said monitor detecting a critical I/O request.

28. The apparatus of claim 25, wherein said monitor is self-tuning.

29. The apparatus of claim 28, wherein said monitor uses a control system of continuous feedback loops.

30. An apparatus, comprising:

a processor having a monitor for measuring the relative amount of idle time and activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor to control the amount of idle time and activity time in said processor in response to a utilization percentage of said processor being below a preselected level.

31. An apparatus, comprising:

a processor having a monitor for measuring the utilization of said processor, results of said measuring being used by said processor for providing a signal for circuitry for selectively modifying a clock signal being sent to said processor to control a utilization percentage of said processor.

32. An apparatus, comprising:

a processor coupled to a clock and having a monitor for measuring the relative amount of idle time and activity time within said processor, results of said measuring being used by said processor for providing a signal for circuitry for controlling periods of time said clock is in an OFF state, the length of said periods of time said clock is in an OFF state being appropriate to allow said processor to operate at an efficient utilization percentage.

33. The apparatus of claim 32, wherein energy consumption in said processor is at a maximum when the length of each period of time said clock is in an OFF state is at zero.

34. The apparatus of claim 32, wherein energy consumption in said processor decreases as the length of each period of time said clock is in an OFF state increases.

35. The apparatus of claim 32, wherein said periods of time said clock is in an OFF state are constantly being adjusted to optimize said utilization percentage of said processor.

36. The apparatus of claim 32, wherein said OFF state represents the minimum clock rate at which said processor can operate.

37. The apparatus of claim 32, wherein said minimum clock rate may be zero for processors that can have their clocks stopped.