Method and apparatus for measuring objects, particularly useful for measuring diamonds

• US 6,397,678 B1
• Filed: 05/04/2001
• Issued: 06/04/2002
• Est. Priority Date: 05/04/2001
• Status: Expired due to Fees

• Current Assignee: Kibbutz Ramat Rachel
• Original Assignee: Kibbutz Ramat Rachel, Shay Popper
• Inventors: Popper, Shay
• Primary Examiner(s): Williams, Hezron
• Assistant Examiner(s): SAINT SURIN, JACQUES M
• Application Number:
  US09/848,302
• Time in Patent Office: 396 Days
• Field of Search: 735/79, 735/80, 734/321, 738/643.1, 73D/IG.1, 736/61, 209/592, 209/593, 209/643, 209/645, 209/919
• US Class Current: 73/580
• CPC Class Codes: B07C 5/3425 of granular material, e.g. ore particles, grain investigation moving fluids or granular solids using optical means G01N21/85
• CPC Class Codes: G01G 3/13 having piezoelectric or piezoresistive properties
• CPC Class Codes: G01N 33/381 precious stones; pearls

Abstract

A method and apparatus for measuring the mass of individual objects, particularly small diamonds, within a predetermined range of sizes, by conveying the objects towards an oscillatable probe having a predetermined mass and a vacuum port of smaller dimensions than those of the objects; applying vacuum to the vacuum port to attract and hold thereto one of the individual objects to thereby add its mass to the mass of the oscillatable probe; measuring the oscillating frequency of the oscillatable probe while the individual object attracted thereto is held by the vacuum applied to the vacuum port, and utilizing the measured oscillating frequency of the probe and the object attracted thereto to compute the mass of the object, before releasing the vacuum to release the object.

Claims

1. A method of measuring the mass of individual objects within a predetermined range of sizes, comprising:

conveying said objects towards an oscillatable probe, having a predetermined mass and a vacuum port of smaller dimensions than those of said objects;

applying vacuum to said vacuum port to attract and hold thereto one of said individual objects to thereby add its mass to the mass of the oscillatable probe;

measuring for a predetermined time interval the oscillating frequency of said oscillatable probe while the individual object attracted thereto is held by the vacuum, applied to said vacuum port;

utilizing the measured oscillating frequency of the probe and said object attracted thereto to compute the mass of said object;

and releasing said vacuum to release said object from said vacuum port preparatory to using said probe to measure the mass of another one of said individual objects.

2. The method according to claim 1, wherein said vacuum port has a mouth of conical configuration of larger dimensions than said objects.

3. The method according to claim 1, wherein said probe includes a piezoelectric device.

4. The method according to claim 3, wherein said piezoelectric device generates an electrical output by the impact of the object against said probe when attracted to said vacuum port thereof, said electrical output being at the oscillating frequency measured and utilized to compute the mass of the individual object.

5. The method according to claim 3, wherein said piezoelectric device is driven at a first frequency, which frequency is changed by the mass of the object when attracted to said vacuum port, said change in frequency being measured and utilized to compute the mass of the individual object attracted to said vacuum port.

6. The method according to claim 1, wherein the oscillating frequency of said probe is measured after a predetermined time delay following the contact of the object with the vacuum port.

7. The method according to claim 6, wherein said predetermined time delay is about 5-20 μ

s.

8. The method according to claim 6, wherein the oscillating frequency of the probe is measured for a time interval of 10-30 μ

s, starting with a delay of 5-20 μ

s following the contact of the object with the vacuum port.

9. The method according to claim 1, wherein said probe overlies said objects such that each object is moved against gravity towards the vacuum port by the vacuum at the vacuum port.

10. The method according to claim 1, wherein said probe underlies said objects such that each object is moved with gravity towards the vacuum port by the vacuum at the vacuum port.

11. The method according to claim 1, wherein said individual objects are diamonds.

12. The method according to claim 11, wherein said diamonds are sorted to different size groups before being fed to said probe, there being one of said probes for each such size group to compute the mass of the diamonds in the respective size group.

