Automated creation of specific test programs from complex test programs
First Claim
1. A method for providing specific test programs from a production test program for testing semiconductor devices comprising the steps of:
- providing a semiconductor device to be tested by a tester;
initiating a production test program, the production test program including a plurality of program files and test code sequences;
holding the production test program at a test which is to be extracted;
extracting register information and settings from the tester for the test to be extracted;
storing the register information and settings in a storage file; and
assembling and translating the storage file to provide an executable test program for an extracted test for testing the semiconductor device or other semiconductor devices.
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Accused Products
Abstract
A method for providing specific test programs from a production test program for testing semiconductor devices, in accordance with the present invention, includes providing a semiconductor device to be tested by a tester and initiating a production test program. The production test program includes a plurality of program files and test code sequences. The production test program is held at a test which is to be extracted, and register information and settings are extracted from the tester for the test to be extracted. The register information and settings are stored in a storage file, and the storage file is assembled and translated to provide an executable test program for an extracted test for testing the semiconductor device or other semiconductor devices.
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Citations
23 Claims
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1. A method for providing specific test programs from a production test program for testing semiconductor devices comprising the steps of:
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providing a semiconductor device to be tested by a tester;
initiating a production test program, the production test program including a plurality of program files and test code sequences;
holding the production test program at a test which is to be extracted;
extracting register information and settings from the tester for the test to be extracted;
storing the register information and settings in a storage file; and
assembling and translating the storage file to provide an executable test program for an extracted test for testing the semiconductor device or other semiconductor devices. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A program storage device readable by machine, tangibly embodying a program of instructions executable by the machine to perform method steps for providing specific test programs from a production test program for testing semiconductor devices, the method steps comprising:
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initiating a production test program on a device under test, the production test program including a plurality of program files and test code sequences;
holding the production test program at a test which is to be extracted;
extracting register information and settings from the tester for the test to be extracted;
storing the register information and settings in a storage file; and
assembling and translating the storage file to provide an executable test program for an extracted test for testing a semiconductor device or other semiconductor devices. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A method for providing specific test programs from a production test program for testing semiconductor devices comprising the steps of:
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providing a semiconductor device to be tested by a tester;
initiating a production test program, the production test program including a plurality of program files and test code sequences;
holding the production test program at a test which is to be extracted;
extracting register information and settings from the tester for the test to be extracted;
storing the register information and settings in a storage file;
assembling and translating the storage file to provide an executable test program for an extracted test for testing the semiconductor device or other devices by identifying commands in the storage file and translating the commands to programming code; and
executing the executable program file to run the extracted test on the semiconductor device or other semiconductor devices. - View Dependent Claims (20, 21, 22, 23)
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Specification