Variable spacing probe tip adapter for a measurement probe

• US 6,404,215 B1
• Filed: 11/16/2000
• Issued: 06/11/2002
• Est. Priority Date: 08/21/2000
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Nightingale, Mark W., Law, William Q., Price, R. Kenneth
• Primary Examiner(s): Sherry, Michael J.
• Assistant Examiner(s): TANG, MINH NHUT
• Application Number:
  US09/715,375
• Time in Patent Office: 572 Days
• Field of Search: 324/72.5, 324/149, 324/754, 324/758, 439/169, 439/174, 439/482, 439/912
• US Class Current: 324/756.04
• CPC Class Codes: G01R 1/07364 with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Abstract

A variable spacing probe tip adapter for a differential measurement probe has a measurement probe head with first and second probe tips extending from the probe head. Ribs and grooves formed in the probe head that extend radially from around each of the probe tips. Each of first and second first probing tips have an electrically conductive shaft that has a bore formed in one end for engaging the probe tips of the measurement probe. Each shaft has ribs and grooves formed therein that extend radially from the bore for engaging the corresponding grooves and ribs in the probe head. The other end of the conductive shaft tapers to a probing point with and a portion of the shaft toward the tapered end of the shaft being angled such that the probing tips. The conductive shafts are rotatable on measurement probe tips and locked into position by the engagement of the ribs and grooves in the probe head and the probing tips.

Claims

1. A variable spacing probe tip adapter for a differential measurement probe comprising:

a measurement probe head having first and second probe tips extending therefrom with the probe head having ribs and grooves formed in the probe head that extend radially from each of the probe tips; and

first and second offset probing tips with each probing tip having an electrically conductive shaft with the shaft having a bore formed in one end thereof for engaging the probe tips of the measurement probe head and the other end of the shaft tapering to a probing point with a portion of the shaft toward the tapered end of the shaft being offset, the shaft having a surface normal to the bore with ribs and grooves formed therein that extend radially from the bore that nest in the corresponding grooves and ribs in the probe head such that the offset probing tips are rotatable on the measurement probe tips and locked into position by the engagement of the ribs and grooves in the probe head and the probing tips.

2. The variable spacing probe tip adapter as recited in claim 1 wherein the grooves and ribs are formed around the respective probing tips and the probe tips of the measurement probe head to provide selected probing point separation.

3. The variable spacing probe tip adapter as recited in claim 2 wherein the probing point separation is 0.025 inches, 0.050 inches, and 0.010 inches.

4. The variable spacing probe tip adapter as recited in claim 1 further comprising a probing tip holder having first and second bores formed therein for receiving the first and second probing tips.