13. The method according to claim 11, wherein said diamonds are sorted to different size groups after the mass of each has been computed by said probe and in accordance with the mass computed by the probe.

14. The method according to claim 13, wherein said probe is movably mounted under said conveyed diamonds such that each diamond is moved with gravity towards the vacuum port by the vacuum thereat, said probe being movable with the attracted diamond over a plurality of sorting compartments, the vacuum being released when the diamond held thereby overlies the sorting compartment corresponding to the mass of the measured diamond.

15. The method according to claim 14, wherein there are a plurality of said probes rotatably mounted on a transfer table underlying the conveyed diamonds.

16. Apparatus for measuring the mass of individual objects within a predetermined range of sizes, comprising;

an oscillatable probe having a predetermined mass and a vacuum port of smaller dimensions than those of said objects;

a conveyor for conveying said individual objects towards said probe;

a vacuum source for applying vacuum to said vacuum port of the probe so as to attract and hold thereto one of said individual objects to thereby add its mass to the mass of the probe;

and an electrical measuring system for measuring the oscillating frequency of the probe while the object attracted to its vacuum port is held thereto by the vacuum at the vacuum port, and for utilizing the measured frequency of the probe and object to compute the mass of the object.

17. The apparatus according to claim 16, wherein said vacuum port has a mouth of conical configuration of larger dimensions than said objects.

18. The apparatus according to claim 16, wherein said probe includes a piezoelectric device.

19. The apparatus, according to claim 16, wherein said piezoelectric device generates an electrical output by the impact of the object against said probe when attracted to said vacuum port thereof, said electrical output being the oscillating frequency measured and utilized to compute the mass of the individual object.

20. The apparatus according to claim 18, wherein said piezoelectric device is driven by an AC power supply at a power-supply frequency, which frequency is changed by the mass of the object when attracted to said vacuum port, said change in frequency being measured and utilized to compute the mass of the individual objects attracted to said vacuum port.

21. The apparatus according to claim 18, wherein said probe further includes a metal section formed with said vacuum port, said vacuum port being connected to said vacuum source by a passageway through said metal section and piezoelectric device.

22. The apparatus according to claim 21, wherein said metal section is of cylindrical configuration and has a mass substantially larger than said piezoelectric device.

23. The apparatus according to claim 16, wherein said electrical circuit measures the oscillating frequency, and utilizes said measured oscillating frequency for computing the mass of the object starting with a predetermined time delay after contact of the object with said vacuum port.

24. The apparatus according to claim 16, wherein said probe overlies said conveyor such that said objects are moved against gravity towards the vacuum port by the vacuum at said vacuum port.

25. The apparatus, according to claim 16, wherein the apparatus further includes a deflector movable from a first position to direct each object to the vacuum port of the probe, or to a second position, to direct the object, when released from the vacuum port, back to the conveyor for sorting according to the measured mass of the object.

26. The apparatus according to claim 16, wherein said apparatus includes a plurality of said probes, and said conveyor includes a sorter upstream of said plurality of probes for sorting the objects according to different size groups and for conveying the objects of each size groups to one of said probes.

27. The apparatus according to claim 26, wherein said sorter includes an inclined bar upstream of said plurality of probes for sorting the objects into groups according to their different sizes.

28. The apparatus according to claim 16, wherein said probe underlies said conveyor such that said objects are moved with gravity towards the vacuum port by the vacuum at said vacuum port.

29. The apparatus according to claim 28, wherein said probe is mounted on a movable carriage which is controlled to sort each object according to its mass.

30. The apparatus according to claim 29, wherein said movable carriage is a rotatable transfer table which traverses the inlets to a plurality of sorting compartments, said vacuum source being interrupted to release the vacuum at said vacuum port when the object thereat overlies a sorting compartment corresponding to the computed mass of said object.

31. The apparatus according to claim 30, wherein said rotatable transfer table mounts a plurality of said probes at different locations around the periphery of the transfer table.