Method and apparatus for power electronics health monitoring

• US 6,405,154 B1
• Filed: 12/29/1999
• Issued: 06/11/2002
• Est. Priority Date: 12/29/1999
• Status: Expired due to Term

• Current Assignee: GE Global Sourcing LLC (Westinghouse Air Brake Technologies Corporation)
• Original Assignee: General Electric Company
• Inventors: Ryan, Michael John
• Primary Examiner(s): SHAH, KAMINI S
• Application Number:
  US09/473,663
• Time in Patent Office: 895 Days
• Field of Search: 702/183, 702/185, 361/25, 361/78, 361/203, 735/70, 735/79, 736/60, 376/215, 376/216, 327/374, 327/339, 327/488
• US Class Current: 702/183
• CPC Class Codes: G01R 31/2601 Apparatus or methods therefor G01R31/2607, G01R31/2642 take precedence

Abstract

A method for monitoring the health of power electronics includes: providing a switch command to a power electronic device (12) through a gate driver (14); measuring a switching time of the power electronic device; and using the switching time to determine a diagnostic condition of the power electronic device and/or the gate driver.

Claims

1. A method for monitoring the health of power electronics comprising:

providing at least one switch command to at least one power electronic device through at least one gate driver;

measuring at least one switching time of the at least one power electronic device; and

using the at least one switching time to determine at least one diagnostic condition of the at least one power electronic device or the at least one gate driver.

2. The method of claim 1 wherein measuring the at least one switching time comprises measuring at least two switching times with one of the at least two switching times comprising a turn-on time and the other of the at least two switching times comprising a turn-off time.

3. The method of claim 2 further including storing each of the turn-on and turn-off times.

4. The method of claim 3 wherein using the at least one switching time to determine the at least one diagnostic condition includes trending the turn-on and turn-off times.

5. The method of claim 4 wherein storing each of the turn-on and turn-off times and trending the turn-on and turn-off times occur at a location remote from the power electronics.

6. The method of claim 3 further including, prior to storing each of the turn-on and turn-off times, normalizing each of the turn-on and turn-off times.

7. The method of claim 6 wherein normalizing includes using at least one of the parameters of current in the power electronic device, ambient temperature, and bus voltage in the power electronics.

8. The method of claim 1 wherein the at least one power electronic device comprises each power electronic device in the power electronics.

9. The method of claim 1 wherein using the at least one switching time to determine the at least one diagnostic condition further includes gauging degradation in the at least one power electronic device or the at least one gate driver.

10. The method of claim 9 wherein using the at least one switching time to determine the at least one diagnostic condition further includes predicting a failure in the at least one power electronic device or the at least one gate driver.

11. A method for monitoring the health of power electronics comprising:

providing at least one switch command to at least one power electronic device through at least one gate driver;

measuring at least one switching time of the at least one power electronic device; and

using the at least one switching time to predict a failure in the at least one power electronic device or the at least one gate driver.

12. A power electronics health monitoring system comprising a control system for providing at least one switch command to at least one power electronic device through at least one gate driver;

measuring at least one switching time of the at least one power electronic device; and

using the at least one switching time to determine at least one diagnostic condition of the at least one power electronic device or the at least one gate driver.

13. The system of claim 12 wherein the control system includes a remote data collector for using the at least one switching time to monitor the at least one diagnostic condition.

14. The system of claim 12 wherein the control system normalizes the at least one switching time prior to using the at least one switching time to monitor the at least one diagnostic condition.

15. The system of claim 12 wherein the at least one power electronic device comprises each power electronic device in the power electronics.

16. A power electronics health monitoring system comprising:

means for providing at least one switch command to at least one power electronic device through at least one gate driver;

means for measuring at least one switching time of the at least one power electronic device; and

means for using the at least one switching time to monitor at least one diagnostic condition of the at least one power electronic device or the at least one gate driver.

17. The system of claim 16 wherein the means for measuring the at least one switching time comprises measuring at least two switching times with one of the at least two switching times comprising a turn-on time and the other of the at least two switching times comprising a turn-off time.

18. The system of claim 17 wherein the means for using the at least one switching time to monitor the at least one diagnostic condition of the at least one power electronic device or the at least one gate driver includes means for storing each of the turn-on and turn-off times.

19. The system of claim 18 wherein the means for using the at least one switching time to monitor the diagnostic condition includes means for trending the turn-on and turn-off times.

20. The system of claim 16 wherein the means for using the at least one switching time to monitor the diagnostic condition further gauges degradation in the at least one power electronic device or the at least one gate driver.

21. The system of claim 20 wherein the means for using the at least one switching time to monitor the at least one diagnostic condition further predicts a failure in the at least one power electronic device or the at least one gate driver.