Separate lateral processing of backscatter signals

• US 6,424,695 B1
• Filed: 12/16/1999
• Issued: 07/23/2002
• Est. Priority Date: 12/22/1998
• Status: Expired due to Term

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Grodzins, Lee, Adams, William
• Primary Examiner(s): Kim, Robert H.
• Assistant Examiner(s): THOMAS, COURTNEY D
• Application Number:
  US09/465,103
• Time in Patent Office: 950 Days
• Field of Search: 378/70, 378/86, 378/87
• US Class Current: 378/87
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G21K 5/04 with beam-forming means

Abstract

A system and a method for determining the depth of an object with respect to a surface behind which the object is concealed. The intensity of x-rays backscattered from the object is measured by at least two backscatter detectors disposed at different positions with respect to the scattering object. The depth of a scattering source within the volume penetrated by the x-rays is derived from the ratio of scattered x-rays measured by the detectors.

Claims

1. An inspection system for characterizing an object concealed by a concealing surface, the system comprising:

a. a source of penetrating radiation for emitting a beam, the beam having an orientation and being incident upon the concealing surface at a plane of incidence, the source having a source position;

b. a first scatter detector having a specified position with respect to the source position, a beam orientation, and a first field of view, the first field of view subtending a first solid angle, the first scatter detector generating a first signal corresponding to penetrating radiation that has been scattered by the object;

c. a second scatter detector having a second field of view, the second field of view subtending a second solid angle of larger magnitude than the first solid angle, the second scatter detector disposed at a specified position with respect to the source position exterior to the position of the first scatter detector, the second scatter detector generating a second signal corresponding to penetrating radiation that has been scattered by the object; and

d. a processor for determining an effective depth of the object with respect to the plane of incidence on the basis of at least the first and second signals.

2. An inspection system according to claim 1, wherein the object subtends a first solid angle with respect to the first scatter detector and a second solid angle with respect to the second scatter detectors such that the first solid angle differs from the second solid angle.

3. An inspection system according to claim 1, wherein the field of view of the second scatter detector is limited by at least one collimator.

4. An inspection system according to claim 1, wherein the source of penetrating radiation is an x-ray source.

5. An inspection system according to claim 1, wherein the source of penetrating radiation is a radioactive x-ray source.

6. An inspection system according to claim 1, further comprising a scanner for moving the propagation axis of the beam of penetrating radiation relative to the object.

7. A method for analyzing an object concealed by a surface, the method comprising:

a. illuminating the surface with a beam of penetrating radiation emanating from a source;

b. detecting radiation scattered by the object by a first and a second scatter detector, the second detector having a field of view subtending a larger field of view than a field of view subtended by a field of view of the first detector, such that radiation scattered by an object disposed at a greater distance from the source of penetrating radiation is preferentially detected by the second radiation detector;

c. generating a first signal corresponding to penetrating radiation scattered by the object and detected by the first scatter detector;

d. generating a second signal corresponding to penetrating radiation that has been scattered by the object and detected by the second scatter detector; and

e. determining a position of the object on the basis of at least the first and second signals.

8. A method for analyzing an object concealed within an enclosure, the method comprising:

a. illuminating the enclosure with a beam of penetrating radiation;

b. generating a first signal corresponding to penetrating radiation scattered by the object and detected by a first detector disposed at a first detector position;

c. generating a second signal corresponding to penetrating radiation scattered by the object and detected by a second detector disposed at a second detector position; and

d. determining an effective depth of the object on the basis of at least the first and second signals.

9. A device for inspecting a container with penetrating radiation, the device comprising:

a. a bed movable along a first direction;

b. a source of penetrating radiation, mounted on the bed for providing a beam;

c. a first scatter detector disposed at a first detector position for generating a first signal corresponding to penetrating radiation that has been scattered by an object;

d. a second scatter detector having a field of view, disposed at a second detector position, for generating a second signal corresponding to penetrating radiation that has been scattered by the object;

such that the beam is caused to traverse the container as the bed is moved, and the first and second signal are used to characterize a distance of the object in a depth direction transverse to the first direction.