Method of statistical analysis in an intelligent electronic device

• US 6,401,054 B1
• Filed: 12/28/1998
• Issued: 06/04/2002
• Est. Priority Date: 12/28/1998
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Andersen, Bo L.
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): Barbee, Manuel L.
• Application Number:
  US09/221,243
• Time in Patent Office: 1,254 Days
• Field of Search: 702/57, 702/58, 702/59-62, 702/64-66, 702/72, 702/81-89, 702/130, 702/182-185, 702/179, 702/188, 702/189, 361/71, 361/115, 324/74, 324/601, 340/657, 340/658, 340/661
• US Class Current: 702/179
• CPC Class Codes: G06F 8/65 Updates security arrangements therefor G06F21/57
• CPC Class Codes: H02H 3/006 Calibration or setting of parameters

Abstract

A method of statistical analysis in an intelligent electronic device for data reduction and analysis is presented. The intelligent electronic device includes a microcontrol and associated memories. An algorithm (program) stored in memory of the intelligent electronic device processes real time data on measured and/or calculated electrical parameters using recognized statistical and/or numerical techniques. The algorithm will issue events and/or alarms when observed data is recognized to deviate in statistically significant amounts from statistical values. Allowing only valuable user information, as opposed to “raw” unprocessed and potentially insignificant data, to be sent across a limited capacity network for potential user intervention. Thereby saving network capacity and ensuring that a user is automatically notified of significant events requiring further analysis and/or intervention.

Claims

1. A method of detecting developing fault conditions using statistical analysis in an intelligent electronic device and reducing quantities of data required to be transmitted from the intelligent electronic device to a central monitoring station, the method comprising:

sensing an electrical signal to provide a plurality of sensed signals indicative of a plurality of values of a parameter of said electrical signal;

determining a statistical value for said parameter from at least two of said sensed signals;

comparing one of said sensed signals to said statistical value to generate a deviation event signal when said value of said one of said sensed signals deviates from said statistical value by a statistically significant amount;

communicating the deviation event signal to a central monitoring station prior to occurrence of a fault condition within the intelligent electronic device; and

,

limiting transmission of all other sensed signals from the intelligent electronic device to the central monitoring station.

2. The method of claim 1 wherein said statistical value comprises a mean value;

and

said determining said statistical value comprises calculating said mean value from the following expression, $M=\frac{1}{n}<br><br>\underset{i=1}{\overset{n}{\sum <br><br>}}<br><br>\text{\hspace{1em}<br><br>}<br><br>X_i,$

where,

M is said mean value,

n is a number of said at least two said sensed signals, and

X_i is said value of each of said at least two said sensed signals.

3. The method of claim 2 further comprising:

determining said statistically significant amount from said mean value, said determining said statistically significant amount includes calculating a plurality of variance values from the following expression,

4. The method of claim 3 where in said determining said statistically significant amount further includes:

calculating a standard deviation value from the following expression, $S=\sqrt{\frac{1}{\left(n-1\right)}<br><br>\underset{i=1}{\overset{n}{\sum <br><br>}}<br><br>\text{\hspace{1em}<br><br>}<br><br>D_i},$

 

where S is said standard deviation value.

5. The method of claim 4 wherein said statistically significant amount comprises a designated number of said standard deviation values.

6. The method of claim 3 further comprising:

storing said plurality of sensed signals in a first memory of said intelligent electronic device.

7. The method of claim 6 further comprising storing said plurality of variance values in a second memory of said intelligent electronic device.

8. The method of claim 7 wherein said first memory further comprises a first set of cyclical buffers.

9. The method of claim 8 wherein said second memory further comprises a second set of cyclical buffers.

10. The method of claim 1 wherein said determining said statistical value comprises statistical sampling.

11. The method of claim 1 further comprising:

storing said plurality of sensed signals in a first memory of said intelligent electronic device.

12. The method of claim 11 wherein said first memory further comprises a first set of cyclical buffers.

13. The method of claim 1 wherein said parameter comprises a measured parameter or a calculated parameter.

14. The method of claim 13 wherein said measured parameter further comprises temperature, current, voltage or frequency.

15. The method of claim 13 wherein said calculated parameter further comprises energy, differential temperature, repair status, per phase voltage or per phase current.

16. The method of claim 1 further comprising designating a user selectable number of standard deviation values for said statistically significant amount.

17. The method of claim 16 further comprising storing the user selectable number within an EEPROM.

18. An intelligent electronic device comprising:

a sensor for sensing an electrical signal to provide a plurality of sensed signals indicative of a plurality of values of a parameter of said electrical signal; and

a signal processor responsive to said plurality of sensed signals, and having memory for storing signals including program signals for detecting developing fault conditions using statistical analysis and reducing quantities of data required to be transmitted from the intelligent electronic device, the program signals defining an executable program for,

determining a statistical value for said parameter from at least two of said sensed signals;

comparing one of said sensed signals to said statistical value to generate a deviation event signal when said value of said one of said sensed signals deviates from said statistical value by a statistically significant amount;

releasing the deviation event signal prior to occurrence of a fault condition within the intelligent electronic device; and

,

limiting transmission of all other sensed signals from the intelligent electronic device.

19. The intelligent electronic device of claim 18 wherein:

said statistical value comprises a mean value; and

said determining said statistical value comprises calculating said mean value from the following expression, $M=\frac{1}{n}<br><br>\underset{i=1}{\overset{n}{\sum <br><br>}}<br><br>\text{\hspace{1em}<br><br>}<br><br>X_i,$

where,

M is said mean value,

n is a number of said at least two said sensed signals, and

X_i is said value of each of said at least two said sensed signals.

20. The intelligent electronic device of claim 19 wherein:

said program signals further define said executable algorithm for determining said statistically significant amount from said mean value, wherein said determining said statistically significant amount includes calculating a plurality of variance values from the following expression,

21. The intelligent electronic device of claim 20 wherein:

said determining said statistically significant amount further includes calculating a standard deviation value from the following expression, $S=\sqrt{\frac{1}{\left(n-1\right)}<br><br>\underset{i=1}{\overset{n}{\sum <br><br>}}<br><br>\text{\hspace{1em}<br><br>}<br><br>D_i},$

 

where S is said standard deviation value.

22. The intelligent electronic device of claim 21 wherein said statistically significant amount comprises a designated number of said standard deviation values.

23. The intelligent electronic device of claim 20 wherein:

said program signals further define said executable algorithm for storing said plurality of sensed signals in a first memory of said intelligent electronic device.

24. The intelligent electronic device of claim 23 wherein said program signals further define said executable algorithm for storing said plurality of variance values in a second memory of said intelligent electronic device.

25. The intelligent electronic device of claim 24 wherein said first memory further comprises a first set of cyclical buffers.

26. The intelligent electronic device of claim 25 wherein said second memory further comprises a second set of cyclical buffers.

27. The intelligent electronic device of claim 18 wherein said determining said statistical value comprises statistical sampling.

28. The intelligent electronic device of claim 18 wherein:

said program signals further define said executable algorithm for storing said plurality of sensed signals in a first memory of said intelligent electronic device.

29. The intelligent electronic device of claim 28 wherein said first memory further comprises a first set of cyclical buffers.

30. The intelligent electronic device of claim 18 wherein said parameter comprises a measured parameter or a calculated parameter.

31. The intelligent electronic device of claim 30 wherein said measured parameter further comprises temperature, current, voltage or frequency.

32. The intelligent electronic device of claim 30 wherein said calculated parameter further comprises energy, differential temperature, repair status, per phase voltage or per phase current.

33. The intelligent electronic device of claim 18 further comprising:

a communication port for communicating said deviation event signal to a central monitoring station.

34. A network communication system comprising a central monitoring station and at least one intelligent electronic device, each of said at least one intelligent electronic device comprising:

a sensor for sensing an electrical signal to provide a plurality of sensed signals indicative of a plurality of values of a parameter of said electrical signal; and

a signal processor responsive to said plurality of sensed signals, and having memory for storing signals including program signals for detecting developing fault conditions using statistical analysis and reducing quantities of data required to be transmitted from the intelligent electronic device to the central monitoring station, the program signals defining an executable program for,

determining a statistical value for said parameter from at least two of said sensed signals;

comparing one of said sensed signals to said statistical value to generate a deviation event signal when said value of said one of said sensed signals deviates from said statistical value by a statistically significant amount;

sending the deviation event signal from the intelligent electronic device to the central monitoring station prior to occurrence of a fault condition within the intelligent electronic device; and

,

limiting transmission of all other signals from the intelligent electronic device to the central monitoring station.

35. The network communication system of claim 34 comprising a plurality of intelligent electronic devices.

36. The network communication system of claim 35 wherein each of said intelligent electronic devices communicates with said central monitoring station over a network.