Material segregation and density analyzing apparatus and method

• US 6,400,161 B1
• Filed: 05/23/2001
• Issued: 06/04/2002
• Est. Priority Date: 05/23/2001
• Status: Expired due to Fees

• Current Assignee: D.J. Geisel Technology, Inc., Geisel & Associates, Inc.
• Original Assignee: Donald Joseph Geisel
• Inventors: Geisel, Donald Joseph
• Primary Examiner(s): Metjahic, Safet
• Assistant Examiner(s): Hamdan, Wasseem H.
• Application Number:
  US09/864,050
• Time in Patent Office: 377 Days
• Field of Search: 324/644, 340/870.12, 340/573.4, 340/870.03, 340/870.05, 342/22, 342/47
• US Class Current: 324/644
• CPC Class Codes: G01N 22/00 Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more G01N3/00 - G01N17/00, G01N24/00 take precedence
• CPC Class Codes: G01N 23/2251 using incident electron beams, e.g. scanning electron microscopy [SEM]
• CPC Class Codes: G01N 33/42 Road-making materials G01N33/38 takes precedence

Abstract

A material analyzing apparatus comprises an analyzer body that contains a generally insulative material casing; a material analyzing circuitry that includes a transmitter, a receiver, and a control; an antenna system that includes a transmitting antenna, a receiving antenna, and a ground layer; a coupling structure that couples the antenna system to the material analyzing circuitry. The transmitter of the material analyzing circuitry generates a VHF electromagnetic wave signal that is adapted to be sent by the transmitting antenna and directed into the material to be analyzed. The receiving antenna receiving any returned signal from the material and sent to the receiver and to the control. The control then able to analyze the signal for material characteristics. The material characteristics including at least one of density and material segregation. The invention further includes a method for analyzing, as embodied by the invention.

Claims

1. A material analyzing apparatus comprising:

analyzer body, the analyzer body comprising a generally insulative material casing;

wherein the analyzer body further comprising;

material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control,

an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer;

a coupling structure that couples the antenna system to the material analyzing circuitry;

wherein the transmitter of the material analyzing circuitry generates a VHF electromagnetic wave signal, the VHF electromagnetic wave signal being adapted to be sent by the transmitting antenna, being directed into a material to be analyzed, the receiving antenna receiving any returned signal from the material and then sent to the receiver and to the control, the control then able to analyze the signal for material characteristics; and

wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise an antenna system that has a configuration of a 2 conductor transmission line with in-between ground layer, wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by the material surface properties, characteristics, and configurations of the material surface.

2. A material analyzing apparatus according to claim 1, wherein the material characteristics comprise at least one of density and segregation.

3. A material analyzing apparatus according to claim 1, wherein the material analyzing apparatus further comprising an insulating handle, wherein the material analyzing apparatus can be manipulated by the insulating handle to be moved by a user of the material analyzing apparatus to obtain analysis of the material.

4. A material analyzing apparatus according to claim 3, wherein the insulating handle further comprises an actuator, the actuator being connected to the control to actuate analysis by the material analyzing apparatus.

5. A material analyzing apparatus according to claim 1, wherein the material analyzing apparatus generates an electromagnetic wave signal.

6. A material analyzing apparatus according to claim 1, wherein the material analyzing apparatus further comprising a reference feature that allows calibration of the material analyzing apparatus to a reference standard prior to each field measurement, the reference feature comprising circuitry, further wherein an internal reference signal may be stored in a remote memory to which the material analyzing apparatus can communicate.

7. A material analyzing apparatus according to claim 1, further comprising a secondary data transmitter to send signals generated by the material analyzing apparatus.

8. A material analyzing apparatus according to claim 1, further comprising a removable structure that protects the bottom structure of the material analyzing apparatus.

9. A material analyzing apparatus for measuring density of a material, the apparatus comprising:

analyzer body, the analyzer body comprising a generally insulative material casing;

wherein the analyzer body further comprising;

material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control,

an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer;

wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise an antenna system that has a configuration of a 2 conductor transmission line with in-between ground layer, wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by a material surface properties, characteristics, and configurations of the material surface;

a coupling structure that couples the antenna system to the material analyzing circuitry; and

wherein the transmitter of the material analyzing circuitry generates a VHF electromagnetic wave signal, the VHF electromagnetic wave signal being adapted to be sent by the transmitting antenna, being directed into the material to be analyzed, the receiving antenna receiving any returned signal from the material and then sent to the receiver and to the control, the control then able to analyze the signal for material characteristics, the density of the material being linearly related to a returned signal, and the control can determine density D being generally equal to a measured returned voltage V times a constant slope m, plus an offset b, in accordance with;

10. A material analyzing apparatus according to claim 9, wherein the material analyzing apparatus further comprising an insulating handle, wherein the material analyzing apparatus can be manipulated by the insulating handle to be moved by a user of the material analyzing apparatus to obtain analysis of the material.

11. A material analyzing apparatus according to claim 10, wherein the insulating handle further comprises an actuator, the actuator being connected to the control to actuate analysis by the material analyzing apparatus.

12. A material analyzing apparatus according to claim 11, wherein the material analyzing apparatus generates an electromagnetic wave signal.

13. A material analyzing apparatus according to claim 9, wherein the material analyzing apparatus further comprising a reference feature that allows calibration of the material analyzing apparatus to a reference standard prior to each field measurement, the reference feature comprising circuitry.

14. A material analyzing apparatus according to claim 9, further comprising a secondary data transmitter to send signals generated by the material analyzing apparatus.

15. A material analyzing apparatus according to claim 9, further comprising a removable structure that protects the bottom structure of the material analyzing apparatus.

