Method and apparatus for transforming a part periphery to be cut from a patterned sheet material
First Claim
Patent Images
1. A method of calculating an estimated position of a third occurrence of a pattern characteristic on a patterned sheet material having repeating occurrences of the pattern characteristic, comprising:
- (a) projecting a first reference image onto the sheet material at a first estimated position of the pattern characteristic;
(b) visually inspecting the sheet material and the projected first reference image to identify a corresponding first pattern characteristic position;
(c) identifying a difference between the first reference image on the sheet material at the first estimated position and the corresponding first pattern characteristic position;
(d) projecting a second reference image onto the sheet material, the second reference image including a second estimated position of the pattern characteristic;
(e) visually inspecting the sheet material and the projected second reference image to identify a corresponding second actual pattern characteristic position;
(f) identifying a difference between the second reference image on the sheet material at the second estimated position and the corresponding second pattern characteristic position; and
(g) calculating a position of a third occurrence of the pattern characteristic based upon a difference between the first estimated position and the first actual pattern characteristic position, and the second estimated position and the second actual pattern characteristic position.
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Abstract
A method and apparatus for cutting patterned sheet material to provide a predetermined relationship between a pattern characteristic and the part to be cut. An estimated position of a pattern characteristic is projected onto the sheet material and a distance between the estimated position and an actual position of the pattern characteristic is identified. A transforming program calculates a position for other pattern characteristic positions and cutting instructions are then created and executed.
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Citations
18 Claims
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1. A method of calculating an estimated position of a third occurrence of a pattern characteristic on a patterned sheet material having repeating occurrences of the pattern characteristic, comprising:
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(a) projecting a first reference image onto the sheet material at a first estimated position of the pattern characteristic;
(b) visually inspecting the sheet material and the projected first reference image to identify a corresponding first pattern characteristic position;
(c) identifying a difference between the first reference image on the sheet material at the first estimated position and the corresponding first pattern characteristic position;
(d) projecting a second reference image onto the sheet material, the second reference image including a second estimated position of the pattern characteristic;
(e) visually inspecting the sheet material and the projected second reference image to identify a corresponding second actual pattern characteristic position;
(f) identifying a difference between the second reference image on the sheet material at the second estimated position and the corresponding second pattern characteristic position; and
(g) calculating a position of a third occurrence of the pattern characteristic based upon a difference between the first estimated position and the first actual pattern characteristic position, and the second estimated position and the second actual pattern characteristic position. - View Dependent Claims (2, 3)
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4. A method of identifying a fabric repeat characteristic in a patterned sheet material, comprising:
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(a) projecting a first estimated pattern characteristic position onto the sheet material;
(b) identifying a first actual pattern characteristic position corresponding to the first estimated pattern characteristic position;
(c) projecting a second estimated pattern characteristic position onto the sheet material spaced apart from the first estimated pattern characteristic position;
(d) identifying a second actual pattern characteristic point corresponding to the second estimated pattern characteristic position; and
(e) calculating a pattern characteristic repeat frequency for a portion of the sheet material intermediate the first and the second actual pattern characteristic positions. - View Dependent Claims (5, 6, 7, 8, 9)
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10. A method of associating an estimated pattern characteristic position and an actual pattern characteristic position located on a sheet material having a periphery, comprising:
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(a) identifying a reference image of an estimated pattern characteristic position located outside the periphery of the sheet material;
(b) moving the reference image by one of an estimated pattern characteristic repeat and an actual pattern characteristic repeat to locate the reference image within the periphery of the sheet material; and
(c) projecting the reference image within the periphery of the sheet material.
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11. A method of transforming an estimated pattern characteristic for a sheet material in response to a patterned sheet material having a pattern characteristic, comprising:
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(a) disposing a first segment of the patterned sheet material upon a support surface;
(b) selecting a first pattern characteristic occurring in the first segment;
(c) projecting a reference image onto the first segment at an estimated position of the first pattern characteristic;
(d) visually inspecting the sheet material and the projected reference image to identify a corresponding pattern characteristic position proximal to the projected reference image;
(e) identifying a difference between the projected reference image at the estimated position and the corresponding pattern characteristic position proximal to the projected reference image; and
(f) calculating a local transformation of the estimated pattern characteristic, the local transformation corresponding to the identified difference between the projected reference image at the estimated position and the corresponding pattern characteristic position proximal to the projected reference image.
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12. A method of transforming an estimated part periphery relative to a patterned sheet material, comprising:
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(a) projecting an estimated position of a pattern characteristic and an estimated pattern distortion onto the sheet material including a pattern sheet bow and as pattern sheet skew in the estimated pattern distortion;
(b) identifying by visual operator inspection of the sheet material a first vector relating the projected estimated position of the pattern characteristic to a unique actual pattern characteristic position, and a second vector relating the estimated pattern distortion to an actual pattern distortion; and
(c) transforming the estimated part periphery in response to the identified vectors. - View Dependent Claims (13, 14, 15)
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16. A method of transforming and distorting an estimated pattern for a sheet material in response to a patterned sheet material having a repeating pattern characteristic, comprising:
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(a) disposing a first segment of the patterned sheet material upon a support surface;
(b) projecting a reference image onto the first segment at an estimated position of a first pattern characteristic, the reference image including an estimated fabric distortion including one of a bow and a skew;
(c) visually inspecting the first segment of the patterned sheet material to identify an actual fabric distortion;
(e) transforming the estimated pattern for the sheet material in response to the identified difference. - View Dependent Claims (17)
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18. An apparatus for transforming an estimated pattern for a sheet material in response to a patterned sheet material, comprising:
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(a) a database containing coordinate information of a part periphery and a reference point corresponding to the patterned sheet material;
(b) a projector for projecting the part periphery and the reference point onto the sheet material;
(c) an input device for entering offset data representing a difference between the projected reference point and a corresponding point on the sheet material; and
(d) a controller operably connected to the database and the projector for determining a pattern characteristic position in response to the offset data, the controller selected to at least locally distort the estimated pattern for the sheet material in response to the difference between the projected reference point and a corresponding point on the sheet material.
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Specification