Uneven-pattern reading apparatus
First Claim
1. An uneven-pattern reading apparatus comprising:
- a detecting prism having a detecting surface on which an uneven pattern is placed, an incident surface upon which an incident light beam for illuminating the uneven pattern is incident, and an-emergent surface from which a light beam reflected from the uneven pattern on the detecting surface is emergent, angles between the respective incident, detecting, and emergent surfaces providing that the incident light beam is applied to the uneven pattern and the light reflected from the detecting surface is emergent from the emergent surface;
incident-light-beam converging means for collimating or converging the incident light beam from a light source before incidence on the incident surface;
an imaging device for detecting a reflected image emergent from said detecting prism;
a converging optical system for converging the emergent light beam emergent from the emergent surface upon an imaging surface of said imaging device after collimating or converging the emergent light; and
a processing device for identifying the uneven pattern on the basis of the image detected by said imaging device, wherein the imaging surface of said imaging device is located closer to an emergent surface side than a focusing position of said converging optical system.
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Abstract
An uneven-pattern reading apparatus includes a detecting prism having a detecting surface on which an uneven pattern is placed, an incident surface upon which an incident light beam for illuminating the uneven pattern is incident, and an emergent surface from which a light beam reflected from the uneven pattern on the detecting surface is emergent, angles between the respective detecting, incident, and emergent surfaces providing that the incident light beam is applied to the uneven pattern and the light reflected from the detecting surface is emergent from the emergent surface; an incident-light-beam converger for causing an incident light beam from a light source to be incident upon the incident surface after collimating or converging the incident light beam; an imaging device for detecting a reflected image emergent from the detecting prism; a converging optical system for collimating or converging the emergent light beam emergent from the emergent surface; and a processing device for identifying the uneven pattern on the basis of the image picked up by the imaging device, wherein an imaging surface of the imaging device is located closer to an emergent surface side than a focusing position of the converging optical system.
40 Citations
7 Claims
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1. An uneven-pattern reading apparatus comprising:
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a detecting prism having a detecting surface on which an uneven pattern is placed, an incident surface upon which an incident light beam for illuminating the uneven pattern is incident, and an-emergent surface from which a light beam reflected from the uneven pattern on the detecting surface is emergent, angles between the respective incident, detecting, and emergent surfaces providing that the incident light beam is applied to the uneven pattern and the light reflected from the detecting surface is emergent from the emergent surface;
incident-light-beam converging means for collimating or converging the incident light beam from a light source before incidence on the incident surface;
an imaging device for detecting a reflected image emergent from said detecting prism;
a converging optical system for converging the emergent light beam emergent from the emergent surface upon an imaging surface of said imaging device after collimating or converging the emergent light; and
a processing device for identifying the uneven pattern on the basis of the image detected by said imaging device, wherein the imaging surface of said imaging device is located closer to an emergent surface side than a focusing position of said converging optical system. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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Specification
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- Resources
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Current AssigneeMitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
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Original AssigneeMitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
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InventorsKawano, Hiroyuki, Sato, Yukio, Okamoto, Tatsuki, Nishimae, Junichi
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Primary Examiner(s)Font, Frank G.
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Assistant Examiner(s)LAUCHMAN, LAYLA G
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Application NumberUS09/459,925Time in Patent Office931 DaysField of Search356/71, 382/124-127US Class Current356/71CPC Class CodesG06V 40/1324 by using geometrical optics...
