Barrier and electroplating seed layer

• US 6,413,858 B1
• Filed: 08/27/1999
• Issued: 07/02/2002
• Est. Priority Date: 08/27/1999
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Chopra, Dinesh
• Primary Examiner(s): Whitehead, Jr., Carl
• Assistant Examiner(s): BROPHY, JAMIE LYNN
• Application Number:
  US09/384,347
• Time in Patent Office: 1,040 Days
• Field of Search: 438/618, 438/622, 438/625, 438/627, 438/629, 438/637, 438/642, 438/643, 438/648, 438/678, 438/687, 438/907, 438/935
• US Class Current: 438/643
• CPC Class Codes: H01L 21/2885 using an external electrical current, i.e. electro-deposition
• CPC Class Codes: H01L 21/76846 Layer combinations
• CPC Class Codes: H01L 21/76873 for electroplating
• CPC Class Codes: H01L 23/53238 Additional layers associated with copper layers, e.g. adhesion, barrier, cladding layers
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

A barrier layer material and method of forming the same is disclosed. The method includes depositing a graded metal nitride layer in a single deposition chamber, with a high nitrogen content at a lower surface and a high metal content at an upper surface. In the illustrated embodiment, a metal nitride with a 1:1 nitrogen-to-metal ratio is initially deposited into a deep void, such as a via or trench, by reactive sputtering of a metal target in nitrogen atmosphere. After an initial thickness is deposited, flow of nitrogen source gas is reduced and sputtering continues, producing a metal nitride with a graded nitrogen content. After the nitrogen is stopped, deposition continues, resulting in a substantially pure metal top layer. This three-stage layer includes a highly conductive top layer, upon which copper can be directly electroplated without a separate seed layer deposition. Advantageously, native oxide on the top metal surface can be cleaned in situ by reversing polarity in the electroplating solution just prior to plating.

Claims

1. A method of forming a conductive structure in an opening in a partially fabricated integrated circuit, comprising:

initially sputtering a metal target in the presence of an amount of nitrogen source gas, thereby forming a metal nitride layer in the opening;

reducing a flow rate of the nitrogen source gas linearly with time;

further sputtering the metal target after reducing the amount of nitrogen source gas to form a substantially metal layer over the metal nitride layer in the opening, the metal layer having a top surface; and

electroplating a second metal onto the top surface of the metal layer.

2. The method of claim 1, wherein initially sputtering is at least partially conducted while reducing the amount of nitrogen source gas.

3. The method of claim 2, wherein initially sputtering is partially conducted prior to reducing the amount of nitrogen source gas.

4. The method of claim 1, further comprising reducing a native oxide from the top surface of the metal layer prior to electroplating the second metal.

5. The method of claim 4, wherein reducing the native oxide comprises electrochemically reducing in a solution prior to electroplating the second metal in the solution.

6. The method of claim 4, wherein reducing the native oxide comprises dipping the native oxide in a hydrofluoric acid solution.

7. The method of claim 1, wherein the metal nitride comprises tungsten nitride and the second metal comprises copper.

8. The method of claim 1, wherein the nitrogen source gas comprises nitrogen gas.

9. The method of claim 1, wherein the opening comprises a contact via through an oxide layer.

10. The method of claim 1, wherein the opening comprises a wiring trench in an insulating layer.

11. A method of forming a wiring element with a barrier/seed layer in an integrated circuit, comprising:

depositing an initial metal nitride layer having a first nitrogen content into an opening in an interlevel dielectric of a substrate assembly, the opening comprising sidewalls and a floor;

depositing a second metal nitride layer directly onto the initial metal nitride layer, the second metal nitride having a second nitrogen content lower than the first nitrogen content;

depositing a substantially metal seed layer directly onto the second metal nitride layer, wherein depositing the initial metal nitride layer, the second metal nitride layer and the metal seed layer are all conducted in situ without removing the substrate assembly from a deposition chamber;

electroplating copper directly onto the substantially metal seed layer; and

precleaning the metal seed layer prior to electroplating, wherein precleaning comprises immersing the substrate assembly in a solution and applying a potential.

12. The method of claim 11, wherein depositing the initial metal nitride layer comprises sputtering a refractory metal or refractory metal silicide in a nitrogen-bearing environment.

13. The method of claim 12, wherein the nitrogen-bearing environment comprises N₂ gas.

14. The method of claim 12, wherein depositing the metal seed layer comprises sputtering a metal target.

15. The method of claim 14, wherein depositing the initial metal nitride layer, the second metal nitride layer and the metal seed layer comprises sputtering the same metal target.

16. The method of claim 11, wherein the solution comprises copper ions and electroplating is conducted with a reversed polarity in the same solution.

17. The method of claim 16, wherein the solution further comprises organic additives.

18. The method of claim 11, wherein electroplating comprises filling the opening with copper.

19. The method of claim 11, wherein the opening comprises a contact via through the interlevel dielectric.

20. The method of claim 19, wherein the via extends downwardly from the floor of a trench.

21. The method of claim 11, wherein the first nitrogen content is a ratio of nitrogen to metal of at least about 1:

2 in the initial metal nitride layer.