Apparatus for improving image depth resolution in a magnetic field imaging apparatus

• US 6,429,657 B1
• Filed: 01/09/2001
• Issued: 08/06/2002
• Est. Priority Date: 01/09/2001
• Status: Expired due to Fees

• Current Assignee: GlobalFoundries, Inc.
• Original Assignee: Advanced Micro Devices, Inc.
• Inventors: Blish, Richard C. II
• Primary Examiner(s): Lefkowitz, Edward
• Assistant Examiner(s): Shrivastav, Brij B.
• Application Number:
  US09/757,116
• Time in Patent Office: 574 Days
• Field of Search: 324/318, 324/322, 324/313, 324/244, 324/529, 324/750, 324/763, 324/719, 324/158
• US Class Current: 324/322
• CPC Class Codes: G01V 3/081 the magnetic field is produced by the objects or geological structures characterised by the method of magnetic field measurement G01R33/00

Abstract

A magnetic field imaging apparatus for sensing a magnetic field generated by current flowing in the semiconductor device includes a pair of sensing devices which may be focused at a chosen depth in a semiconductor device. The sensing devices may be movable so that they may be focused at different focal points. The apparatus may also include three or more sensing devices, which can be chosen to operate in tears to define a variety of focus depths in a semiconductor device.

Claims

1. A magnetic field imaging apparatus for sensing a magnetic field generated by current flowing in a semiconductor device, the magnetic field imaging apparatus comprising a support and first and second sensing devices mounted to the support, the first and second sensing devices provided for sensing a magnetic field generated by current flowing in the semiconductor device, the support and the semiconductor device being capable of relative movement, the first and second sensing devices being focused at a chosen focal point relative to the support.

2. The apparatus of claim 1 wherein the first sensing device is movable relative to the support so that the first and second sensing devices may be focused at another focal point relative to the support.

3. The apparatus of claim 1 wherein the first and second sensing devices are movable relative to the support so that the first and second sensing devices may be focused at various focal points relative to the support.

4. The apparatus of claim 1 and further comprising a third sensing device mounted to the support, wherein a combination of the third sensing device and one of the first and second sensing devices are focused at an additional focal point relative to the support.

5. The apparatus of claim 4 were in the first, second and third sensing devices are in a generally arc-shaped configuration.

6. The apparatus of claim 1 and further comprising third and fourth sensing devices mounted to the support, the third and fourth sensing devices being focused at a different focal point relative to the support.

7. The apparatus of claim 6 were in the first, second, third and fourth sensing devices are configured generally in an arc-shaped configuration.

8. The apparatus of claim 1 wherein the sensing devices are superconducting sensing devices.