20. A material analyzing apparatus according to claim 15, wherein the material analyzing apparatus generates a electromagnetic wave signal.

16. A material analyzing apparatus for measuring material segregation, the apparatus comprising:

analyzer body, the analyzer body comprising a generally insulative material casing;

wherein the analyzer body further comprising;

material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control,

an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer;

a coupling structure that couples the antenna system to the material analyzing circuitry; and

wherein a material characteristics are analyzed, including at least two material density values in a given surface area, the material segregation or lack of uniformity being determined by differences in density values in the given surface area.

17. A material analyzing apparatus according to claim 16, wherein the material segregation being determined by differences in density values in the given surface area is determined by:

18. A material analyzing apparatus according to claim 16, wherein the material analyzing apparatus further comprising an insulating handle, wherein the material analyzing apparatus can be manipulated by the insulating handle to be moved by a user of the material analyzing apparatus to obtain analysis of the material.

19. A material analyzing apparatus according to claim 18, wherein the insulating handle further comprises an actuator, the actuator being connected to the control to actuate analysis by the material analyzing apparatus.

21. A material analyzing apparatus according to claim 16, further comprising a secondary data transmitter to send signals generated by the material analyzing apparatus.

22. A material analyzing apparatus according to claim 16, further comprising a removable structure that protects the bottom structure of the material analyzing apparatus.

23. A material analyzing apparatus according to claim 16, wherein the material segregation being determined by differences in density values in the given area is determined by:

24. A method for analyzing a material, the method using a structure comprising:

an analyzer body, the analyzer body comprising a generally insulative material casing;

wherein the analyzer body further comprising;

material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control,

an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer;

wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise an antenna system that has a configuration of a 2 conductor transmission line with in-between ground layer, wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by a material surface properties, characteristics, and configurations of the material surface;

coupling the antenna system to the material analyzing circuitry;

generating a VHF electromagnetic wave signal;

transmitting the VHF electromagnetic wave signal by the transmitting antenna;

directing the signal to be analyzed;

receiving any returned signal from the material;

sending the returned signal to the receiver and control; and

analyzing the signal for material characteristics.

25. A method according to claim 24, wherein the step of analyzing the signal for material characteristics comprises analyzing for density and segregation.

26. A method according to claim 24, the method further comprising providing an insulating handle, and manipulating the material analyzing apparatus by the insulating handle to be moved by a user of the material analyzing apparatus to obtain analysis of the material.

27. A method according to claim 26, wherein the insulating handle further comprises an actuator, the method further comprising controlling the control by the actuator for analysis.

28. A method according to claim 26, wherein the method further comprises calibrating to a reference standard prior to each field measurement.

29. A method according to claim 24, wherein the step of analyzing apparatus comprises generating an electromagnetic wave signal and receiving a returned electromagnetic wave signal.

30. A method for analyzing material according to claim 24, further comprising sending signals from a secondary data transmitter.

31. A method for analyzing material according to claim 24, further comprising providing a removable structure for protecting the bottom structure of the material analyzing apparatus.

32. A method for analyzing a material for measuring density of a material, the method using a structure comprising:

an analyzer body, the analyzer body comprising a generally insulative material casing;

wherein the analyzer body further comprising;

material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control,

an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer;

wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise an antenna system that has a configuration of a 2 conductor transmission line with in-between ground layer, wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by a material surface properties, characteristics, and configurations of the material surface;

coupling the antenna system to the material analyzing circuitry;

generating a VHF electromagnetic wave signal;

transmitting the VHF electromagnetic wave signal by the transmitting antenna;

directing the signal to be analyzed;

receiving any returned signal from the material;

sending the returned signal to the receiver and control; and

analyzing the signal for material density characteristics;

the density of the material being linearly related to a returned signal, and determining density D being generally equal to a measured returned voltage V times a constant slope m, plus an offset b, in accordance with;

33. A method according to claim 32, the method further comprising providing an insulating handle, and manipulating the material analyzing apparatus by the insulating handle to be moved by a user of the material analyzing apparatus to obtain analysis of the material.

34. A method according to claim 33, wherein the insulating handle further comprises an actuator, the method further comprising controlling the control by the actuator for analysis.

35. A method according to claim 32, wherein the step of analyzing apparatus comprises generating an electromagnetic wave signal and receiving a returned electromagnetic wave signal.

36. A method for analyzing material according to claim 32, further comprising sending signals from a secondary data transmitter.

37. A method for analyzing material according to claim 32, further comprising providing a removable structure for protecting the bottom structure of the material analyzing apparatus.

40. A method according to claim 36, the method further comprising providing an insulating handle, and manipulating the material analyzing apparatus by the insulating handle to be moved by a user of the material analyzing apparatus to obtain analysis of the material.

41. A method according to claim 40, wherein the insulating handle further comprises an actuator, the method further comprising controlling the control by the actuator for analysis.

42. A method according to claim 36, wherein the step of analyzing apparatus comprises generating an electromagnetic wave signal and receiving a returned electromagnetic wave signal.

38. A method for analyzing a material for measuring segregation of a material, the method using a structure comprising:

analyzer body, the analyzer body comprising a generally insulative material casing;

wherein the analyzer body further comprising;

material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control,

an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer;

coupling the antenna system to the material analyzing circuitry;

wherein a material characteristics are analyzed, including at least two material density values in a given surface area, the material segregation or lack of uniformity being determined by differences in density values in the given surface area.

39. A material analyzing method according to claim 38, wherein the material segregation being determined by differences in density values in the given surface area is determined by:

43. A material analyzing method according to claim 38, wherein the material segregation being determined by differences in density values in the given area is determined by: