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Method for measuring temperature with an integrated circuit device

  • US 6,412,977 B1
  • Filed: 08/18/2000
  • Issued: 07/02/2002
  • Est. Priority Date: 04/14/1998
  • Status: Expired due to Fees
First Claim
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1. A method of measuring temperature utilizing an integrated circuit (IC) chip, the method comprising:

  • flowing a current through a resistor (Rext), the resistance value of which is substantially independent of temperature, said current being a function of an absolute temperature of a transistor (Q1) resident on the IC chip, said transistor being of a type which exhibits a predictable change in its base-emitter voltage over a temperature range;

    mirroring the current flowing through the resistor to a circuit on the IC chip, said circuit providing an output signal which is proportional to the current flowing through the resistor, thereby making the output signal temperature-dependent as a function of the absolute temperature of the transistor;

    including at least one internal capacitor in the circuit and an external capacitor outside the circuit; and

    selectively switching the external capacitor across the at least one internal capacitor to alter a characteristic of the output signal.

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