Method and apparatus for power throttling in a microprocessor using a closed loop feedback system

• US 6,415,388 B1
• Filed: 10/30/1998
• Issued: 07/02/2002
• Est. Priority Date: 10/30/1998
• Status: Expired due to Term

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Browning, Chris S., Dermer, Gregory E., Borkar, Shekhar Y.
• Primary Examiner(s): Myers, Paul R.
• Application Number:
  US09/183,255
• Time in Patent Office: 1,341 Days
• Field of Search: 713/300, 713/340, 702/132
• US Class Current: 713/322
• CPC Class Codes: G06F 1/206 comprising thermal management
• CPC Class Codes: G06F 1/26 Power supply means, e.g. regulation thereof for memories G11C
• CPC Class Codes: G06F 1/3203 Power management, i.e. event-based initiation of a power-saving mode
• CPC Class Codes: G06F 1/3228 Monitoring task completion, e.g. by use of idle timers, stop commands or wait commands
• CPC Class Codes: G06F 1/324 by lowering clock frequency
• CPC Class Codes: G06F 1/3296 by lowering the supply or operating voltage
• CPC Class Codes: Y02D 10/00 Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

A method and apparatus for power throttling in a microprocessor. A voltage source supplies voltage to the microprocessor, and a clock source operates the microprocessor at a desired frequency. In one embodiment, a power monitor is configured to measure the short term power consumption of the microprocessor. In another embodiment, a temperature sensor measures the temperature of the microprocessor. Control logic is coupled to the voltage source and the clock source. The control logic receives an indication of the power consumption or temperature, as applicable, and compares it to a predetermined value. In response to the comparison, the control logic varies the supply voltage and the frequency.

Claims

1. A method comprising:

applying a supply voltage and a clock to a microprocessor;

monitoring power consumption of the microprocessor;

determining whether the monitored power consumption is within a predetermined range of values; and

varying the supply voltage and frequency of the clock in response to the determination, wherein the varying comprises reducing the supply voltage and the frequency of the clock in response to the monitored power consumption being above the predetermined range of values and increasing the supply voltage and the frequency of the clock in response to the monitored power consumption being below the predetermined range of values.

2. The method of claim 1, wherein the monitoring comprises monitoring short term power consumption of the microprocessor.

3. The method of claim 1, wherein the monitoring comprises monitoring a voltage across a resistance.

4. The method of claim 1, wherein the determining comprises determining whether the monitored power consumption is approaching or exceeds an upper limit;

and

wherein the varying comprises reducing the supply voltage and the frequency of the clock in response to the monitored power consumption approaching or exceeding the upper limit.

5. The method of claim 1, wherein the determining comprises determining whether the monitored power consumption is approaching or exceeds a lower limit;

and

wherein the varying comprises increasing the supply voltage and the frequency of the clock in response to the monitored power consumption approaching or exceeding the lower limit.

6. An apparatus comprising:

a voltage source to apply a supply voltage to a microprocessor;

a clock source to apply a clock to the microprocessor;

a power monitor to monitor power consumption of the microprocessor; and

control logic to determine whether the monitored power consumption is within a predetermined range of values, to reduce the supply voltage and the frequency of the clock in response to the monitored power consumption being above the predetermined range of values, and to increase the supply voltage and the frequency of the clock in response to the monitored power consumption being below the predetermined range of values.

7. The apparatus of claim 6, the power monitor to monitor short term power consumption of the microprocessor.

8. The apparatus of claim 6, the power monitor to monitor a voltage across a resistance between the voltage source and the microprocessor.

9. The apparatus of claim 6, the control logic to determine whether the monitored power consumption is approaching or exceeds an upper limit and to reduce the supply voltage and the frequency of the clock in response to the monitored power consumption approaching or exceeding the upper limit.

10. The apparatus of claim 6, the control logic to determine whether the monitored power consumption is approaching or exceeds a lower limit and to increase the supply voltage and the frequency of the clock in response to the monitored power consumption approaching or exceeding the lower limit.

11. The apparatus of claim 6, comprising the microprocessor.

12. The apparatus of claim 11, wherein the clock source, the power monitor, and the control logic are an integral part of the microprocessor.

13. The apparatus of claim 6, wherein the clock source comprises a phase locked loop.

14. The apparatus of claim 6, wherein the voltage source comprises a switching voltage regulator.

15. A method comprising:

applying a supply voltage and a clock to a microprocessor;

measuring a temperature of the microprocessor;

determining whether the measured temperature is within a predetermined range of values; and

varying the supply voltage and frequency of the clock in response to the determination, wherein the varying comprises reducing the supply voltage and the frequency of the clock in response to the measured temperature being above the predetermined range of values and increasing the supply voltage and the frequency of the clock in response to the measured temperature being below the predetermined range of values.

16. The method of claim 15, wherein the determining comprises determining whether the measured temperature is approaching or exceeds an upper limit;

and

wherein the varying comprises reducing the supply voltage and the frequency of the clock in response to the measured temperature approaching or exceeding the upper limit.

17. The method of claim 15, wherein the determining comprises determining whether the measured temperature is approaching or exceeds a lower limit;

and

wherein the varying comprises increasing the supply voltage and the frequency of the clock in response to the measured temperature approaching or exceeding the lower limit.

18. An apparatus comprising:

a voltage source to apply a supply voltage to a microprocessor;

a clock source to apply a clock to the microprocessor;

a temperature sensor to measure a temperature of the microprocessor; and

control logic to determine whether the measured temperature is within a predetermined range of values, to reduce the supply voltage and the frequency of the clock in response to the measured temperature being above the predetermined range of values, and to increase the supply voltage and the frequency of the clock in response to the measured temperature being below the predetermined range of values.

19. The apparatus of claim 18, the control logic to determine whether the measured temperature is approaching or exceeds an upper limit and to reduce the supply voltage and the frequency of the clock in response to the measured temperature approaching or exceeding the upper limit.

20. The apparatus of claim 18, the control logic to determine whether the measured temperature is approaching or exceeds a lower limit and to increase the supply voltage and the frequency of the clock in response to the measured temperature approaching or exceeding the lower limit.

21. The apparatus of claim 18, comprising the microprocessor.

22. The apparatus of claim 21, wherein the clock source, the temperature sensor, and the control logic are an integral part of the microprocessor.

23. The apparatus of claim 18, wherein the clock source comprises a phase locked loop.

24. The apparatus of claim 18, wherein the voltage source comprises a switching voltage regulator.

25. The apparatus of claim 18, the temperature sensor to measure, a temperature of a die for the microprocessor.

26. The apparatus of claim 18, the temperature sensor to measure a temperature of a package case for the microprocessor.