Layer insulating film for multilayer interconnection, resin used therefor and process for producing the same
First Claim
1. A process for producing a fluorine-containing polyhydroxyamide resin having the structure represented by the formula (1) which comprises reacting a dicarboxylic acid diester obtained by purifying a product obtained by the reaction of 2,2′
- -bis(trifluoromethyl)-4,4′
-biphenyldicarboxylic acid with one kind of compound selected from the group of compounds represented by the formulas (2), with 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane wherein m is an integer of 10-500,
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Abstract
The present invention provides a layer insulating film for multilayer interconnection of semiconductors which is excellent in resistance to heat, resistance to moisture absorption as well as in electric characteristic properties, and a process for producing the film. That is, a layer insulating film for multilayer interconnection of semiconductors which comprises a fluorine-containing polybenzoxazole resin having the structure represented by the formula (6) and obtained by a process which comprises subjecting to heat-dehydrating ring closure a fluorine-containing polyhydroxyamide resin obtained by reacting a dicarboxylic acid diester obtained from one kind of compound selected from the group of compounds represented by the formulas (2) and 2,2′-bis(tri-fluoromethyl)-4,4′-biphenyldicarboxylic acid, with 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane,
(in the formula (6), m is an integer of 10-500).
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Citations
11 Claims
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1. A process for producing a fluorine-containing polyhydroxyamide resin having the structure represented by the formula (1) which comprises reacting a dicarboxylic acid diester obtained by purifying a product obtained by the reaction of 2,2′
- -bis(trifluoromethyl)-4,4′
-biphenyldicarboxylic acid with one kind of compound selected from the group of compounds represented by the formulas (2), with 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropanewherein m is an integer of 10-500, - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
wherein X and Y each independently represent a structure selected from the formulas (4) wherein Z represents a structure selected from the formulas (5), provided that the hydrogen atom(s) on the benzene ring in these structures may be substituted with at least one member selected from the group consisting of methyl group, ethyl group, propyl group, isopropyl group, butyl group, isobutyl group, t-butyl group, fluorine atom and trifluoromethyl group,
- -bis(trifluoromethyl)-4,4′
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3. The process for producing a fluorine-containing polyhydroxyamide resin according to claim 1 wherein said one kind of compound selected from the group of compounds represented by the formulas (2) is 1-hydroxybenzotriazole.
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4. A fluorine-containing polyhydroxyamide resin having a repeating unit of the formula (1) which is obtained by the process according to claim 1
wherein m is an integer of 100-500. -
5. A fluorine-containing polyhydroxyamide resin obtained by the process according to claim 2.
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6. A fluorine-containing polybenzoxazole resin having the structure represented by the formula (6)
wherein m is an integer of 10-500, which is obtained by subjecting to heat-dehydrating ring closure the fluorine-containing polyhydroxyamide resin obtained by the process according to claim 1. -
7. A fluorine-containing polybenzoxazole resin which is obtained by subjecting to heat-dehydrating ring closure the fluorine-containing polyhydroxyamide resin obtained by the process according to claim 2.
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8. A fluorine-containing polybenzoxazole resin which is obtained by subjecting to heat-dehydrating ring closure the fluorine-containing polyhydroxyamide resin obtained by the process according to claim 3.
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9. A layer insulating film for multilayer interconnection of semiconductors which comprises a polybenzoxazole resin having the structure represented by the formula (6) obtained by subjecting to heat-dehydrating ring closure the fluorine-containing polyhydroxyamide resin obtained by the process according to claim 1.
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10. A layer insulating film for multilayer interconnection of semiconductors which comprises a polybenzoxazole resin obtained by subjecting to heat-dehydrating ring closure the fluorine-containing polyhydroxyamide resin obtained by the process according to claim 2.
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11. A layer insulating film for multilayer interconnection of semiconductors which comprises a polybenzoxazole resin obtained by subjecting to heat-dehydrating ring closure the fluorine-containing polyhydroxyamide resin obtained by the process according to claim 3.
Specification